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Development of fluoride based high-k dielectric thin film materials for MIS structure

Research Project

Project/Area Number 20H02188
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Review Section Basic Section 21050:Electric and electronic materials-related
Research InstitutionNational Institute for Materials Science

Principal Investigator

Nagata Takahiro  国立研究開発法人物質・材料研究機構, 機能性材料研究拠点, グループリーダー (10421439)

Project Period (FY) 2020-04-01 – 2023-03-31
Project Status Completed (Fiscal Year 2022)
Budget Amount *help
¥16,250,000 (Direct Cost: ¥12,500,000、Indirect Cost: ¥3,750,000)
Fiscal Year 2022: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
Fiscal Year 2021: ¥6,110,000 (Direct Cost: ¥4,700,000、Indirect Cost: ¥1,410,000)
Fiscal Year 2020: ¥6,630,000 (Direct Cost: ¥5,100,000、Indirect Cost: ¥1,530,000)
Keywords高誘電体 / 半導体 / ゲート絶縁膜 / ヘテロ界面 / 結晶成長 / フッ化物 / 高誘電体材料 / キャパシタ構造 / 光電子分光 / 界面 / 絶縁膜 / ワイドギャップ
Outline of Research at the Start

本研究では、トランジスタの高機能化に資する高誘電体材料開発を実施する。実施者らが提案しているワイドギャップ高誘電率材料であるフッ化物薄膜で課題となっている界面欠陥制御とヘテロ界面でのフッ素の果たす役割を明らかにし、その欠陥を制御することでフッ化物が持つ、高誘電性、高絶縁性を活用した高誘電体ゲート薄膜材料の高機能化を実現する。

Outline of Final Research Achievements

The object of our research is to dramatically reduce the power consumption of IT devices from the material level by improving the functionality of the semiconductor interface and reducing leakage current. For this object, we developed a high-k dielectric material for use in semiconductor devices. The target material is a fluoride gate dielectric material, and it was shown that this material can achieve both a band gap and a high dielectric constant with respect to semiconductors, and direct junction formation with semiconductors was realized. This material can achieve high insulation properties and is expected to be applied to semiconductor devices with low power consumption and high functionality.

Academic Significance and Societal Importance of the Research Achievements

従来材料とは異なる酸素を含まないフッ化物高誘電体材料を実用化が期待されている次世代半導体材料上に形成し、高誘電体材料の機能検証とその改善のための接合界面の改善を実施した。これにより、フッ化物が高誘電体として機能することを明らかにし、原子層の界面改善層を導入することで機能改善の可能性を見出した。まだ、期待された高誘電率の達成には至っていないが、将来のIT機器の消費電力の劇的な低減が期待できる材料である。

Report

(4 results)
  • 2022 Annual Research Report   Final Research Report ( PDF )
  • 2021 Annual Research Report
  • 2020 Annual Research Report
  • Research Products

    (10 results)

All 2022 2021 2020

All Journal Article (5 results) (of which Peer Reviewed: 5 results,  Open Access: 2 results) Presentation (5 results) (of which Int'l Joint Research: 3 results,  Invited: 3 results)

  • [Journal Article] Direct feature extraction from two-dimensional X-ray diffraction images of semiconductor thin films for fabrication analysis2022

    • Author(s)
      Yamashita Akihiro、Nagata Takahiro、Yagyu Shinjiro、Asahi Toru、Chikyow Toyohiro
    • Journal Title

      Science and Technology of Advanced Materials: Methods

      Volume: 2 Issue: 1 Pages: 23-37

    • DOI

      10.1080/27660400.2022.2029222

    • Related Report
      2022 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Polarity Control of an All-Sputtered Epitaxial GaN/AlN/Al Film on a Si(111) Substrate by Intermediate Oxidization2022

    • Author(s)
      Nagata Takahiro、Suemoto Yuya、Ueoka Yoshihiro、Mesuda Masami、Sang Liwen、Chikyow Toyohiro
    • Journal Title

      ACS Omega

      Volume: 7 Issue: 23 Pages: 19380-19387

    • DOI

      10.1021/acsomega.2c00957

    • Related Report
      2022 Annual Research Report
    • Peer Reviewed
  • [Journal Article] (Invited) Combinatorial Synthesis and Interface Analysis for Development of High Dielectric Constant Thin Films2022

    • Author(s)
      Nagata Takahiro、Kumaragurubaran Somu、Takahashi Kenichiro、Ri Sung-Gi、Chikyow Toyohiro
    • Journal Title

      ECS Transactions

      Volume: 108 Issue: 2 Pages: 61-68

    • DOI

      10.1149/10802.0061ecst

    • Related Report
      2022 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Effects of low temperature buffer layer on all-sputtered epitaxial GaN/AlN film on Si (111) substrate2021

    • Author(s)
      Nagata Takahiro、Suemoto Yuya、Ueoka Yoshihiro、Mesuda Masami、Sang Liwen、Chikyow Toyohiro
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 60 Issue: SC Pages: SCCG03-SCCG03

    • DOI

      10.35848/1347-4065/abf07f

    • Related Report
      2021 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Development of New High-Dielectric Constant Thin Films By Combinatorial Synthesis2020

    • Author(s)
      Nagata Takahiro
    • Journal Title

      ECS Transactions

      Volume: 97 Issue: 1 Pages: 61-66

    • DOI

      10.1149/09701.0061ecst

    • Related Report
      2020 Annual Research Report
    • Peer Reviewed / Open Access
  • [Presentation] 自律型ハイスループット合成・評価を通じた電子材料の開発とデータ共有の試み2022

    • Author(s)
      長田 貴弘
    • Organizer
      MNC 2022 技術セミナー
    • Related Report
      2022 Annual Research Report
    • Invited
  • [Presentation] Combinatorial Synthesis and Interface Analysis for Development of High Dielectric Constant Thin Films2022

    • Author(s)
      Nagata Takahiro、Kumaragurubaran Somu、Takahashi Kenichiro、Ri Sung-Gi、Chikyow Toyohiro
    • Organizer
      241st ECS Meeting
    • Related Report
      2022 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Quasi-Continuous Representation of Crystal Structure of Thin Films with Two-Dimensional X-Ray Diffraction and Non-Negative Matrix Factorization2021

    • Author(s)
      山下 晶洸, 長田 貴弘, 柳生 進二郎, 朝日 透, 知京 豊裕
    • Organizer
      2021 MRS FALL MEETING & EXHIBIT
    • Related Report
      2021 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 硬X線光電子分光法による薄膜電子材料の表面・界面評価と機能制御2021

    • Author(s)
      長田 貴弘
    • Organizer
      2021実用表面分析講演会
    • Related Report
      2021 Annual Research Report
    • Invited
  • [Presentation] Accelerating 2-dimensinal X-ray diffraction measurement and analysis with density-based clustering for thin film2020

    • Author(s)
      Akihiro Yamashita, Takahiro Nagata, Shinjiro Yagyu, Toru Asahi, Toyohiro Chikyow
    • Organizer
      33rd International Microprocesses and Nanotechnology Conference
    • Related Report
      2020 Annual Research Report
    • Int'l Joint Research

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Published: 2020-04-28   Modified: 2024-01-30  

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