| Project/Area Number |
20700052
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Computer system/Network
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| Research Institution | Meijo University |
|---|
Principal Investigator |
YOSHIKAWA Masaya Meijo University, 理工学部, 准教授 (50373098)
|
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| Project Period (FY) |
2008 – 2009
|
| Project Status |
Completed (Fiscal Year 2009)
|
| Budget Amount *help |
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2009: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2008: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
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| Keywords | 高信頼LSI / 耐故障化技術 / 自律回復 / 自己診断 / 無故障LSI |
|---|
| Research Abstract |
In this study, we developed the dependable LSI system which consists of Analysis, Detection, Treatment and Recovery functions. Regarding the analysis function, we studied the reliability of LSI as an elemental technology for fault diagnostics. Regarding the detection system, we examined the fault modeling considering thermal effects. Regarding the treatment function, we investigated the optimization algorithm as an elemental technology for the self-recovery. In addition, we developed the dedicated CAD system for the self recovery device.
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