Development of high resolution in-situ electric field observation system in a transmission electron microscope
Project/Area Number |
21360307
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Research Category |
Grant-in-Aid for Scientific Research (B)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Physical properties of metals
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Research Institution | Nagoya University |
Principal Investigator |
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Co-Investigator(Kenkyū-buntansha) |
KURODA Kotaro 名古屋大学, 工学研究科, 名誉教授 (30161798)
TOKUNAGA Tomoharu 名古屋大学, 工学研究科, 助教 (90467332)
|
Project Period (FY) |
2009 – 2011
|
Project Status |
Completed (Fiscal Year 2011)
|
Budget Amount *help |
¥15,860,000 (Direct Cost: ¥12,200,000、Indirect Cost: ¥3,660,000)
Fiscal Year 2011: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
Fiscal Year 2010: ¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000)
Fiscal Year 2009: ¥8,060,000 (Direct Cost: ¥6,200,000、Indirect Cost: ¥1,860,000)
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Keywords | 表面 / 界面 / 粒界物性 / 幾何光学 / 電子光学 / 粒界 / 電子工学 |
Research Abstract |
A new method to visualize the electric and magnetic field in a transmission electron microscope named" Shadow Image Distortion" method which was invented by the author was modified in spatial resolution in order to be applicable for the nanoscale specimen. A new type of aperture and a computer software which obtained the digital image by using a CCD camera and analyze it automatically were developed. Highest spatial resolution and fastest analysis time were obtained to be 74 nm and 20 sec, respectively. Refinement of the theory using the geometrical electron optics gave the method to control the sensitivity and image magnification separately with the current applied to the condenser and objective lens of the transmission electron microscope. Also the method was found to be applicable to a high voltage electron microscope and the sensitivity was determined to be in the same order of a medium voltage electron microscope.
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Report
(4 results)
Research Products
(41 results)