| Budget Amount *help |
¥18,330,000 (Direct Cost: ¥14,100,000、Indirect Cost: ¥4,230,000)
Fiscal Year 2012: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2011: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2010: ¥6,240,000 (Direct Cost: ¥4,800,000、Indirect Cost: ¥1,440,000)
Fiscal Year 2009: ¥6,110,000 (Direct Cost: ¥4,700,000、Indirect Cost: ¥1,410,000)
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| Research Abstract |
We experimentally demonstrated an enhanced translation of an x-ray beam nearly parallel to the diffracting planes with mm order distance in a deformed silicon crystal. The combination of a nearby Bragg reflection and a strain field in the crystal allows a shift in the x-ray beam that scales as square of wavelength. For further precise control of x-ray beams, the atomic strain near the interface of hetero-epitaxial crystal was used. By illuminating x-rays onto the interface having thousands of quantum dots on the top, the x-rays were observed to be split into two directions both of which were repeatedly translated under hundreds of quantum dots.
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