Structure analysis of adsorbed molecules or ions at liquid-liquid interface by total-reflection X-ray absorption spectroscopy

• Project/Area Number: 21350047
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Analytical chemistry
• Research Institution: Tokyo Institute of Technology (2010-2012); Japan Synchrotron Radiation Research Institute (2009)
• Principal Investigator: HARADA Makoto (2010-2012) 東京工業大学, 大学院・理工学研究科, 助教 (60313326); 谷田 肇 (2009) Japan Synchrotron Radiation Research Institute, 利用研究促進部門, 副主幹研究員 (70301760)
• Co-Investigator(Kenkyū-buntansha): TAKIUE Takatomo 九州大学, 理学(系)研究科(研究院), 准教授 (40271100) ; NAGATANI Hirohisa 金沢大学, 物質化学系, 准教授 (90346297) ; 原田 誠 東京工業大学, 理工学研究科, 助教 (60313326)
• Project Period (FY): 2009 – 2012
• Project Status: Completed (Fiscal Year 2012)
• Budget Amount: ¥18,980,000 (Direct Cost: ¥14,600,000、Indirect Cost: ¥4,380,000); Fiscal Year 2012: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000); Fiscal Year 2011: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000); Fiscal Year 2010: ¥5,850,000 (Direct Cost: ¥4,500,000、Indirect Cost: ¥1,350,000); Fiscal Year 2009: ¥7,280,000 (Direct Cost: ¥5,600,000、Indirect Cost: ¥1,680,000)
• Keywords: XAFS / 液液界面 / 全反射 / 反射率測定 / 電位規制界面 / 反射率 / 界面吸着 / 偏光X線解析

Research Abstract

XAFS (X-ray absorption fine structure) technique has been applied to the local structure analysis of solvated ions or molecules. Total-reflection fluorescence-XAFS (TR-XAFS) method has been developed and improved for the observations of their structures in situ at the liquid-liquid interface.The amount of adsorbed bromide ions at DTAB aqueous solution-hexane interface has been estimated from XAFS jump height at Br K edge using this TR-XAFS apparatus. It was clear that the adsorption behavior of bromide ions at water-hexane interface was different from that at the aqueous solution surface.The molecular orientation of hydrophobic ZnTPP at heptane-water interface was studied byTR-XAFS method taken horizontal and vertical polarizations of synchrotron radiation.

Research Products

• [Journal Article] Study on the distribution of binary mixed counterions in surfactant adsorbed films by total reflection XAFS measurements (2012)
  • Author(s): Yosuke Imai, et al
  • Journal Title: Journal of Colloid and Interface Science Volume: 388 Issue: 1 Pages: 219-224
  • DOI: 10.1016/j.jcis.2012.08.044
  • Peer Reviewed
• [Journal Article] Dynamics of Condensed Monolayer and Multilayer Formation of Hexadecylpyridinium Chloride-Sodium Dodecyl Sulfate Mixed Systems at the Air/Water Interface (2012)
  • Author(s): Hiroki Takumi, Megumi Noda, Hiroki Matsubara, Takanori Takiue, Makoto Aratono
  • Journal Title: Chemistry Letters Volume: 41 Issue: 10 Pages: 1218-1220
  • DOI: 10.1246/cl.2012.1218
  • NAID: 130004426382
  • Peer Reviewed
• [Journal Article] Multilayer Formation of the Fluoroalkanol -〓-Hydrogenated Fluorocarbon Mixture at theHexane/Water Interface Studied by Interfacial Tensiometry and X-ray Reflection (2012)
  • Author(s): T. Takiue, T. Tottori, K. Tatsuta, H. Matsubara, K. Nitta, H. Tanida, T. Uruga, M. Aratono
  • Journal Title: J.Phys.Chem.B Volume: 116 Issue: 46 Pages: 13739-13748
  • DOI: 10.1021/jp309589f
  • Peer Reviewed
• [Journal Article] ソフト界面の分子膜の精密構造解析I:X線吸収分光法 (2012)
  • Author(s): 谷田肇、原田誠、瀧上隆智、永谷広久
  • Journal Title: オレオサイエンス Pages: 11-16
  • URL: http://www.jocs-office.or.jp/mokuji/somokuji2012.html
  • Peer Reviewed
• [Journal Article] Molecular Rearrangement in a Zinc Stearate Langmuir Film Dependent on a Film Preparation Method Studied by Using Polarization-Modulation Infrared Reflection Absorption Spectroscopy and X-ray Absorption Fine Structure" (2012)
  • Author(s): Maiko Muro, Makoto Harada, Tetsuo Okada, Takeshi Hasegawa
  • Journal Title: Journal of Physical Chemistry B Volume: 116 Issue: 10 Pages: 3148-3154
  • DOI: 10.1021/jp212028d
  • Peer Reviewed
• [Journal Article] Polarized Total-Reflection X-Ray Absorption Spectroscopy at the Liquid-Liquid Interface (2011)
  • Author(s): H. Nagatani, H. Tanida, M. Harada, M. Asada, T. Sagara
  • Journal Title: IUPAC International Congress on Analytical Sciences 2011
• [Journal Article] Polarized Total-Reflection X-Ray Absorption Spectroscopy at the Liquid-Liquid Interface (2011)
  • Author(s): H.Nagatani, H.Tanida, M.Harada, M.Asada, T.Sagara
  • Journal Title: IUPAC International Congress on Analytical Sciences 2011
• [Journal Article] Polarized Total-Reflection X-ray Absorption Fine Structure of Zinc(II) Porphyrin at the Heptane-Water Interface (2010)
  • Author(s): H. Nagatani, H. Tanida, M. Harada, M. Asada, T. Sagara
  • Journal Title: J.Phys.Chem.C Volume: 114(43) Issue: 43 Pages: 18583-18587
  • DOI: 10.1021/jp106562e
  • Peer Reviewed
• [Journal Article] Polarized Total-Reflection X-ray Absorption Fine Structure of Zinc(II) Porphyrin at the Heptane-Water Interface. (2010)
  • Author(s): Nagatani, Hirohisa, Tanida, Hajime, Harada, Makoto, Asada, Maki, Sagara, Takamasa.
  • Journal Title: Journal of Physical Chemistry C Volume: 114 Pages: 18583-18587
  • Peer Reviewed
• [Journal Article] X-ray absorption fine structure of bromide ions attracted by cationic surfactants at the heptane-water interface (2009)
  • Author(s): H. Tanida, H. Nagatani M. Harada
  • Journal Title: J.Phys.:Conf.Ser Volume: 190 Pages: 12061-12061
  • DOI: 10.1088/1742-6596/190/1/012061
  • Peer Reviewed
• [Journal Article] X-ray absorption fine structure of bromide ions attracted by cationic surfactants at the heptane-water interface (2009)
  • Author(s): Hajime Tanida, Hirohisa Nagatani, Makoto Harada
  • Journal Title: Journal of Physics : Conference Series 190
  • Peer Reviewed
• [Presentation] シンクロトロン放射光を利用したソフト界面膜の構造解析 (2013)
  • Author(s): 瀧上隆智
  • Organizer: 表面力セミナー
  • Place of Presentation: 仙台
  • Year and Date: 2013-03-02
• [Presentation] 全反射X線吸収分光法による2-オクタノン/水界面における吸着化学種の直接測定 (2012)
  • Author(s): 永谷広久
  • Organizer: 第58回ポーラログラフィーおよび電気分析化学討論会
  • Place of Presentation: 東京
  • Year and Date: 2012-11-28
• [Presentation] ドープ氷に含まれるイオンの水和構造解析 (2012)
  • Author(s): 原田誠
  • Organizer: 日本分析化学会第61年会
  • Place of Presentation: 石川
  • Year and Date: 2012-09-20
• [Presentation] Synergetic effect on multilayer formation of fluorocarbon compounds at the hexane/water interface studied by interfacial tensiometry and synchrotron X-ray reflection (2012)
  • Author(s): T. Takiue
  • Organizer: European Colloid and Interface ScienceConference
  • Place of Presentation: Malmo/Sweden
  • Year and Date: 2012-09-02
• [Presentation] Spontaneous multilayer formation at soft interfaces studied by interfacial tensiometry and synchrotron X-ray reflection (2012)
  • Author(s): T. Takiue
  • Organizer: International Association of Colloid and InterfaceScientists
  • Place of Presentation: 仙台
  • Year and Date: 2012-05-13
• [Presentation] 全反射X線吸収分光法による2-オクタノン／水界面における吸着化学種の直接測定 (2012)
  • Author(s): 永谷広久，原田誠，谷田肇，坂江広基，井村久則
  • Organizer: 第58回ポーラログラフィーおよび電気分析化学討論会
  • Place of Presentation: 高尾の森わくわくビレッジ（東京都）
• [Presentation] ドープ氷に含まれるイオンの水和構造解析 (2012)
  • Author(s): 原田誠、岡田哲男
  • Organizer: 日本分析化学会第61年会
  • Place of Presentation: 金沢大学（石川県）
• [Presentation] ソフト界面膜の構造と状態転移 (2011)
  • Author(s): 瀧上隆智
  • Organizer: 2011年日本化学会・西日本大会
  • Place of Presentation: 徳島
  • Year and Date: 2011-11-12
• [Presentation] ソフト界面膜の構造と状態転移 (2011)
  • Author(s): 瀧上隆智
  • Organizer: 2011年日本化学会・西日本大会
  • Place of Presentation: 徳島大学(徳島)
  • Year and Date: 2011-11-01
• [Presentation] シンクロトロンX線反射率測定による液/液界面ギブズ膜の構造解析 (2011)
  • Author(s): 瀧上隆智
  • Organizer: 応用物理学会シンポジウム
  • Place of Presentation: つくば
  • Year and Date: 2011-07-25
• [Presentation] シンクロトロンX線反射率測定による液/液界面ギブズ膜の構造解析 (2011)
  • Author(s): 瀧上隆智
  • Organizer: 応用物理学会シンポジウム
  • Place of Presentation: 物質・材料研究機構(つくば)
  • Year and Date: 2011-07-01
• [Presentation] Domain formation in Gibbs films at oil/water interface (2011)
  • Author(s): T. Takiue
  • Organizer: Colloid & In terface Science Seminar
  • Place of Presentation: 台湾
  • Year and Date: 2011-06-12
• [Presentation] Domain formation in Gibbs films at oil/water interface (2011)
  • Author(s): 瀧上隆智
  • Organizer: Colloid & Interface Science Seminar
  • Place of Presentation: 国立台湾大学(台北)(招待講演)
  • Year and Date: 2011-06-01
• [Presentation] Solvated structure analysis of bromide ions on cationic surface film (2011)
  • Author(s): M. Harada
  • Organizer: ICAS2011
  • Place of Presentation: Kyoto
  • Year and Date: 2011-05-22
• [Presentation] 放射光を利用したソフト界面膜の構造解析 (2011)
  • Author(s): 瀧上隆智
  • Organizer: ヘルスケア研究会
  • Place of Presentation: 大阪
  • Year and Date: 2011-04-12
• [Presentation] 放射光を利用したソフト界面膜の構造解析 (2011)
  • Author(s): 瀧上隆智
  • Organizer: ヘルスケア研究会
  • Place of Presentation: 新梅田研修センター(大阪)(招待講演)
  • Year and Date: 2011-04-01
• [Presentation] ソフト界面に存在する溶存イオンの局所構造 (2011)
  • Author(s): 原田誠
  • Organizer: 応用物理学会春季講演会
  • Place of Presentation: 神奈川大学
  • Year and Date: 2011-03-25
• [Presentation] シンクロトロンX線反射率測定による液/液界面ギブズ膜の構造解析 (2011)
  • Author(s): 瀧上隆智
  • Organizer: 応用物理学会春季講演会
  • Place of Presentation: 神奈川大学
  • Year and Date: 2011-03-25
• [Presentation] シンクロトロンX線反射率測定による液/液界面ギブズ膜の構造解析 (2011)
  • Author(s): 瀧上隆智
  • Organizer: 応用物理学会春季講演会
  • Place of Presentation: 神奈川
  • Year and Date: 2011-03-24
• [Presentation] ソフト界面に存在する溶存イオンの局所構造 (2011)
  • Author(s): 原田誠
  • Organizer: 応用物理学会春季講演会
  • Place of Presentation: 神奈川
  • Year and Date: 2011-03-24
• [Presentation] 電位規制界面での反応の直接観察 (2010)
  • Author(s): 原田誠
  • Organizer: 日本分析化学会第59年会
  • Place of Presentation: 仙台
  • Year and Date: 2010-09-15
• [Presentation] X-ray absorption fine structure of bromide ions attracted by cationic surfactants at the heptane-water interface (2009)
  • Author(s): Hajime Tanida, Hirohisa Nagatani, Makoto Harada
  • Organizer: The 14th International Conference on X-ray Absorption Fine Structure
  • Place of Presentation: Camerino, Italy
• [Book] 化学への応用が広がる放射光 (2013)
  • Author(s): 瀧上隆智,矢野陽子