| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2009: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2008: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
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| Research Abstract |
It has been known that atomic force microscopy (AFM), in addition to providing topographic information, can be used to discriminate surface functional groups. Last year, we performed force curve measurements between electroactive ferrocene (Fc)-terminated self-assembled monolayers under independent control of the tip and sample potentials. These results have demonstrated that this AFM-based technique will be a powerful tool for investigating the structure of the ion pair between Fc^+ and counter anions. In this year, we performed force curve measurements under various electrolyte solutions, and succeeded in revealing the ion-pair structure in molecular scale.
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