| Project/Area Number |
20760024
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Osaka University |
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Principal Investigator |
SUGIMOTO Yoshiaki Osaka University, 工学研究科, 特任講師 (00432518)
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| Project Period (FY) |
2008 – 2009
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| Project Status |
Completed (Fiscal Year 2009)
|
| Budget Amount *help |
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2009: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2008: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
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| Keywords | 走査型プローブ顕微鏡 / 二酸化チタン / 原子間力顕微鏡 / 原子操作 |
|---|
| Research Abstract |
We have developed the new measurement technique, such as force/current simultaneous measurements, local surface potential measurements, force mapping and chemical identification technique. In addition, we measured the stochastic behavior of atom hopping in lateral atom manipulation at room temperature and found the novel phenomenon of the atom-interchange vertical manipulation. We have proposed new imaging mechanism on TiO2 surface by AFM imaging and force spectroscopy.
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