Study on crystal grains of GaN which has microstructures in mesoscopic scale.
| Project/Area Number |
21560013
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Applied materials science/Crystal engineering
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| Research Institution | Nagoya University |
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Principal Investigator |
AKIMOTO Koichi 名古屋大学, 工学研究科, 准教授 (40262852)
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| Project Period (FY) |
2009 – 2011
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| Project Status |
Completed (Fiscal Year 2011)
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| Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2011: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2010: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2009: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
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| Keywords | 化合物半導体 / X線回折 / 結晶工学 / 窒化ガリウム / メゾスコピック / GaN |
|---|
| Research Abstract |
By X-ray topography using CCD camera,ΔθandΔd successfully measured separately inμm order GaN which has microstructures in mesoscopic scale. By employing Darwin's dynamical X-ray diffraction theory, quantitative evaluation of strain at surfaces and interfaces becomes possible. Method of quantitative strain analysis on the GaN surface was established.
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Report
(4 results)
Research Products
(21 results)
