Control of nonlinear cantilever oscillation in dynamic-mode atomic force microscopy
| Project/Area Number |
20760238
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Communication/Network engineering
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| Research Institution | Tohoku University (2010)
Kyoto University (2008-2009) |
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Principal Investigator |
YAMASUE Kohei 東北大学, 電気通信研究所, 助教 (70467455)
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| Project Period (FY) |
2008 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
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| Budget Amount *help |
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2010: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2009: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2008: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
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| Keywords | カオス制御 / マイクロ・ナノデバイス / 制御工学 / 振動制御 / 時間遅れフィードバック制御 / 表面・界面物性 / 走査プローブ顕微鏡・非線形動力学 / 非線形動力学 / 査定型プローブ顕微鏡 / 走査型プローブ顕微鏡 / 走査プローブ顕微鏡 |
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| Research Abstract |
Dynamic-mode atomic force microscopy has been a fundamental tool for research and development in the fields of nanoscience and nanotechnology. This microscopy enables us to observe topography and physical properties of sample surfaces by utilizing cantilever sensors that are extremely sensitive for tiny force at the atomic and molecular level. On the other hand, it has been recently reported that significant performance degradation can occur during measurement due to the irregular oscillation of cantilever sensors. In this research project, we proposed a novel control method for overcoming the performance degradation and newly developed a prototype controller for cantilever oscillation. The control performance was successfully demonstrated in an actual dynamic-mode atomic force microscope.
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Report
(4 results)
Research Products
(20 results)
