Detecting evanescent THz waves with an AFM probe tip
| Project/Area Number |
20860024
|
|---|
| Research Category |
Grant-in-Aid for Young Scientists (Start-up)
|
| Allocation Type | Single-year Grants |
|---|
| Research Field |
Measurement engineering
|
|---|
| Research Institution | The University of Tokyo |
|---|
Principal Investigator |
KAJIHARA Yusuke The University of Tokyo, 大学院・総合文化研究科, 研究員 (60512332)
|
|---|
| Project Period (FY) |
2008 – 2009
|
| Project Status |
Completed (Fiscal Year 2009)
|
| Budget Amount *help |
¥3,289,000 (Direct Cost: ¥2,530,000、Indirect Cost: ¥759,000)
Fiscal Year 2009: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2008: ¥1,729,000 (Direct Cost: ¥1,330,000、Indirect Cost: ¥399,000)
|
|---|
| Keywords | パッシブイメージング / 原子間力顕微鏡 / 近接場顕微鏡 / エバネッセント波 / テラヘルツ波 / 中赤外光 / 表面プラズモン / 赤外光 / パッシブ計測 / エバネッセント光 / 近接場光 / 散乱型近接場顕微鏡 / 自然放出光 / テラヘルツ顕微鏡 |
|---|
| Research Abstract |
We developed a scattering-type scanning near-field optical microscope, which does not use any external light source. With the developed microscope, we performed passive near-field microscopy of spontaneous thermal emission. By scanning a near-field probe on a GaAs/Au sample at room temperature without an external light, we obtained near-field components derived from thermally activated surface plasmon on Au. The spatial resolution of 150nm (1/100 of wavelength) was successfully achieved.
|
Report
(3 results)
Research Products
(23 results)
