Experimental waveform study of SET pulses leading to soft errors in logic LSI

• Project/Area Number: 20760228
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Single-year Grants
• Research Field: Electron device/Electronic equipment
• Research Institution: Japan Aerospace Exploration Agency
• Principal Investigator: KOBAYASHI Daisuke Japan Aerospace Exploration Agency, 宇宙科学研究本部, 助教 (90415894)
• Project Period (FY): 2008 – 2009
• Project Status: Completed (Fiscal Year 2009)
• Budget Amount: ¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000); Fiscal Year 2009: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000); Fiscal Year 2008: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
• Keywords: ソフトエラー / 電子デバイス・機器 / 半導体物性 / 放射線・X線・粒子線 / 宇宙線 / モデリング / 放射線,X線,粒子線 / 解析式 / ディペンダブルコンピューティング / シングルイベント効果 / シングルイベントトランジェント / SET / 放射線 / 信頼性

Research Abstract

放射線が論理回路に当たるとパルス状のノイズが発生し回路が誤動作してしまう.このノイズパルスをSETパルスと呼び,対策のためにその波形を明らかにする必要がある.そのための手法を提案し,半導体製造技術の一つである完全空乏型SOI技術で作成した論理回路に適用して,そこで発生するSETパルスの波形を観測することに成功した.更に,その波形を物理的に説明する解析式を導出した.

Research Products

• [Journal Article] Device-physics-based analytical model for single event transients in SOI CMOS logics (2009)
  • Author(s): D. Kobayashi, K. Hirose, V. Ferlet-Cavrois, D. McMorrow, T. Makino, H. Ikeda, Y. Arai, M. Ohno
  • Journal Title: IEEE Transactions on Nuclear Science vol.56,no.6 Pages: 3043-3049
  • Peer Reviewed
• [Journal Article] Device-physics-based analytical model for single event transients in SOI CMOS logics (2009)
  • Author(s): D.Kobayashi, et al.
  • Journal Title: IEEE Transactions on Nuclear Science 56 Pages: 3043-3049
  • Peer Reviewed
• [Journal Article] Waveform observation of digital single-event transients employing monitoring transistor technique (2008)
  • Author(s): D. Kobayashi, K. Hirose, Y. Yanagawa, H. Ikeda, H. Saito, V. Ferlet-Cavrois, D. McMorrow, M. Gaillardin, P. Paillet, Y. Arai, M. Ohno
  • Journal Title: IEEE Transactions on Nuclear Science vol.55,no.6 Pages: 2872-2879
  • Peer Reviewed
• [Journal Article] Waveform observation of digital single-event transients employing monitoring transistor technique (2008)
  • Author(s): D.Kobayashi et al.
  • Journal Title: IEEE Transactions on Nuclear Science 55 Pages: 2872-2879
  • Peer Reviewed
• [Presentation] SOI CMOSテバイスで発生する放射線誘起パルスノイズSETの解析モデル (2009)
  • Author(s): 小林大輔, 廣瀬和之
  • Organizer: 2009年秋季応用物理学会学術講演会
  • Place of Presentation: 富山大学(富山県富山市)
• [Presentation] Device-physics-based analytical model for single event transients in SOI CMOS logics (2009)
  • Author(s): D. Kobayashi, K. Hirose, V. Ferlet-Cavrois, D. McMorrow, M. Gaillardin, T. Makino, H. Ikeda, Y. Arai, M. Ohno
  • Organizer: presented in 2009 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
  • Place of Presentation: Quebec City, Quebec, Canada
• [Presentation] Analytical expression for temporal width characterization of radiation-induced pulse noises in SOI CMOS logic gates (2009)
  • Author(s): D. Kobayashi, T. Makino, K. Hirose
  • Organizer: in Proc. 2009 IEEE International Reliability Physics Symposium (IRPS)
  • Place of Presentation: Montreal, Canada
• [Presentation] Device-physics-based analytical model for single event transients in SOI CMOS logics (2009)
  • Author(s): D.Kobayashi, et al.
  • Organizer: 2000 IEEE Nuclear and Space Radiation Effeccts Conference (NSREC)
  • Place of Presentation: Quebec City, Quebec, Canada
• [Presentation] Analytical expression for temporal width characterization of radiation-induced pulse noises in SOI CMOS logic gates (2009)
  • Author(s): D.Kobayashi, et al.
  • Organizer: 2009 IEEE International Reliability Physics Symposium (IRPS)
  • Place of Presentation: Montreal, Canada
• [Presentation] SOI CMOSデバイスで発生する放射線誘起パルスノイズSETの解析モデル (2009)
  • Author(s): 小林大輔, 他
  • Organizer: 2009年秋季応用物理学会学術講演会
  • Place of Presentation: 富山県富山市
• [Presentation] Device-physics-based analytical model for single event transients in SOI CMOS logics (審査済・発表決定) (2009)
  • Author(s): D.Kobayashi et al.
  • Organizer: 2009 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
  • Place of Presentation: Quebec, Canada
• [Presentation] Analytical expression for temporal width characterization of radiation-induced pulse noises in SOI CMOS logic gates (審査済・発表決定) (2009)
  • Author(s): D.Kobayashi et al.
  • Organizer: 2009 IEEE International Reliability Physics Symposium (IRPS)
  • Place of Presentation: Montreal, Canada
• [Presentation] Waveform observation of digital single-event transients employing monitoring transistor technique (2008)
  • Author(s): D. Kobayashi, K. Hirose, Y. Yanagawa, H. Ikeda, H. Saito, V. Ferlet-Cavrois, P. Paillet, D. McMorrow, Y. Arai, M. Ohno
  • Organizer: presented in 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
  • Place of Presentation: Tucson, AZ
• [Presentation] Waveform observation of digital single-event transients employing monitoring transistor technique (2008)
  • Author(s): D.Kobayashi et al.
  • Organizer: 2008 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
  • Place of Presentation: Tucson, AZ, USA
• [Remarks] 第27回(2009年秋季)応用物理学会講演奨励賞受賞