| Budget Amount *help |
¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000)
Fiscal Year 2011: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2010: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2009: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
|
|---|
| Research Abstract |
Scan test has been widely adopted as a default testing technique among most LSI designs, including crypto cores. However, these scan chains might be used as a "side channel" to recover the secret keys from the hardware implementations of cryptographic algorithms. In this research, we propose SD-SFF(State Dependent Scan Flip Flop) which significantly improves the security with ignorable design requirements for crypto hardware implementations.
|
