Direct observation of clustered DNA damage using time-of-flight ion mass spectrometer
| Project/Area Number |
20710048
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Risk sciences of radiation/Chemicals
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| Research Institution | Japan Atomic Energy Agency |
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Principal Investigator |
FUJII Kentaro Japan Atomic Energy Agency, 先端基礎研究センター, 副主任研究員 (00360404)
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| Project Period (FY) |
2008 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2010: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2009: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2008: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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| Keywords | クラスターDNA損傷 / 軟X線 / イオン / 質量分析 / 電離放射線 / DNA / クラスター損傷 / 放射光 |
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| Research Abstract |
To investigate the production mechanism of clustered DNA damage, I developed the time-of-flight ion mass spectrometer. If the two ions were produced by a single photon, the coincidence signal can be detected on the ion mass spectrum. Moreover, I measured the clustered DNA lesions induced by monochromatic soft X-rays by an enzymatic method.
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Report
(4 results)
Research Products
(65 results)
