Function Control of Multi-atom Nanostructure with atom manipulation

• Project/Area Number: 21246010
• Research Category: Grant-in-Aid for Scientific Research (A)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Osaka University
• Principal Investigator: ABE Masayuki 大阪大学, 大学院・工学研究科, 准教授 (00362666)
• Project Period (FY): 2009 – 2011
• Project Status: Completed (Fiscal Year 2011)
• Budget Amount: ¥16,380,000 (Direct Cost: ¥12,600,000、Indirect Cost: ¥3,780,000); Fiscal Year 2011: ¥5,980,000 (Direct Cost: ¥4,600,000、Indirect Cost: ¥1,380,000); Fiscal Year 2010: ¥10,400,000 (Direct Cost: ¥8,000,000、Indirect Cost: ¥2,400,000)
• Keywords: 走査プローブ顕微鏡 / 非接触原子間力顕微鏡 / 原子操作 / ナノ構造 / 多元素ナノ構造 / 原子間力顕微鏡 / AFM / STM / AFM/STM同時測定 / フォーススペクトロスコピー / STM同時測定

Research Abstract

We have established a method for controlling atom function by creating and performing measurements of the local state of multi-element nano-structure. More specifically, using a non-contact atomic force microscopy, we have succeeded in quantitative measurement of interaction forces that can be used to identify surface single atoms(force spectroscopy and force mapping). Results showed that we can expect to see the relation between the structure and the electronic local state in atomic level.

Research Products

• [Journal Article] Understanding image contrast formation in TiO_2 with force spectroscopy (2012)
  • Author(s): Ayhan Yurtsever, Delia Fernandez-Torre, Cesar Gonzalez, Pavel Jelinek, Pablo Pou, Yoshiaki Sugimoto, Masayuki Abe, Ruben Perez and Seizo Morita
  • Journal Title: Physical Review B Volume: Vol.85(Issue 12) Issue: 12
  • DOI: 10.1103/physrevb.85.125416
  • Peer Reviewed
• [Journal Article] Three-dimensional scanning force / tunneling spectroscopy at room temperature (2012)
  • Author(s): Yoshiaki Sugimoto, Keiichi Ueda, Masayuki Abe and Seizo Morita
  • Journal Title: J. Phys.: Condens. Matter Volume: Vol.24, No.8 Issue: 8 Pages: 084008-084008
  • DOI: 10.1088/0953-8984/24/8/084008
  • Peer Reviewed
• [Journal Article] Kelvin probe force microscopy Characterization of TiO_2(110)-supported Au clusters (2011)
  • Author(s): Hong Jing Chung
  • Journal Title: APPLIED PHYSICS LETTERS Volume: Vol.99 Issue: 12
  • DOI: 10.1063/1.3641418
  • Peer Reviewed
• [Journal Article] Alkali-metal adsorption and manipulation on hydroxylated TiO_2(110) surface using atomic force microscopy (2011)
  • Author(s): A.Yurtsever, Y.Sugimoto, M.Abe, K.Matsunaga, I.Tanaka, S.Morita
  • Journal Title: PHYS.REV.B Volume: 84 Issue: 8
  • DOI: 10.1103/physrevb.84.085413
  • Peer Reviewed
• [Journal Article] Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K.Morita
  • Journal Title: Appl.Phys.Exp. Volume: Vol.4 Issue: 11 Pages: 115201-115201
  • DOI: 10.1143/apex.4.115201
  • NAID: 10030153803
  • Peer Reviewed
• [Journal Article] Fabrication of Quartz Cantilevers for Small-Amplitude Dynamic Force Microscopy Using an Optical Deflection Sensor (2011)
  • Author(s): Ken-ichi Morita
  • Journal Title: Japanese Journal of Applied Physics Volume: Vol.50 Issue: 8S3 Pages: 08LB12-08LB12
  • DOI: 10.1143/jjap.50.08lb12
  • NAID: 210000071141
  • Peer Reviewed
• [Journal Article] ナノスケール計測におけるロバストネス-走査型プローブ顕微鏡の新技術 (2011)
  • Author(s): 阿部真之
  • Journal Title: システム/制御/情報(システム制御情報学会誌) Volume: Vol.55 Pages: 141-146
  • Peer Reviewed
• [Journal Article] Lateral Manipulation of Single Defect on Insulating Surface Using Noncontact Atomic Force Microscope (2011)
  • Author(s): Insook Yi
  • Journal Title: Japanese Journal of Applied Physics Volume: Vol.50
  • Peer Reviewed
• [Journal Article] Small-amplitude dynamic force microscopy using a quartz cantilever with an optical interferometer (2010)
  • Author(s): K. Morita, Y. Sugimoto, M. Abe, and S. Morita
  • Journal Title: Nanotechnology Volume: Vol.21 Issue: 30 Pages: 305704-305704
  • DOI: 10.1088/0957-4484/21/30/305704
  • NAID: 130005038268
  • Peer Reviewed
• [Journal Article] Simultaneous AFM and STM measurements on the Si(111)-(7×7) surface (2010)
  • Author(s): Y. Sugimoto, Y. Nakajima, D. Sawada, K. Morita, M. Abe and S. Morita
  • Journal Title: Physical Review B Volume: Vol.81(Issue 24) Issue: 24
  • DOI: 10.1103/physrevb.81.245322
  • Peer Reviewed
• [Journal Article] Simultaneous force and current mapping of the Si(111)-(7x7) surface by dynamic force microscopy (2010)
  • Author(s): Y. Sugimoto, I. Yi, M. Abe, and S. Morita
  • Journal Title: Applied Physics Letters Volume: Vol.96 Issue: 26
  • DOI: 10.1063/1.3457997
  • Peer Reviewed
• [Journal Article] NC-AFM imaging of the TiO2(110)-(1x1) surface at low temperature (2010)
  • Author(s): A. Yurtsever, Y. Sugimoto, M. Abe, and S. Morita
  • Journal Title: Nanotechnology Volume: Vol.21
  • Peer Reviewed
• [Journal Article] Observation of Subsurface Atoms of the Si(111)-(7×7) Surface by Atomic Force Microscopy (2010)
  • Author(s): Daisuke Sawada
  • Journal Title: Appl.Phys.Express Volume: Vol.3
  • Peer Reviewed
• [Journal Article] Small-amplitude dynamic force microscopy using a quartz cantilever with an optical interferometer (2010)
  • Author(s): Kenichi Morita
  • Journal Title: Nanotechnology Volume: Vol.21
  • Peer Reviewed
• [Journal Article] Simultaneous force and current mapping of the Si(111)-(7x7) surface by dynamic force microscopy (2010)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Applied Physics Letters Volume: Vol.96
  • Peer Reviewed
• [Journal Article] Simultaneous AFM and STM measurements on the Si(111)-(7x7)surface (2010)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Physical Review B Volume: Vol.81
  • Peer Reviewed
• [Journal Article] Molecular resolution investigation of tetragonal lysozyme(110) face in liquid by FM-AFM (2010)
  • Author(s): Ken Nagashima
  • Journal Title: Journal of Vacuum Science & Technology B Volume: Vol.28
  • Peer Reviewed
• [Journal Article] Simultaneous atomic force and scanning tunneling microscopy study of the Ge(111)-c(2×8) surface (2010)
  • Author(s): Daisuke Sawada
  • Journal Title: Journal of Vacuum Science & Technology B. Volume: Vol.28
  • Peer Reviewed
• [Journal Article] NC-AFM imaging of the TiO_2(110)-(1×1) surface at low temperature (2010)
  • Author(s): Ayhan Yurtsever
  • Journal Title: Nanotechnology Volume: Vol.21
  • Peer Reviewed
• [Journal Article] 単原子ペンによるナノパターンニング (2010)
  • Author(s): 森田清三
  • Journal Title: 顕微鏡 Volume: Vol.45 Pages: 51-54
  • Peer Reviewed
• [Journal Article] 原子分解能を持つ非接触原子間力顕微鏡の開発研究 (2010)
  • Author(s): 森田清三
  • Journal Title: 表面科学 Vol.31 Pages: 19-24
  • Peer Reviewed
• [Journal Article] New insights on atomic-resolution Frequency-Modulation Kelvin Probe Force Microscopy imaging on semiconductors (2009)
  • Author(s): S. Sadewasser, P. Jelinek, C.-K. Fang, O. Custance, Y. Yamada, Y. Sugimoto, M. Abe, and S. Morita
  • Journal Title: Physical Review Letters Volume: Vol.103 Issue: 26
  • DOI: 10.1103/physrevlett.103.266103
  • Peer Reviewed
• [Journal Article] Simultaneous measurement of force and tunneling current at room temperature (2009)
  • Author(s): D. Sawada, Y. Sugimoto, K. Morita, M. Abe and S. Morita
  • Journal Title: Applied Physics Letters Volume: Vol.94
  • URL: http://dx.doi.org/10.1063/1.3127503
  • Peer Reviewed
• [Journal Article] Mapping and imaging for rapid atom discrimination : A study of frequency modulation atomic force microscopy (2009)
  • Author(s): Y. Sugimoto, T. Namikawa, M. Abe, and S. Morita
  • Journal Title: Applied Physics Letters Volume: vol.94
  • URL: http://dx.doi.org/10.1063/1.3046736
  • Peer Reviewed
• [Journal Article] New insights on aomic-resolution Frequency-Modulation Kelvin Probe Force Microscopy imaging on semiconductors (2009)
  • Author(s): S.Sadewasser
  • Journal Title: Physical Review Letters 103
  • Peer Reviewed
• [Journal Article] Mapping and imaging for rapid atom discrimination : A study of frequency modulation atomic force microscopy (2009)
  • Author(s): Y.Sugimoto
  • Journal Title: Applied Physice Letters 94
  • Peer Reviewed
• [Journal Article] Simultaneous measurement of force and tunneling current at room temperature (2009)
  • Author(s): Daisuke Sawada
  • Journal Title: Applied Physice Letters Vol.94
  • Peer Reviewed
• [Journal Article] Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers (2009)
  • Author(s): Daisuke Sawada
  • Journal Title: Materials Transactions Vol.50 Pages: 940-942
  • Peer Reviewed
• [Journal Article] 交換型垂直原子操作を用いたアトムペン方式の原子埋め込み文字の研究 (2009)
  • Author(s): 森田清三
  • Journal Title: 表面科学 Vol.30 Pages: 454-459
  • Peer Reviewed
• [Journal Article] 表面機能元素の直接観察 (2009)
  • Author(s): 阿部真之
  • Journal Title: まてりあ 第48巻 Pages: 294-298
  • NAID: 10024817438
  • Peer Reviewed
• [Journal Article] 力学的原子操作による原子埋め込み文字の室温組立 (2009)
  • Author(s): 森田清三
  • Journal Title: 機能材料 Vol.29 Pages: 28-33
  • Peer Reviewed
• [Journal Article] (2009)
  • Author(s): M.Abe
  • Journal Title: Noncontact Atomic Force Microscopy(担当は第2章)(Springer) Pages: 15-30
• [Presentation] Simultaneous scanning force/ tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K. Morita and M. Abe et al.
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-20
• [Presentation] Measurement of atom hopping probability and interaction force for atom manipulation on the Si(111)-(7x7) surface (2011)
  • Author(s): Y. Sugimoto and M. Abe et al.
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-20
• [Presentation] Alkali-metal adsorption and manipulation on a hydroxylated TiO2(110) surface using atomic force microscopy (2011)
  • Author(s): A. Yurtsever and M. Abe et al.
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-20
• [Presentation] Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K.Morita
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-20
• [Presentation] Measurement of atom hopping probability and interaction force for atom manipulation on the Si(111)-(7x7) surface (2011)
  • Author(s): Y.Sugimoto
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-20
• [Presentation] Three dimensional force mapping and KPFM measurements on the CaF_2/Si(111) surface (2011)
  • Author(s): M.Fukumoto
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-19
• [Presentation] Alkali-metal adsorption and manipulation on a hydroxylated TiO2 (110) surface using atomic force microscopy (2011)
  • Author(s): A.Yurtsever
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-19
• [Presentation] Simultaneous scanning force/ tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K. Morita and M. Abe et al.
  • Organizer: 3rd Global COE International Symposium Electronic Devices Innovation(EDIS2011)
  • Place of Presentation: Osaka, Japan
  • Year and Date: 2011-12-16
• [Presentation] Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K.Morita
  • Organizer: 3rd Global COE International Symposium Electronic Devices Innovation (EDIS2011)
  • Place of Presentation: Osaka, Japan
  • Year and Date: 2011-12-16
• [Presentation] Simultaneous scanning force/ tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K. Morita and M. Abe et al.
  • Organizer: International Symposium on Surface Science(ISSS-6)
  • Place of Presentation: Tokyo, Japan
  • Year and Date: 2011-12-14
• [Presentation] Fabrication of Quartz Cantilevers for Small-Amplitude Dynamic Force Microscopy Using an Optical Deflection Sensor (2011)
  • Author(s): Y. Miyata and M. Abe et al.
  • Organizer: International Symposium on Surface Science(ISSS-6)
  • Place of Presentation: Tokyo, Japan
  • Year and Date: 2011-12-14
• [Presentation] Role of the tip reactivity for atom manipulation by atomic force microscopy (2011)
  • Author(s): Y.Sugimoto
  • Organizer: International Symposium on Surface Science (ISSS-6)
  • Place of Presentation: Tokyo, Japan(招待講演)
  • Year and Date: 2011-12-14
• [Presentation] Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K.Morita
  • Organizer: International Symposium on Surface Science (ISSS-6)
  • Place of Presentation: Tokyo, Japan
  • Year and Date: 2011-12-14
• [Presentation] Fabrication of Quartz Cantilevers for Small-Amplitude Dynamic Force Microscopy Using an Optical Deflection Sensor (2011)
  • Author(s): Y.Miyata
  • Organizer: International Symposium on Surface Science (ISSS-6)
  • Place of Presentation: Tokyo, Japan
  • Year and Date: 2011-12-14
• [Presentation] Three dimensional force mapping and KPFM measurements on the CaF2/ Si(111) surface (2011)
  • Author(s): M. Fukumoto and M. Abe et al.
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-11-20
• [Presentation] 室温原子操作によるAgナノクラスターの作製 (2011)
  • Author(s): 平山直樹
  • Organizer: 社団法人日本金属学会秋期大会
  • Place of Presentation: カルチャーリゾートフェストーネ,宜野湾市,沖縄県
  • Year and Date: 2011-11-07
• [Presentation] Si(111)-7×7表面上におけるAFM/STMを用いた3D force mappingによる同時測定 (2011)
  • Author(s): 上田啓市
  • Organizer: 社団法人日本金属学会秋期大会
  • Place of Presentation: カルチャーリゾートフェストーネ,宜野湾市,沖縄県
  • Year and Date: 2011-11-07
• [Presentation] 非接触原子間力顕微鏡を用いたH/Si(111)-7×7表面の測定 (2011)
  • Author(s): 福本将輝
  • Organizer: 社団法人日本金属学会秋期大会
  • Place of Presentation: カルチャーリゾートフェストーネ,宜野湾市,沖縄県
  • Year and Date: 2011-11-07
• [Presentation] 原子間力顕微鏡による半導体中の不純物の直接観察 (2011)
  • Author(s): 阿部真之
  • Organizer: 第29回(2010年春期)応用物理学会 26p-KL-3
  • Place of Presentation: 神奈川県(厚木市)(招待講演)
  • Year and Date: 2011-03-26
• [Presentation] 原子間力顕微鏡による半導体中の不純物の直接観察 (2011)
  • Author(s): 阿部真之
  • Organizer: 第29回(2010年春期)応用物理学会 26P-KL-3
  • Place of Presentation: 神奈川県(厚木市)(招待講演)
  • Year and Date: 2011-03-26
• [Presentation] Simultaneous AFM and STM measurements at room temperature (2010)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: The 18th International Colloquium on Scanning Probe Microscopy S5-3, p.11
  • Place of Presentation: Sizuoka, Japan (AtagawaHaitsu)(Oral)
  • Year and Date: 2010-12-10
• [Presentation] Simultaneous force and current mapping of the Si(111)-(7x7)surface by dynamic force microscopy (2010)
  • Author(s): Keiichi Ueda
  • Organizer: The 18th International Colloquium on Scanning Probe Microscopy S4-2, P.39
  • Place of Presentation: Sizuoka, Japan (AtagawaHaitsu)(Poster)
  • Year and Date: 2010-12-10
• [Presentation] Force spectroscopy on hydrogen adsorbed Si(111)-(7x7)surface using dynamic force microscopy (2010)
  • Author(s): Masaki Fukuinoto
  • Organizer: The 18th International Colloquium on Scanning Probe Microscopy S4-3, p.40
  • Place of Presentation: Sizuoka, Japan (AtagawaHaitsu)(Poster)
  • Year and Date: 2010-12-10
• [Presentation] High spring constant cantilever for small amplitude dynamic force microscopy using an optical interferometer (2010)
  • Author(s): Kenichi Morita
  • Organizer: The 18th International Colloquium on Scanning Probe Microscopy S5-2, p.10
  • Place of Presentation: Sizuoka, Japan (AtagawaHaitsu)(Oral)
  • Year and Date: 2010-12-10
• [Presentation] 原子間力顕微鏡を用いた水平原子操作に関わる相互作用力測定 (2010)
  • Author(s): 杉本宜昭
  • Organizer: 第30回表面科学学術講演会 6Ap-11, p.366
  • Place of Presentation: 大阪府(吹田市)(口頭発表)
  • Year and Date: 2010-11-06
• [Presentation] AFM/STM同時測定における化学結合とトンネル電流の相関 (2010)
  • Author(s): 澤田大輔
  • Organizer: 真空・表面科学合同講演会(第30回表面科学学術講演会・第51回真空に関する連合講演会) 5 P-064Y, p.303
  • Place of Presentation: 大阪府(吹田市)(Poster)
  • Year and Date: 2010-11-05
• [Presentation] 周波数変調方式AFMによる液中での可溶性結晶の格子像観察 (2010)
  • Author(s): 長嶋剣
  • Organizer: 第30回表面科学学術講演会 4Da-02, p.59
  • Place of Presentation: 大阪府(吹田市)(口頭発表)
  • Year and Date: 2010-11-04
• [Presentation] 水晶カンチレバーと光干渉計を用いた小振幅原子間力顕微鏡測定 (2010)
  • Author(s): 森田健一
  • Organizer: 第30回表面科学学術講演会 4Da-01S, p.58
  • Place of Presentation: 大阪府(吹田市)(口頭発表)
  • Year and Date: 2010-11-04
• [Presentation] 水晶カンチレバーと光干渉計を用いた小振幅原子間力顕微鏡 (2010)
  • Author(s): 森田健一
  • Organizer: 第71回応用物理学会学術講演会 P9-19
  • Place of Presentation: 長崎県長崎市(長崎大学)(ポスター)
  • Year and Date: 2010-09-16
• [Presentation] Atomic resolution observation of soluble crystals in liquid by Frequency-Modulation AFM (2010)
  • Author(s): KenNagashima
  • Organizer: 167 Committee satellite workshop on SPM p.6-7
  • Place of Presentation: Ishikawa, Japan (Kanazawa)
  • Year and Date: 2010-08-04
• [Presentation] AFM/STM Simultaneous Imaging of the Si4 Tetramer (2010)
  • Author(s): Daisuke Sawada
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy(NC-AFM2010) P2-1-10, p.112
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Poster)
  • Year and Date: 2010-08-02
• [Presentation] Impact of asymmetry tip structure on NC-AFM force mapping (2010)
  • Author(s): Hong Jing Chung
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010) P2-2-16, p.136
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Poster)
  • Year and Date: 2010-08-02
• [Presentation] Atom manipulation and force measurement by atomic force microscopy (2010)
  • Author(s): Hideki Tanaka
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010) P2-1-14, P.116
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Poster)
  • Year and Date: 2010-08-02
• [Presentation] Measurement of atom hopping probability and interaction force during atom manipulation on the Si(111)-(7x7)surface (2010)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010) Su-1440, p.9
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Oral)
  • Year and Date: 2010-08-01
• [Presentation] Small-amplitude dynamic force microscopy using a quartz cantilever combined with an optical interferometer (2010)
  • Author(s): Kenichi Morita
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy(NC-AFM2010) Su-1200, p.7
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Oral)
  • Year and Date: 2010-08-01
• [Presentation] Small-amplitude dynamic force microscopy using a quartz cantilever and an optical interferometer (2010)
  • Author(s): Kenichi Morita
  • Organizer: 2nd Global COE Student Conference on Innovative Electronic Topics SCIENT2010 Po-01, p.50
  • Place of Presentation: Osaka, Japan (Suita)(Poster)
  • Year and Date: 2010-07-28
• [Presentation] 原子間力顕微鏡を用いた原子レベルでの物性計測と原子操作 (2010)
  • Author(s): 阿部真之
  • Organizer: 計測自動制御学会関西支部平成22年度講習会
  • Place of Presentation: 学校法人常翔学園大阪センター(招待講演)
  • Year and Date: 2010-07-13
• [Presentation] NC-AFM/STM Measurements on the Semiconductor Surface (2010)
  • Author(s): Daisuke Sawada
  • Organizer: 13th International Conference on Intergranular and Interphase Boundaries in Materials P-C37, p.205
  • Place of Presentation: Mie, Japan (Shima)(Poster)
  • Year and Date: 2010-07-01
• [Presentation] Toward Atom-by-Atom Nanostructuring of Composite Nanomaterials Based on Atomic Force Microscopy (2010)
  • Author(s): Seizo Morita
  • Organizer: 6th Nanoscienceand Nanotechnology Conference (Nano-TRVI) p.145
  • Place of Presentation: Cesme, Turkey (Izmir)(Plenary Talk)
  • Year and Date: 2010-06-17
• [Presentation] Room-temperature AFM experience with large amplitude (2010)
  • Author(s): Masayuki Abe
  • Organizer: 12th International Ceramics Congress
  • Place of Presentation: Montecatini Terme, Italy(Invited)
  • Year and Date: 2010-06-08
• [Presentation] High spring constant cantilever with metal tip for small amplitude NC-AFM operation (2010)
  • Author(s): Kenichi Morita
  • Organizer: International Conference on Core Research and Engineering Science of Advanced Materials PSI-45
  • Place of Presentation: Osaka, Japan (Suita)(Poster)
  • Year and Date: 2010-06-01
• [Presentation] 半導体表面におけるAFM/STM同時測定 (2010)
  • Author(s): 杉本宜昭
  • Organizer: 社団法人日本顕微鏡学会第66回学術講演会 26aC04-S
  • Place of Presentation: 愛知県名古屋市(名古屋国際会議場)(招待講演)
  • Year and Date: 2010-05-26
• [Presentation] 周波数変調方式AFMによる液中での無機・有機結晶の格子像観察 (2010)
  • Author(s): 長嶋剣
  • Organizer: 日本地球惑星科学連合2010年大会 MIS012-09
  • Place of Presentation: 千葉県千葉市(幕張メッセ国際会議場)(口頭発表)
  • Year and Date: 2010-05-23
• [Presentation] Site-specific force spectroscopy on TiO_2 (110) surface at low-temperature (2010)
  • Author(s): Abdi Pratama
  • Organizer: 2nd Global COE International Symposium--Electronic Devices Innovation--, Workshop on Applications of Atomic Force Microscopy
  • Place of Presentation: Osaka, Japan (Hotel Hankyu Expo-park, Suita)
  • Year and Date: 2010-01-14
• [Presentation] Force and Tunneling Current Measurements on the Semiconductor Surface (2010)
  • Author(s): Daisuke Sawada
  • Organizer: 2nd Global COE International Symposium--Electronic Devices Innovation--, Workshop on Applications of Atomic Force Microscopy
  • Place of Presentation: Osaka, Japan (Hotel Hankyu Expo-park, Suita)
  • Year and Date: 2010-01-14
• [Presentation] Molecular resolution investigation of tetragonal lysozyme(110) face in liquid by frequency-modulation AFM (2009)
  • Author(s): Ken Nagashima
  • Organizer: Watching Biomolecules in Action Symposium & 2nd Kanazawa Bio-AFM Workshop
  • Place of Presentation: Osaka, Japan (Suita)
  • Year and Date: 2009-12-15
• [Presentation] YBCOバイクリスタル結晶粒界接合の欠陥と電気特性評価 (2009)
  • Author(s): 牧哲朗
  • Organizer: 第8回低温工学・超伝導若手合同講演会
  • Place of Presentation: 大阪市立大学文化交流センター
  • Year and Date: 2009-12-11
• [Presentation] NC/AFM/STM measurements on the Si(111)-(7×7) surface and the Ge(111)-c(2×8) surface (2009)
  • Author(s): Ryousuke Takimoto
  • Organizer: 17th International Colloquium on Scanning Probe Mivroscopy (ICSPM17)
  • Place of Presentation: Shizuoka, Japan (Atagawa)
  • Year and Date: 2009-12-10
• [Presentation] Studying different type of image contrast on TiO2 (110) surface by using nc-AFM measurement (2009)
  • Author(s): Hideki Tanaka
  • Organizer: 17th International Colloquium on Scanning Probe Mivroscopy (ICSPM17)
  • Place of Presentation: Shizuoka, Japan (Atagawa)
  • Year and Date: 2009-12-10
• [Presentation] Atomic Resolution Imaging of alkali halide crystal in liquid by Frequency-Modulation AFM (2009)
  • Author(s): Sho Yamane
  • Organizer: 17th International Colloquium on Scanning Probe Mivroscopy (ICSPM17)
  • Place of Presentation: Shizuoka, Japan (Atagawa)
  • Year and Date: 2009-12-10
• [Presentation] Molecular resolution investigation of tetragonal lysozyme(110) face in liquid by frequency-modulation AFM (2009)
  • Author(s): Ken Nagashima
  • Organizer: 17th International Colloquium on Scanning Probe Mivroscopy (ICSPM17)
  • Place of Presentation: Shizuoka, Japan (Atagawa)
  • Year and Date: 2009-12-10
• [Presentation] Understanding the Mechanism of Different Contrast Modes on TiO_2(110)-(1×1) Surface using nc-AFM at Low Temperature-a Force Spectroscopic Measurement (2009)
  • Author(s): Abdi Pratama
  • Organizer: 2009 MRS FALL MEETING
  • Place of Presentation: Boston, USA (The Hynes Convention Center)
  • Year and Date: 2009-12-02
• [Presentation] AFM/STM Simultaneous Measurement on TiO_2 (110) Surface (2009)
  • Author(s): Hideki Tanaka
  • Organizer: 2009 MRS FALL MEETING
  • Place of Presentation: Boston, USA (The Hynes Convention Center)
  • Year and Date: 2009-12-01
• [Presentation] Force and Tunneling Current Measurements on the Semiconductor Surface (2009)
  • Author(s): Ken-ichi Morita
  • Organizer: 2009 MRS FALL MEETING
  • Place of Presentation: Boston, USA (The Hynes Convention Center)
  • Year and Date: 2009-12-01
• [Presentation] Simultaneous Measurement of Force and Tunneling Current with Atomic Force Microscopy (2009)
  • Author(s): Masayuki Abe
  • Organizer: 2009 MRS FALL MEETING
  • Place of Presentation: Boston, USA (The Hynes Convention Center)
  • Year and Date: 2009-11-30
• [Presentation] Atomic Resolution Imaging of KBr(100) cleaved surface in saturated solution by Frequency-Modulation AFM (2009)
  • Author(s): Sho Yamane
  • Organizer: The 4th International Symposium on Atomic Technologies (ISAT-4)
  • Place of Presentation: Hyogo, Japan (Kobe)
  • Year and Date: 2009-11-19
• [Presentation] NC-AFM/STM measurements on the Si(111)-(7×7) surface and the Ge(111)-c(2×8) surface (2009)
  • Author(s): Ryousuke Takimoto
  • Organizer: The 4th International Symposium on Atomic Technologies (ISAT-4)
  • Place of Presentation: Hyogo, Japan (Kobe)
  • Year and Date: 2009-11-19
• [Presentation] Atom-by-Atom Nanostructuring of Composite Nanomaterials Based on AFM (2009)
  • Author(s): Seizo Morita
  • Organizer: The 4th International Symposium on Atomic Technologies (ISAT-4)
  • Place of Presentation: Hyogo, Japan (Kobe)
  • Year and Date: 2009-11-18
• [Presentation] 超高真空非接触原子間力顕微鏡による原子レベル物性評価 (2009)
  • Author(s): 阿部真之
  • Organizer: 日本表面科学会
  • Place of Presentation: タワーホール船堀
  • Year and Date: 2009-10-29
• [Presentation] 超高真空非接触原子間力顕微鏡による原子レベル物性評価 (2009)
  • Author(s): 阿部真之
  • Organizer: (社)日本表面科学会 第29回表面科学学術講演会「急速に進歩する非接触原子間力顕微鏡」
  • Place of Presentation: タワーホール船堀(東京都江戸川区)
  • Year and Date: 2009-10-29
• [Presentation] FM-AFMによる正方晶リゾチーム(110)面の液中分子分解能観察 (2009)
  • Author(s): 長嶋剣
  • Organizer: 第70回応用物理学会学術講演会
  • Place of Presentation: 富山県(富山市)
  • Year and Date: 2009-09-08
• [Presentation] Probing the interaction of potassium (K) atoms on TiO_2(110) surface by using non-contact atomic force microscopy (nc-AFM) at low temperature (2009)
  • Author(s): Abdi Pratama
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-02
• [Presentation] Constant height AFM/STM imaging on TiO_2(110) surface (2009)
  • Author(s): Hideki Tanaka
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-02
• [Presentation] NC-AFM/STM Measurements on the Si(111)-(7×7) Surface (2009)
  • Author(s): Daisuke Sawada
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-02
• [Presentation] Atomic Resolution Observation of KBr(100) cleaved surface in liquid by FM-AFM (2009)
  • Author(s): Sho Yamane
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-02
• [Presentation] 非接触原子間力顕微鏡法による機能性材料の原子レベル物性評価 (2009)
  • Author(s): 阿部真之
  • Organizer: 日本セラミックス協会
  • Place of Presentation: 愛媛大学
  • Year and Date: 2009-09-01
• [Presentation] Atom Manipulation by Atomic Force Microscopy (2009)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-01
• [Presentation] 周波数変調方式AFMによる液中での分子分解能測定 (2009)
  • Author(s): 長嶋剣
  • Organizer: 第34回結晶成長討論会
  • Place of Presentation: 宮城県(仙台市)
  • Year and Date: 2009-09-01
• [Presentation] FM-AFMを用いた溶液中でのKBr(100)劈開面の原子分解能観察 (2009)
  • Author(s): 山根翔
  • Organizer: 第4回三大学(東京理科大・筑波大・大阪大)連携学生研究会「アトミック/ポリスケールテクノロジー連携研究会」
  • Place of Presentation: 北海道山越群(長万部町)
  • Year and Date: 2009-08-27
• [Presentation] Site-specific force spectroscopy on TiO_2(110) surface at low-temperature (2009)
  • Author(s): Ayhan Yurtsever
  • Organizer: 12th International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: CT, USA (NEW Haven)
  • Year and Date: 2009-08-12
• [Presentation] Molecular Resolution Investigation of Lysozyme Crystal in Liquid by Frequency-Modulation AFM (2009)
  • Author(s): Ken Nagashima
  • Organizer: 12th International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: CT, USA (NEW Haven)
  • Year and Date: 2009-08-12
• [Presentation] Simultaneous measurement of force and tunneling current (2009)
  • Author(s): Daisuke Sawada
  • Organizer: 12th International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: CT, USA (NEW Haven)
  • Year and Date: 2009-08-11
• [Presentation] Force and Tunneling Current Measurements on the Semiconductor Surface (2009)
  • Author(s): Daisuke Sawada
  • Organizer: 12th International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: CT, USA (NEW Haven)
  • Year and Date: 2009-08-11
• [Presentation] Toward Atom-by-Atom Assembly of Complex Nanostructures Based on Atomic Force Microscopy (2009)
  • Author(s): Seizo Morita
  • Organizer: Local meeting of Czech Nanosociety (Institute of Physics, Academy of Sciences of the Czech Republic)
  • Place of Presentation: Czech Republic (Prague)
  • Year and Date: 2009-07-16
• [Presentation] Toward Atom-by-Atom Assembly of Complex Nanostructures Based on Atomic Force Microscopy (2009)
  • Author(s): Seizo Morita
  • Organizer: Physikalisches Kolloquium-Weekly colloquia SS09, Physik, Universitat Regensburg, Germany
  • Place of Presentation: Germany (Regansburg)
  • Year and Date: 2009-07-13
• [Presentation] 周波数変調方式AFMによる液中での分子分解能測定 (2009)
  • Author(s): 長嶋剣
  • Organizer: 日本地球惑星科学連合2009年大会
  • Place of Presentation: 千葉県(幕張メッセ、千葉市)
  • Year and Date: 2009-05-16
• [Remarks]
  • URL: http://www.afm.eei.eng.osaka-u.ac.jp/