Establishment of a novel electron tomographic reconstruction method based on a newly found property of image fine dots which convergently move to definitive positions
| Project/Area Number |
21310075
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Nanomaterials/Nanobioscience
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| Research Institution | Kogakuin University |
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Principal Investigator |
BABA Norio 工学院大学, 情報学部, 教授 (80164896)
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| Co-Investigator(Renkei-kenkyūsha) |
KANEKO Kenji 九州大学, 大学院・工学研究院, 教授 (30336002)
BABA Misuzu 工学院大学, 総合研究所, 研究員 (80435528)
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| Project Period (FY) |
2009 – 2011
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| Project Status |
Completed (Fiscal Year 2011)
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| Budget Amount *help |
¥18,590,000 (Direct Cost: ¥14,300,000、Indirect Cost: ¥4,290,000)
Fiscal Year 2011: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2010: ¥8,710,000 (Direct Cost: ¥6,700,000、Indirect Cost: ¥2,010,000)
Fiscal Year 2009: ¥6,110,000 (Direct Cost: ¥4,700,000、Indirect Cost: ¥1,410,000)
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| Keywords | 電子線CT / 画像再構成 / 画像復元 / 逆問題 / ナノ材料 / ナノバイオ |
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| Research Abstract |
With an electron microscope nano-tomographic images(nano-order resolution) of various materials can be taken, in which the same principle as medical X-ray CT apparatuses is used. However, in general, because a specimen is put on a support thin film extended horizontally the tilt angle is limited to about 60deg.(90deg. ideal). Therefore, only distorted tomographic images are obtained. In this research work, a novel image reconstruction method was devised. This was applied to them and as a result successful images unaffected by the distortion artifact were obtained. Furthermore, it was achieved that the electron dose was reduced to about 20% as compared with the general case.
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Report
(4 results)
Research Products
(19 results)
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[Journal Article] Nanostructural characterization and catalytic analysis of hybridized platinum/phthalocyanine nanocomposites2009
Author(s)
K. Kaneko, K. Furuya, A. B. Hungria, J-C. H. Garrido, P. A. Midgley, T. Onodera, H. Kasai, Y. Yaguchi, H. Oikawa, Y. Nomura, H. Harada, T. Ishihara and N. Baba
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Journal Title
J. Electron Microsc
Volume: Vol.58
Pages: 289-294
Related Report
Peer Reviewed
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