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Development of 3-D measurement method based on projection moire for micro structure using SEM

Research Project

Project/Area Number 21360121
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Intelligent mechanics/Mechanical systems
Research InstitutionKansai University

Principal Investigator

ARAI Yasuhiko  関西大学, システム理工学部, 教授 (80131415)

Co-Investigator(Kenkyū-buntansha) TAGAWA Norio  関西大学, システム理工学部, 教授 (50298840)
AOYAGI Seiji  関西大学, システム理工学部, 教授 (30202493)
TAKATA Keiji  関西大学, システム理工学部, 教授 (50416939)
Project Period (FY) 2009 – 2011
Project Status Completed (Fiscal Year 2011)
Budget Amount *help
¥11,830,000 (Direct Cost: ¥9,100,000、Indirect Cost: ¥2,730,000)
Fiscal Year 2011: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2010: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2009: ¥8,190,000 (Direct Cost: ¥6,300,000、Indirect Cost: ¥1,890,000)
KeywordsSEM / MEMS / 縞解析 / 三次元形状計測 / 微細構造物計測 / 高分解能
Research Abstract

3-D measurement method by SEM has already been proposed by using the principle of shadow moire. In the method, the image of original grid in shadow moire image must be clearly removed in fringe analysis process in order to perform high resolution analysis. A new method based on the principle of projection moire is proposed to solve the trouble concerning the grid. In this study, the mechanism of producing some shadows of grid on the surface of the object by back scattering electron beam in the new method is discussed. Fringe image as shadow of grid is analyzed by Fringe scanning technology. 3-D precise measurement is realized by using the phenomenon of shadows of grid. Furthermore, a 3-D micro structure is measured. From comparison with results by AFM, it is confirmed that the proposed method has high-resolution power(about 20nm).

Report

(4 results)
  • 2011 Annual Research Report   Final Research Report ( PDF )
  • 2010 Annual Research Report
  • 2009 Annual Research Report
  • Research Products

    (29 results)

All 2012 2011 2010 2009

All Journal Article (11 results) (of which Peer Reviewed: 11 results) Presentation (18 results)

  • [Journal Article] 2枚のスペックルパターンのみを用いた高分解能電子スペックル計測法2012

    • Author(s)
      新井泰彦
    • Journal Title

      光学

      Volume: Vol.41 Pages: 96-104

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] 2枚のスペックルパターンのみを用いた高分解能電子スペックル計測法2012

    • Author(s)
      新井泰彦, 他3名
    • Journal Title

      光学

      Volume: 41 Pages: 96-104

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Speckle interferometry by using virtual speckle pattern based on Carre algorithm2011

    • Author(s)
      Yasuhiko Arai
    • Journal Title

      Journal of metrology society of India

      Volume: Vol.26 Pages: 303-314

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Micro 3D Measurement Method Using SEM2011

    • Author(s)
      Yasuhiko Arai
    • Journal Title

      Journal of Metrology Society of India

      Volume: Vol.26 Pages: 69-78

    • Related Report
      2011 Final Research Report 2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Speckle interferometry by using virtual speckle pattern based on Carre algorithm2011

    • Author(s)
      Yasuhiko Arai, 他3名
    • Journal Title

      Journal of metrology society of India

      Volume: 26 Pages: 303-314

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] SEMを用いた微細構造物の三次元形状計測法の開発2010

    • Author(s)
      新井泰彦
    • Journal Title

      機械の研究

      Volume: Vol.62 Pages: 328-334

    • NAID

      40017005101

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] SEMを用いた微細構造物の三次元形状計測法の開発2010

    • Author(s)
      新井泰彦
    • Journal Title

      機械の研究 62

      Pages: 328-334

    • NAID

      40017005101

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Carreアルゴリズムを基礎とするバーチャルスペックルパターンを用いた動的面外変形計測2009

    • Author(s)
      新井泰彦
    • Journal Title

      光学

      Volume: Vol.38 Pages: 529-538

    • NAID

      10025518696

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] デュアルカメラ技術を基礎としたスペックル干渉計測による電子デバイスの変形計測2009

    • Author(s)
      新井泰彦
    • Journal Title

      精密工学会誌

      Volume: Vol.75 Pages: 1323-1328

    • NAID

      130000421529

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Carre アルゴリズムを基礎とするバーチャルスペックルパターンを用いた動的面外変形計測2009

    • Author(s)
      新井泰彦
    • Journal Title

      光学 38

      Pages: 529-538

    • NAID

      10025518696

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Journal Article] デュアルカメラ技術を基礎としたスペックル干渉計測による電子デバイスの変形計測2009

    • Author(s)
      新井泰彦
    • Journal Title

      精密工学会誌 75

      Pages: 1323-1328

    • NAID

      130000421529

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Presentation] High Resolution 3-D Shape Measurement Using Shadow Moire2012

    • Author(s)
      Yasuhiko Arai
    • Place of Presentation
      セントペテルブルグ
    • Year and Date
      2012-07-05
    • Related Report
      2011 Final Research Report
  • [Presentation] Shadow moireを基礎としたSEMによる微小構造物の三次元形状計測法の開発-測定原理の微小構造物計測への適用-2012

    • Author(s)
      新井泰彦
    • Organizer
      日本機械学会学術講演会
    • Place of Presentation
      関西大学
    • Year and Date
      2012-03-16
    • Related Report
      2011 Final Research Report
  • [Presentation] Shadow moireを基礎としたSEMによる微小構造物の三次元形状計測法の開発-マクロモデルを用いた測定原理の開発-2012

    • Author(s)
      新井泰彦
    • Organizer
      日本機械学会学術講演会
    • Place of Presentation
      関西大学
    • Year and Date
      2012-03-16
    • Related Report
      2011 Final Research Report
  • [Presentation] SEMを用いた格子投影技術による微小構造物の三次元形状計測法の開発2012

    • Author(s)
      新井泰彦
    • Organizer
      日本機械学会学術講演会
    • Place of Presentation
      関西大学
    • Year and Date
      2012-03-16
    • Related Report
      2011 Final Research Report
  • [Presentation] SEMを用いた格子投影技術による微小構造物の三次元形状計測法の開発2012

    • Author(s)
      新井泰彦, 他3名
    • Organizer
      日本機械学会
    • Place of Presentation
      関西大学
    • Year and Date
      2012-03-16
    • Related Report
      2011 Annual Research Report
  • [Presentation] Shadow moireを基礎としたSEMによる微小構造物の三次元形状計測法の開発-マクロモデルを用いた測定原理の開発-2012

    • Author(s)
      新井泰彦, 他2名
    • Organizer
      日本機械学会
    • Place of Presentation
      関西大学
    • Year and Date
      2012-03-16
    • Related Report
      2011 Annual Research Report
  • [Presentation] Shadow moireを基礎としたSEMによる微小構造物の三次元形状計測法の開発-測定原理の微小構造物計測への適用-2012

    • Author(s)
      新井泰彦, 他1名
    • Organizer
      日本機械学会
    • Place of Presentation
      関西大学
    • Year and Date
      2012-03-16
    • Related Report
      2011 Annual Research Report
  • [Presentation] High-resolution electric speckle pattern interferometry by using only two speckle patterns2011

    • Author(s)
      Yasuhiko Arai
    • Organizer
      SPIE Annual meeting
    • Place of Presentation
      San Diego
    • Year and Date
      2011-08-23
    • Related Report
      2011 Final Research Report
  • [Presentation] High-resolution electric speckle pattern interferometry by using only two speckle patterns2011

    • Author(s)
      Yasuhiko Arai
    • Organizer
      SPIE Annual meeting
    • Place of Presentation
      SanDiego アメリカ
    • Year and Date
      2011-08-23
    • Related Report
      2010 Annual Research Report
  • [Presentation] High resolution speckle interferometr by replacing temporal information with spatial information2011

    • Author(s)
      Yasuhiko Arai
    • Organizer
      SPIE
    • Place of Presentation
      Munich
    • Year and Date
      2011-05-26
    • Related Report
      2011 Final Research Report
  • [Presentation] High resolution speckle interferometr by replacing temporal information with spatial information2011

    • Author(s)
      Yasuhiko Arai
    • Organizer
      SPIE
    • Place of Presentation
      Munich ドイツ
    • Year and Date
      2011-05-26
    • Related Report
      2010 Annual Research Report
  • [Presentation] SEMを用いた三次元構造物形状計測法2011

    • Author(s)
      新井泰彦
    • Organizer
      関西大学先端科学シンポジウム
    • Place of Presentation
      関西大学
    • Year and Date
      2011-01-14
    • Related Report
      2011 Final Research Report 2010 Annual Research Report
  • [Presentation] SEMを用いた格子投影技術による三次元形状計測法の開発2010

    • Author(s)
      新井泰彦
    • Organizer
      精密工学会学術講演会
    • Place of Presentation
      名古屋大学
    • Year and Date
      2010-09-28
    • Related Report
      2011 Final Research Report
  • [Presentation] SEMを用いた格子投影技術による三次元形状計測法の開発2010

    • Author(s)
      要石翔, 新井泰彦, 他3名
    • Organizer
      精密工学会
    • Place of Presentation
      名古屋大学
    • Year and Date
      2010-09-28
    • Related Report
      2010 Annual Research Report
  • [Presentation] 3-D micro-structure measurement by high resolution fringe analysisfor shadow moire image by SEM2010

    • Author(s)
      Yasuhiko Arai
    • Organizer
      SPIE
    • Place of Presentation
      サンディエゴ(アメリカ)
    • Year and Date
      2010-08-03
    • Related Report
      2011 Final Research Report
  • [Presentation] 3-D microstructure measurement method by using SEM2010

    • Author(s)
      Yasuhiko Arai
    • Organizer
      ICEM14
    • Place of Presentation
      ポアティエ(フランス)
    • Year and Date
      2010-07-03
    • Related Report
      2011 Final Research Report
  • [Presentation] SEMを用いた三次元微細構造物形状計測法2010

    • Author(s)
      新井泰彦
    • Organizer
      精密工学会学術講演会
    • Place of Presentation
      埼玉大学
    • Year and Date
      2010-03-17
    • Related Report
      2011 Final Research Report
  • [Presentation] SEMを用いた三次元微細構造物形状計測法2010

    • Author(s)
      新井泰彦
    • Organizer
      精密工学会
    • Place of Presentation
      埼玉大学
    • Year and Date
      2010-03-17
    • Related Report
      2009 Annual Research Report

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Published: 2009-04-01   Modified: 2016-04-21  

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