High-efficiency thermoelectric devices with Si nanostructures and their measurement techniques

• Project/Area Number: 21360336
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Structural/Functional materials
• Research Institution: Shizuoka University
• Principal Investigator: IKEDA Hiroya 静岡大学, 電子工学研究所, 准教授 (00262882)
• Co-Investigator(Kenkyū-buntansha): ISHIDA Akihiro 静岡大学, 工学部, 教授 (70183738)
• Project Period (FY): 2009 – 2011
• Project Status: Completed (Fiscal Year 2011)
• Budget Amount: ¥17,420,000 (Direct Cost: ¥13,400,000、Indirect Cost: ¥4,020,000); Fiscal Year 2011: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000); Fiscal Year 2010: ¥10,140,000 (Direct Cost: ¥7,800,000、Indirect Cost: ¥2,340,000); Fiscal Year 2009: ¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
• Keywords: 熱電変換材料 / シリコンナノ構造 / ゼーベック係数 / SOI基板 / KFM(表面電位顕微鏡)

Research Abstract

Our research goals are the enhancement of Si thermoelectric characteristics by nanosturcturing and the construction of a novel technique characterizing the nanostructured materials. We found that Seebeck coefficient(thermoelectromotive force at a temperature deference of 1OC) of ultrathin Si is ruled by an impurity band and that Seebeck coefficient is controllable by external bias. Moreover, We have successfully obtained the Si Seebeck coefficient by surface-potential microscopy.

Research Products

• [Journal Article] Theore tical study on the stability of the single electron-pump refrigerator with respect to thermal and dimensional fluctuations (2012)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Journal Title: IEICE Trans. Electron. Volume: Vol.E95-C Pages: 924-927
  • Peer Reviewed
• [Journal Article] Theoretical study on the stability of the single-electron-pump refrigerator with respect to thermal and dimensional fluctuations (2012)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Journal Title: IEICE Trans.Electron. Volume: E95-C(印刷中)
  • NAID: 10030941608
  • Peer Reviewed
• [Journal Article] Construction of Seebeck-coefficient measurement by Kelvin-probe force microscopy (2012)
  • Author(s): Hiroya Ikeda, Kazutoshi Miwa, Faiz Salleh
  • Journal Title: AIP Conf.Proc.of 9th European Conference on Thermoelectrics Volume: (印刷中)
• [Journal Article] 外部電圧によりフェルミエネルギー制御した極薄Siのゼーベック係数 (2012)
  • Author(s): ファイズ・サレ, 三輪一聡, 池田浩也
  • Journal Title: 信学技報 Volume: ED2011-153, SDM2011-170 Pages: 65-69
  • NAID: 10031104952
• [Journal Article] A theoretical study of a novel single-electron refrigerator fabricated from semiconductor materials (2011)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Journal Title: Jpn. J. Appl. Phys. Volume: Vol.50
  • NAID: 210000070702
  • Peer Reviewed
• [Journal Article] See beck coefficient of heavily P-doped Si calculated from an alteration in electronic density of states (2011)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Journal Title: J. Electron. Mater. Volume: Vol.40 Pages: 903-906
  • Peer Reviewed
• [Journal Article] A novel refrigerator device using single-electron pump applicable to SOI wafers (2011)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Journal Title: Adv. Mater. Res. Volume: Vol.222 Pages: 66-69
  • Peer Reviewed
• [Journal Article] In fluence of impurity band on Seebeck coefficient in heavily-doped Si (2011)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Journal Title: Adv. Mater. Res. Volume: Vol.222 Pages: 197-200
  • Peer Reviewed
• [Journal Article] Growth of homogeneous polycrystalline Si_<1-x>Ge_x and Mg_2Si_<1-x>Ge_x for ther moelectric application (2011)
  • Author(s): Y.Hayakawa, M.Arivanandhan, Y.Saito, T.Koyama, Y.Momose, H.Ikeda, A.Tanaka, C.Wen, Y.Kubota T.Nakamura, S.Bhattacharya, D.K.Aswal, S.M.Babu, Y.Inatomi, H.Tatsuoka
  • Journal Title: Thin Solid Films Volume: 519 Issue: 24 Pages: 8532-8537
  • DOI: 10.1016/j.tsf.2011.05.033
  • Peer Reviewed
• [Journal Article] Growth of Si_<1-x>Ge_x bulk crystals with highly homogeneous composition for thermoelectric applications (2011)
  • Author(s): M.Arivanandhan, Y.Saito, T.Koyama, Y.Momose, H.Ikeda, A.Tanaka, T.Tatsuoka, D.K.Aswal, Y.Inatomi, Y.Hayakawa
  • Journal Title: J.Cryst.Growth Volume: 318 Issue: 1 Pages: 324-327
  • DOI: 10.1016/j.jcrysgro.2010.10.062
  • Peer Reviewed
• [Journal Article] A Theoretical Study of a Novel Single-Electron Refrigerator Fabricated from Semiconductor Materials (2011)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Journal Title: Japanese Journal of Applied Physics Volume: VOL.50 Issue: 6S Pages: 06GF20-06GF20
  • DOI: 10.1143/jjap.50.06gf20
  • Peer Reviewed
• [Journal Article] Seebeck Coefficient of Heavily P-Doped Si Calculated from an Alteration in Electronic Density of States (2011)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Journal Title: Journal of Electronic Materials Volume: VOL.40 Issue: 5 Pages: 903-906
  • DOI: 10.1007/s11664-010-1405-z
  • Peer Reviewed
• [Journal Article] Seebeck coefficient of heavily P-doped Si calculated from an alteration in electronic densit of states (2011)
  • Author(s): M.Arivanandhan, Y.Saito, T.Koyama, Y.Momose, H.Ikeda, A.Tanaka, T.Tatsuoka, D.K.Aswal, Y.Inatomi, Y.Hayakawa
  • Journal Title: J.Cryst.Growth Volume: (印刷中)
  • Peer Reviewed
• [Journal Article] Seebeck coefficient of heavily P-doped Si calculated from an alteration in electronic densi of states (2011)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Journal Title: J.Electron.Mater. Volume: (印刷中)
  • Peer Reviewed
• [Journal Article] Influence of impurity band on Seebeck coefficient in heavily-doped Si (2011)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Journal Title: Advanced Materials Research Volume: 222 Pages: 197-200
  • Peer Reviewed
• [Journal Article] A novel refrigeratior device using single-electron pump applicable to SOI wafers (2011)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Journal Title: Advanced Materials Research Volume: 222 Pages: 66-69
  • Peer Reviewed
• [Journal Article] Pドープ極薄Siにおけるゼーベック係数の理論的評価 (2011)
  • Author(s): ファイズ・サレ, 池田浩也
  • Journal Title: 信学技報 Volume: ED2010-193, SDM2010-228 Pages: 13-17
  • NAID: 110008688778
• [Journal Article] 単電子ポンプ動作を利用した半導体冷却デバイスの研究 (2011)
  • Author(s): 池田浩也, ファイズ・サレ
  • Journal Title: 信学技報 Volume: ED2010-193, SDM2010-228 Pages: 7-21
  • NAID: 110008689358
• [Journal Article] In fluence of heavy doping on Seebeck coefficient in silicon-on-insulator (2010)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Journal Title: Appl. Phys. Lett. Volume: Vol.96
  • Peer Reviewed
• [Journal Article] シリコンを用いた単電子冷却デバイスの研究 (2010)
  • Author(s): 池田浩也, ファイズ・サレ
  • Journal Title: 信学技報 Volume: ED2010-20, CPM2010-10, SDM2010-20 Pages: 17-21
  • NAID: 110007999962
• [Journal Article] 高不純物濃度SOI基板のゼーベック係数 (2010)
  • Author(s): 池田浩也, ファイズ・サレ
  • Journal Title: 信学技報 ED2009-197, SDM2009-194 Pages: 5-9
  • NAID: 110008001131
• [Journal Article] Influence of heavy doping on Seebeck coefficient in silicon-on-insulator (2010)
  • Author(s): H.Ikeda, F.Salleh
  • Journal Title: Appl.Phys.Lett 96
  • Peer Reviewed
• [Journal Article] Seebeck coefficient measurement by Kelvin-probe force microscopy (2009)
  • Author(s): Hiroya Ikeda, Fais Salleh
  • Journal Title: J. Autom. Mobile Rob. Intell. Syst. Volume: Vol.3 Pages: 49-51
  • Peer Reviewed
• [Journal Article] Im purity-concentration dependence of Seebeck coefficient in silicon-on-insulator layers (2009)
  • Author(s): Fais Salleh, Kiyosumi Asai, Akihiro Ishida, Hiroya Ikeda
  • Journal Title: J. Autom. Mobile Rob. Intell. Syst. Volume: Vol.3 Pages: 134-136
  • Peer Reviewed
• [Journal Article] Seebeck coefficient of ultra thin silicon-on-insulator layers (2009)
  • Author(s): Faiz Salleh, Kiyosumi Asai, Akihiro Iehida, Hiroya Ikeda
  • Journal Title: Appl. Phys. Express Volume: Vol.2
  • NAID: 10025087049
  • Peer Reviewed
• [Journal Article] Impurity-concentration dependence of Seebeck coefficient in silicon-on-insulator layers (2009)
  • Author(s): F.Salleh, K.Asai, A.Ishida, H.Ikeda
  • Journal Title: J.Autom.Mobile Rob.Intell.Syst. 3 Pages: 134-136
  • Peer Reviewed
• [Journal Article] Seebeck coefficient measurement by Kelvin-probe force microscopy (2009)
  • Author(s): H.Ikeda, F.Salleh, K.Asai
  • Journal Title: J.Autom.Mobile Rob.Intell.Syst. 3 Pages: 49-51
  • Peer Reviewed
• [Journal Article] Seebeck coefficient of ultrathin silicon-on-insulator layers (2009)
  • Author(s): F.Salleh, K.Asai, A.Ishida, H.Ikeda
  • Journal Title: Appl.Phys.Express 2
  • NAID: 10025087049
  • Peer Reviewed
• [Presentation] Growth of Homogeneous Si_<1-x>Ge_x and Mg_2Si_<1-x>Ge_x for Thermoelectric Application (2012)
  • Author(s): Y.Hayakawa, M.Arivanandhan, M.Omprakash, T.Koyama, Y.Momose, H.IKeda, A.Tanaka, H.Tatsuoka, A.Ishida, Y.Okano, Y.Inatomi, D.K.Aswal, S.Bhattacharya, D.Thangaraju, S.M.Babu
  • Organizer: Invited Seminar at Anna University
  • Place of Presentation: Chennai, India(招待講演)
  • Year and Date: 2012-02-23
• [Presentation] 単電子ポンプ冷却デバイスにおける熱輸送特性 (2012)
  • Author(s): 池田浩也, 三輪一聡, ファイズ・サレ
  • Organizer: 第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学(東京)
• [Presentation] KFMを用いたゼーベック係数測定技術の構築 (2012)
  • Author(s): 三輪一聡, ファイズ・サレ, 池田浩也
  • Organizer: 第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学(東京)
• [Presentation] In-situ Observation of Dissolution Process of Si into Ge Melt by X-ray Penetration Method (2012)
  • Author(s): M.Omprakash, M.Arivanandhan, H.Morii, T.Aoki, T.Koyama, Y.Momose, A.Tanaka, H.Ikeda, H.Tatsuokak, Y.Okano, T.Ozawa, Y.Inatomi, S.M.Babu, Y.Hayakawa
  • Organizer: 第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学(東京)
• [Presentation] Growth of Homogeneous Si_<1-x>Ge_x and Mg_2Si_<1-x>Ge_x for Thermoelectric Application (2012)
  • Author(s): Y.Hayakawa, M.Arivanandhan, M.Omprakash, T.Koyama, Y.Momose, H.Ikeda, A.Tanaka, H.Tatsuoka, A.Ishida, Y.Inatomi, D.K.Aswal, S.Bhattacharya, S.M.Babu
  • Organizer: International Conference on Recent Trend in Advanced Materials
  • Place of Presentation: Vellore, India(招待講演)
• [Presentation] 外部電圧によりフェルミエネルギー制御した極薄Siのゼーベック係数 (2012)
  • Author(s): ファイズ・サレ, 三輪一聡, 池田浩也
  • Organizer: 電子情報通信学会ED・SDM合同研究会
  • Place of Presentation: 北海道大学(札幌)
• [Presentation] プローブ顕微鏡を用いた熱電変換特性の評価 (2011)
  • Author(s): 池田浩也
  • Organizer: 日本表面科学会中部支部研究会
  • Place of Presentation: 静岡大学(浜松)(招待講演)
  • Year and Date: 2011-11-25
• [Presentation] Seebeck coefficient of ultrathin Si layer with bias-controlled Fermi energy (2011)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Organizer: 15th Int. Conf. on Thin Films
  • Place of Presentation: Kyoto
• [Presentation] Faiz Salleh, Construction of Seebeck-coefficinet measurement by Kelvin-probe for ce microscopy (2011)
  • Author(s): Hiroya Ikeda, Kazutoshi Miwa
  • Organizer: 9th Europ. Conf. on Thermoelectrics
  • Place of Presentation: Tessaloniki, Greece
• [Presentation] Variation of SOI Seebeck coefficient by applying external bias (2011)
  • Author(s): Faiz Salleh, Kazutoshi Miwa, Hiroya Ikeda
  • Organizer: 10th Int. Conf. on Global Research and Education
  • Place of Presentation: Sucevita, Romania
• [Presentation] Improvement in measurement system of Seebeck coefficient by KFM (2011)
  • Author(s): Kazutoshi Miwa, Faiz Salleh, Hiroya Ikeda
  • Organizer: 10th Int. Conf. on Global Research and Education
  • Place of Presentation: Sucevita, Romania
• [Presentation] A novel refrigerator device using single-electron pump fabricated from semiconductor materials (2011)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Organizer: 2011 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
  • Place of Presentation: Daejeon, Korea
• [Presentation] Thermoelectric Nanomaterials with a Large Seebeck Coefficient for Infrared Photodetector (2011)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Organizer: 13th Takayanagi Memorial Symposium
  • Place of Presentation: 静岡大学(浜松)
• [Presentation] Seebeck Coefficient of Ultrathin Si Layer with Bias-controlled Fermi Energy (2011)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Organizer: 15th International Conference on Thin Films
  • Place of Presentation: 京都テルサ(京都)
• [Presentation] Preparation and Thermoelectric Properties of Compositionally Homogeneous Mg_2Si_<1-x>Ge_x (2011)
  • Author(s): M.Arivanandhan, Y.Saito, T.Koyama,Y.Momose, A.Tanaka, H.Ikeda, H.Tatsuoka, A.Ishida, B.Shovit, D.K.Aswal, S.M.Babu, Y.Inatomi, Y.Hayakawa
  • Organizer: 第41回結晶成長国内会議、NCCG-41
  • Place of Presentation: つくば国際会議場(つくば)
• [Presentation] Seebeck Coefficient of SOI Layer with Bias-controlled Fermi Energy (2011)
  • Author(s): Faiz Salleh, Kazutoshi Miwa, Hiroya Ikeda
  • Organizer: Korean-Japanese Student Workshop
  • Place of Presentation: 静岡大学(浜松)
• [Presentation] Thermal characteristics of a single-electron-pump refrigerator (2011)
  • Author(s): Hiroya Ikeda, Kazutoshi, Miwa, Faiz Salleh
  • Organizer: 2012 International Microprocesses and Nanotechnology Conference
  • Place of Presentation: 京都全日空ホテル(京都)
• [Presentation] Construction of Seebeck-Coefficient Measurement by Kelvin-Probe Force Microscopy (2011)
  • Author(s): Hiroya Ikeda, Kazutoshi, Miwa, Faiz Salleh
  • Organizer: 9th European Conference on Thermoelectrics
  • Place of Presentation: Tessaloniki, Greece
• [Presentation] Improvement in Measurement System of Seebeck Coefficient by KFM (2011)
  • Author(s): Kazutoshi, Miwa, Faiz Salleh, Hiroya Ikeda
  • Organizer: 10th International Conference on Global Research and Education (InterAcademia 2011)
  • Place of Presentation: Sucevita, Romania
• [Presentation] Variation of SOI Seebeck Coefficient by Applying External Bias (2011)
  • Author(s): Faiz Salleh, Kazutoshi, Miwa, Hiroya Ikeda
  • Organizer: 10th International Conference on Global Research and Education (InterAcademia 2011)
  • Place of Presentation: Sucevita, Romania
• [Presentation] 単電子ポンプ冷却デバイス特性の動作温度依存性 (2011)
  • Author(s): 池田浩也, 三輪一聡, ファイズ・サレ
  • Organizer: 第72回応用物理学会学術演会
  • Place of Presentation: 山形大学(山形)
• [Presentation] 外部電圧印加によるSOIのゼーベック係数制御 (2011)
  • Author(s): ファイズ・サレ, 三輪一聡, 池田浩也
  • Organizer: 第72回応用物理学会学術演会
  • Place of Presentation: 山形大学(山形)
• [Presentation] Thermoelectric properties of compositionally homogeneous Si_<1-x>Ge_x and Mg_2Si_<1-x>Ge_x bulk crystals (2011)
  • Author(s): M.Arivanandhan, Y.Saito, T.Koyama, Y.Momose, A.Tanaka, H.Ikeda, T.Tatsuoka, A.Ishida, S.Battacharya, D.K.Aswal, S.Moorthy Babu, Y.Inatomi, Y.Hayakawa
  • Organizer: 第72回応用物理学会学術演会
  • Place of Presentation: 山形大学(山形)
• [Presentation] Construction of Seebeck-Coefficient Measurement Technique by KFM (2011)
  • Author(s): Kazutoshi, Miwa, Faiz Salleh, Hiroya Ikeda
  • Organizer: 電子材料シンポジウム(EMS30)
  • Place of Presentation: 守山市
• [Presentation] Seebeck Coefficient of SOI with Bias-Controlled Fermi Energy (2011)
  • Author(s): Faiz Salleh, Kazutoshi, Miwa, Hiroya Ikeda
  • Organizer: 電子材料シンポジウム(EMS30)
  • Place of Presentation: 守山市
• [Presentation] A novel refrigerator device using single-electron pump fabricated from semiconductor materials (2011)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Organizer: 2011 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semicondutor Devices
  • Place of Presentation: Daejeon, Korea
• [Presentation] 単電子ポンプ動作を利用した冷却デバイスの開発 (2011)
  • Author(s): 池田浩也, ファイズ・サレ
  • Organizer: 第58回応用物理学関係連合講演会
  • Place of Presentation: 神奈川工科大学(相模原)
• [Presentation] 外部電圧印加によるシリコンゼーベック係数の変化 (2011)
  • Author(s): ファィズ・サレ, 三輪一聡, 池田浩也
  • Organizer: 第58回応用物理学関係連合講演会
  • Place of Presentation: 神奈川工科大学(相模原)
• [Presentation] Thermoelectric properties of compositionally homogeneous Sil-xGex bulk crystals (2011)
  • Author(s): M.Ativanandhan, Y.Saito, I.Koyama, Y.Momose, A.Tanaka, H.Ikeda, T.Tatsuoka, A.Ishida, D.K.Aswal, S.Moorthy Babu, Y.Inatomi, Y.Hayakawa
  • Organizer: 第58回応用物理学関係連合講演会
  • Place of Presentation: 神奈川工科大学(相模原)
• [Presentation] Pドープ極薄Siにおけるゼーベック係数の理論的評価 (2011)
  • Author(s): ファィズ・サレ, 池田浩也
  • Organizer: 電子情報通信学会ED・SDM合同研究会
  • Place of Presentation: 北海道大学(札幌)
• [Presentation] 単電子ポンプ動作を利用した半導体冷却デバイスの研究 (2011)
  • Author(s): 池田浩也, ファイズ・サレ
  • Organizer: 電子情報通信学会ED・SDM合同研究会
  • Place of Presentation: 北海道大学(札幌)
• [Presentation] KFMを利用したゼーベック係数測定技術の開発 (2010)
  • Author(s): 三輪一聡, ファイズ・サレ, 池田浩也
  • Organizer: 表面科学会中部支部学術講演会
  • Place of Presentation: 名古屋工業大学(名古屋)
  • Year and Date: 2010-12-18
• [Presentation] KFMを用いたゼーベック係数測定技術の確立 (2010)
  • Author(s): 三輪一聡, ファイズ・サレ, 池田浩也
  • Organizer: 応用物理学会東海支部基礎セミナー
  • Place of Presentation: 静岡大学(浜松)
  • Year and Date: 2010-10-20
• [Presentation] シリコンの熱電変換特性に与える不純物原子の影響 (2010)
  • Author(s): ファイズ・サレ, 池田浩也
  • Organizer: 応用物理学会東海支部基礎セミナー
  • Place of Presentation: 静岡大学(浜松)
  • Year and Date: 2010-10-20
• [Presentation] Influence of impurity band on Seebeck coefficient in heavily-doped Si (2010)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Organizer: 9th Int. Conf. on Global Research and Education
  • Place of Presentation: Riga, Latvia
• [Presentation] A novel refrigerator device using single electron pump applicable to SOI wafers (2010)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Organizer: 9th Int. Conf. on Global Research and Education
  • Place of Presentation: Riga, Latvia
• [Presentation] Influence of heavy doping on Seebeck coefficient in silicon-on-insulator (2010)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Organizer: 29th Int. Conf. on Thermoelectrics
  • Place of Presentation: Shanghai, China
• [Presentation] Seebeck coefficient measurement using a Kelvin-probe force microscopy technique (2010)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Place of Presentation: San Fransisco, USA
• [Presentation] A theoretical study on a novel single-electron refrigerator applicable to semiconductor materials (2010)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Organizer: 2011 International Microprocesses and Nanotechnology Conference
  • Place of Presentation: リーガロイヤルホテル小倉(北九州)
• [Presentation] Thermoelectric properties of P-doped ultrathin SOI layers (2010)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Organizer: Korean-Japanese Student Workshop
  • Place of Presentation: 釜山大学(Pusan, Korea)
• [Presentation] 高濃度ドープSiにおけるゼーベック係数の理論的評価 (2010)
  • Author(s): ファイズ・サレ, 池田浩也
  • Organizer: 第71回応用物理学会学術講演会
  • Place of Presentation: 長崎大学(長崎)
• [Presentation] Influence of impurity band on Seebeck coefficient in heavily-doped Si (2010)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Organizer: 9th International Conference on Global Research and Education (InterAcademia 2010)
  • Place of Presentation: リガ工科大学(Riga, Latvia)
• [Presentation] A novel refrigerator device using single-electron pump applicable to SOI wafers (2010)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Organizer: 9th International Conference on Global Research and Education (InterAcademia 2010)
  • Place of Presentation: リガ工科大学(Riga, Latvia)
• [Presentation] Growth of Sil-xGex bulk crystals with highly homogeneous composition for ther moelectric annlications (2010)
  • Author(s): M.Anvanandhan, Y.Saito, T.Koyama, Y.Momose, H.Ikeda, A.Tanaka, H.Tatsuoka, D.K.Aswal. Y.Inatomi, Y.Havakawa
  • Organizer: The Sixteenth International Conference on Crystal Growth in Conjunction with The Fourteenth International Conference on Vapor Growth and Epitaxy
  • Place of Presentation: 北京国際コンベンションセンター(Beijing, China)
• [Presentation] Growth of homogeneous Mg2Sil-xGex crystals for thermoelectric application (2010)
  • Author(s): Y.Hayakawa M.Anvanandhan, Y.Saito, T.Koyama, Y.Momose, H.Ikeda, A.Tanaka, C.Wen, Y.Kubota, T.Nakamura, D.K.Aswal, Y.Inatomi, H.Tatsuoka
  • Organizer: Asia-Pacific Conference on Semiconducting Suicides and Related Materials Science and Technology Towards Sustainable Optoelectronics 2010
  • Place of Presentation: エポカルつくば(Tsukuba)
• [Presentation] Seebeck coefficient of P-doped ultrathin SOI layers (2010)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Organizer: 29th Electronic Materials Symposium
  • Place of Presentation: ラフォーレ修善寺(伊豆)
• [Presentation] Influence of heavy doping on Seebeck coefficient in silicon-on-insulator (2010)
  • Author(s): Faiz Salleh, Hiroya Ikeda
  • Organizer: International Conference on Thermoelectrics 2010
  • Place of Presentation: ルネッサンス上海中山公園ホテル(shanghai, China)
• [Presentation] シリコンを用いた単電子冷却デバイスの研究 (2010)
  • Author(s): 池田浩也, プアイズ・サレ
  • Organizer: 電子情報通信学会ED・CPM・SDM合同研究会
  • Place of Presentation: 静岡大学(浜松)
• [Presentation] Seebeck coefficient measurement using a Kelvin-probe force microscopy technique (2010)
  • Author(s): Hiroya Ikeda, Faiz Salleh
  • Organizer: MRS Spring Meeting, Syposium DD : Thermoelectic Materials-Growth, Properties, Novel Characterization Methods, and Applications
  • Place of Presentation: モスコンウェストコンベンションセンター(SanFransisco, USA)
• [Presentation] SOI基板のゼーベック係数に与える高濃度ドーピング効果 (2010)
  • Author(s): 池田浩也, ファイズ・サレ
  • Organizer: 第57回応用物理学関係連合講演会
  • Place of Presentation: 平塚
• [Presentation] 高不純物濃度SOI基板のゼーベック係数 (2010)
  • Author(s): 池田浩也, ファイズ・サレ
  • Organizer: 電子情報通信学会ED・SDM合同研究会
  • Place of Presentation: 那覇
• [Presentation] KFMによるナノ構造熱電変換材料のゼーベック係数測定 (2009)
  • Author(s): ファイズ・サレ, 浅井清涼, 池田浩也
  • Organizer: 表面科学会中部支部学術講演会
  • Place of Presentation: 名古屋
  • Year and Date: 2009-12-19
• [Presentation] Impurity-concentration dependence of Seebeck coefficient in silicon-on-insulator layers (2009)
  • Author(s): Faiz Salleh, Kiyosumi Asai, Akihiro Ishida, Hiroya Ikeda
  • Organizer: 8th Int. Conf. on Global Research and Education
  • Place of Presentation: Kazimierz Dolny & Warsaw, Poland
• [Presentation] Seebeck coefficient measurement using a Kelvin-probe force microscope technique (2009)
  • Author(s): Hiroya Ikeda, Faiz Salleh, Kiyosumi Asai
  • Organizer: 8th Int. Conf. on Global Research and Education
  • Place of Presentation: Kazimierz Dolny & Warsaw, Poland
• [Presentation] Seebeck coefficient of ultra thin SOI films (2009)
  • Author(s): Hiroya Ikeda, Faiz Salleh, Kiyosumi Asai
  • Organizer: 28th Int. Conf. and 7th Europ. Conf. on Thermoelectrics
  • Place of Presentation: Freibrug, Germany
• [Presentation] Impurity-concentration dependence of Seebeck coefficient in silicon-on-insulator layers (2009)
  • Author(s): F.Salleh, K.Asai, A.Ishida, H.Ikeda
  • Organizer: 8th International Conference on Global Research and Education
  • Place of Presentation: Kazimierz Dolny & Warsaw, Poland
• [Presentation] Seebeck coefficient measurement using a Kelvin-probe force microscope technique (2009)
  • Author(s): H.Ikeda, F.Salleh, K.Asai
  • Organizer: 8th International Conference on Global Research and Education
  • Place of Presentation: Kazimierz Dolny & Warsaw, Poland
• [Presentation] バルク半導体及び超格子のゼーベック係数計算法 (2009)
  • Author(s): 石田明広, 井上翼, 池田浩也, 木太拓志
  • Organizer: 第70回応用物理学会学術講演会
  • Place of Presentation: 富山
• [Presentation] 高濃度ドープシリコンのゼーベック係数 (2009)
  • Author(s): ファイズ・サレ, 浅井清涼, 池田浩也
  • Organizer: 第70回応用物理学会学術講演会
  • Place of Presentation: 富山
• [Presentation] Seebeck coefficient of ultrathin SOI films (2009)
  • Author(s): H.Ikeda, F.Salleh, K.Asai
  • Organizer: International Conference on Thermoelectrics 2009 European Conference on Thermoelectrics 2009
  • Place of Presentation: Freibrug, Germany
• [Remarks]
  • URL: http://serversman.net/ikedalab/
• [Remarks]
  • URL: http://serversman.net/ikedalab/
• [Remarks]
  • URL: http://serversman.net/ikedalab/
• [Remarks]
  • URL: http://serversman.net/ikedalab/