| Project/Area Number |
21340087
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Condensed matter physics I
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| Research Institution | National Institute of Advanced Industrial Science and Technology |
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Principal Investigator |
OSHIMA Nagayasu 独立行政法人産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (00391889)
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| Co-Investigator(Kenkyū-buntansha) |
HAYASHIZAKI Noriyosu 東京工業大学, 原子炉工学研究所, 准教授 (50334537)
KURODA Ryunoduke 産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (70350428)
SUZUKI Ryoichi 産業技術総合研究所, 計測フロンティア研究部門, 副研究部門長 (80357300)
BRIAN O rourke 産業技術総合研究所, 計測フロンティア研究部門, 研究員 (60586551)
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| Project Period (FY) |
2009 – 2011
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| Project Status |
Completed (Fiscal Year 2011)
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| Budget Amount *help |
¥18,720,000 (Direct Cost: ¥14,400,000、Indirect Cost: ¥4,320,000)
Fiscal Year 2011: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2010: ¥6,110,000 (Direct Cost: ¥4,700,000、Indirect Cost: ¥1,410,000)
Fiscal Year 2009: ¥10,920,000 (Direct Cost: ¥8,400,000、Indirect Cost: ¥2,520,000)
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| Keywords | 大気陽電子顕微鏡 / 大気陽電子プローブマイクロアナライザー / 陽電子消滅 / 陽電子プローブマイクアナライザ / 低速陽電子ビーム / 陽電子寿命測定 |
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| Research Abstract |
An atmospheric positron microprobe has been developed which can detect atomic defects in materials placed in air. A prototype device has been constructed and characterized, and practical application of the positron microprobe demonstrated. Using the prototype device a pulsed, focused, slow positron beam was extracted into air and previously impossible 'in-situ' measurements of atomic defects in functional thin films and other materials were undertaken. By measuring the positron lifetime in these materials we were able to perform non-destructive defect characterization in atmospheric conditions.
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