|Budget Amount *help
¥18,850,000 (Direct Cost: ¥14,500,000、Indirect Cost: ¥4,350,000)
Fiscal Year 2012: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
Fiscal Year 2011: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
Fiscal Year 2010: ¥8,060,000 (Direct Cost: ¥6,200,000、Indirect Cost: ¥1,860,000)
Fiscal Year 2009: ¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Dielectronic recombination processes of few electron heavy highly charged ions have been studied with the Tokyo electron beam ion trap at the University of Electro-Communications. By combining two experiments, X-ray measurements and ion abundance measurements, the angular distribution of X-rays emitted in dielectronic recombination processes has been measured for lithiumlike ions. The dominant contribution of the Breit interaction effect on the angular distribution has been clearly demonstrated.