| Project/Area Number |
20760500
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Material processing/treatments
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| Research Institution | National Institute for Materials Science |
|---|
Principal Investigator |
SHINODA Kentaro National Institute for Materials Science, ハイブリッド材料センター, NIMSポスドク研究員 (10442732)
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|---|
| Project Period (FY) |
2008 – 2009
|
| Project Status |
Completed (Fiscal Year 2009)
|
| Budget Amount *help |
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2009: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2008: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
|
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| Keywords | 溶射 / コーティング / 粒子積層プロセス / プロセス計測 / 材料加工・処理 |
|---|
| Research Abstract |
This study has focused on the development of low temperature particle measurement under solid particle impact process, which is necessary to deposit metal coatings without oxidation and nano-structured cermet coatings. Utilization of near-infrared detectors enabled the detection of low-temperature particles whose in-flight temperatures were considered to be less than 1000 K under a warm spray process. This result can be applied not only to the warm spray process but also to cold spray processes, which have been well studied recently.
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