Single molecular imaging and recognition in liquid by combining infrared spectroscopy and atomic force microscopy

• Project/Area Number: 21681018
• Research Category: Grant-in-Aid for Young Scientists (A)
• Allocation Type: Single-year Grants
• Research Field: Nanomaterials/Nanobioscience
• Research Institution: Kanazawa University
• Principal Investigator: FUKUMA Takeshi 金沢大学, フロンティアサイエンス機構, 特任准教授 (90452094)
• Project Period (FY): 2009 – 2011
• Project Status: Completed (Fiscal Year 2011)
• Budget Amount: ¥25,870,000 (Direct Cost: ¥19,900,000、Indirect Cost: ¥5,970,000); Fiscal Year 2011: ¥3,640,000 (Direct Cost: ¥2,800,000、Indirect Cost: ¥840,000); Fiscal Year 2010: ¥9,360,000 (Direct Cost: ¥7,200,000、Indirect Cost: ¥2,160,000); Fiscal Year 2009: ¥12,870,000 (Direct Cost: ¥9,900,000、Indirect Cost: ¥2,970,000)
• Keywords: 1分子イメージング / ナノ計測 / 原子間力顕微鏡 / 赤外分光法 / 生体分子 / 分子識別・同定 / 1分子計測 / 赤外分光

Research Abstract

We have developed frequency modulation atomic force microscope(FM-AFM) with a capability of irradiating a focused mid-infrared light from the bottom of the sample using a flat-type scanner with a hollow at the center. We have also achieved a significant improvement in the FM-AFM force sensitivity using a small cantilever to detect a subtle change in the surface property caused by the irradiation of an infrared light. We have demonstrated the molecular recognition capability of the developed microscope by imaging a phase-separated polystyrene-PMMA block copolymer thin film.

Research Products

• [Journal Article] Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies (2012)
  • Author(s): Takeshi Fukuma
  • Journal Title: Nanotechnology Volume: 23 Issue: 13 Pages: 135706-135706
  • DOI: 10.1088/0957-4484/23/13/135706
  • Peer Reviewed
• [Presentation] 液中周波数変調AFMの性能改善と多機能化 (2012)
  • Author(s): 福間剛士
  • Organizer: 日本顕微鏡学会第68回学術講演会
  • Place of Presentation: つくば国際会議場(茨城県)
  • Year and Date: 2012-05-16
• [Presentation] 液中周波数変調AFMの開発と固液界面計測への応用 (2012)
  • Author(s): 福間剛士
  • Organizer: 第5回SFG研究会
  • Place of Presentation: 東北大学(宮城県)
  • Year and Date: 2012-03-11
• [Presentation] 液中周波数変調AFMの開発と固液界面計測への応用 (2012)
  • Author(s): 福間剛士
  • Organizer: 第5回SFG研究会
  • Place of Presentation: 東北大学(宮城)(招待講演)
  • Year and Date: 2012-03-11
• [Presentation] Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers (2011)
  • Author(s): Onishi, K., Asakawa, H., Fukuma, T.
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: 洞爺湖万世閣(北海道)
  • Year and Date: 2011-12-19
• [Presentation] Improvement in the Usability of Sample and Cantilever Holding Mechanisms for Separate-type High-Speed AFM Scanner (2011)
  • Author(s): Miyata, K., Furuya, S., Asakawa, H., Fukuma, T.
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: 洞爺湖万世閣(北海道)
  • Year and Date: 2011-12-19
• [Presentation] Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers (2011)
  • Author(s): Onishi. K
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: 洞爺湖万世閣(北海道)
  • Year and Date: 2011-12-19
• [Presentation] Improvement in the usability of sample and cantilever holding mechanisms for separate-type high-speed AFM scanner (2011)
  • Author(s): Miyata. K
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: 洞爺湖万世閣(北海道)
  • Year and Date: 2011-12-19
• [Presentation] 周波数変調原子間力顕微鏡の固液界面計測への応用 (2011)
  • Author(s): 福間剛士
  • Organizer: 第一回走査プローブ顕微鏡シミュレータの開発セミナー
  • Place of Presentation: 国立オリンピック記念青少年総合センター(東京都)
  • Year and Date: 2011-03-08
• [Presentation] 周波数変調原子間力顕微鏡の固液界面計測への応用 (2011)
  • Author(s): 福間剛士
  • Organizer: 第一回走査プローブ顕微鏡シミュレータの開発セミナー
  • Place of Presentation: 国立オリンピック記念青少年総合センター(東京)(招待講演)
  • Year and Date: 2011-03-08
• [Presentation] 周波数変調AFMによる固液界面計測技術の発展と将来展望 (2010)
  • Author(s): 福間剛士
  • Organizer: 日本顕微鏡学会シンポジウム
  • Place of Presentation: 金沢市文化ホール(石川県)
  • Year and Date: 2010-11-12
• [Presentation] 周波数変調AFMによる固液界面計測技術の発展と将来展望 (2010)
  • Author(s): 福間剛士
  • Organizer: 日本顕微鏡学会シンポジウム
  • Place of Presentation: 金沢市文化ホール(金沢)(招待講演)
  • Year and Date: 2010-11-12
• [Presentation] 原子間力顕微鏡を用いた固液界面の原子分解能イメージング (2010)
  • Author(s): 福間剛士
  • Organizer: 分子研研究会「グリーンイノベーションのための表面・界面化学」
  • Place of Presentation: 分子科学研究所(愛知県)
  • Year and Date: 2010-10-06
• [Presentation] 原子間力顕微鏡を用いた固液界面の原子分解能イメージング (2010)
  • Author(s): 福間剛士
  • Organizer: 分子研研究会「グリーンイノベーションのための表面・界面化学」
  • Place of Presentation: 分子科学研究所(岡崎)(招待講演)
  • Year and Date: 2010-10-06
• [Presentation] 液中周波数変調AFMによる生体試料の分子スケール観察 (2010)
  • Author(s): 福間剛士
  • Organizer: 第57回応用物理学関係連合講演会
  • Place of Presentation: 東海大学(平塚市)
  • Year and Date: 2010-03-19
• [Remarks]
  • URL: http://fukuma.w3.kanazawa-u.ac.jp
• [Remarks]
  • URL: http://fukuma.w3.kanazawa-u.ac.jp
• [Remarks]
  • URL: http://fukuma.w3.kanazawa-u.ac.jp
• [Remarks]
  • URL: http://fukuma.w3.kanazawa-u.ac.jp