| Project/Area Number |
21500415
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Biomedical engineering/Biological material science
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| Research Institution | Toyo University |
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Principal Investigator |
花尻 達郎 (2011) 東洋大学, 理工学部, 教授 (30266944)
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| Co-Investigator(Kenkyū-buntansha) |
YOSHIMORO Tomomi 東洋大学, 理工学部, 教授 (60230819)
MIZUKI Toru 東洋大学, 理工学部, 助教 (80408997)
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| Co-Investigator(Renkei-kenkyūsha) |
KASHIWAGI Kunihiro 東洋大学, 工学部, 名誉教授 (30058094)
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| Project Period (FY) |
2009 – 2011
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| Project Status |
Completed (Fiscal Year 2011)
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| Budget Amount *help |
¥3,380,000 (Direct Cost: ¥2,600,000、Indirect Cost: ¥780,000)
Fiscal Year 2011: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2010: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2009: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
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| Keywords | 生体・情報計測 / オンチップセルソーター / SOI / SOQ / ゼータ電位 / コールター法 / 電気泳動 / 電気浸透流 / 赤血球 / 抗原抗体反応 / スモルコフスキー / レーザードップラー法 / 電気侵透流 / 羊赤血球 / 抗原抗体 |
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| Research Abstract |
By combining the electrophoresis method and the conventional Coulter method, we previously proposed the Electrophoretic Coulter Method(ECM)- a technique that enables simultaneous analysis of the size and ζvalues of individual specimens. In this study, we validate ECM in ζmeasurement of biological cells by a conventional Dynamic Light Scattering(DLS) to apply ECM to the field of clinical medicine. We use sheep's red blood cells(RBCs) as biological cells. The ζof RBC is varied by adsorption of Immunogloblin G(IgG) to RBC. We are able to obtain the difference between ζs of RBCs and those of RBCs-IgG by using ECM. In addition, we demonstrate thatζs obtained using ECM show a good agreement with those obtained by the conventional DLS and our ECM can distinguish biological cells using the difference ofζs. Furthermore, we propose that SOI(Silicon On Insulator) wafers or SOQ(Silicon On Quartz) wafers should be utilized as platforms for integration of ECM systems combined with electric detectors or optical detectors and sorting systems, and we characterize fundamental characteristics of SOI wafers and SOQ wafers in detail.
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