Identification of the origin of nanoscale image contrast in contact potential difference maps given by a Kelvin probe force microscope
| Project/Area Number |
21686004
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| Research Category |
Grant-in-Aid for Young Scientists (A)
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| Allocation Type | Single-year Grants |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Japan Advanced Institute of Science and Technology |
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Principal Investigator |
SASAHARA Akira 北陸先端科学技術大学院大学, マテリアルサイエンス研究科, 助教 (40321905)
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| Project Period (FY) |
2009 – 2011
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| Project Status |
Completed (Fiscal Year 2011)
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| Budget Amount *help |
¥26,780,000 (Direct Cost: ¥20,600,000、Indirect Cost: ¥6,180,000)
Fiscal Year 2011: ¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2010: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2009: ¥19,110,000 (Direct Cost: ¥14,700,000、Indirect Cost: ¥4,410,000)
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| Keywords | 走査プローブ顕微鏡 / ケルビン力顕微鏡 / 表面電位 / 接触電位差 / 非接触型原子間力顕微鏡 / 仕事関数 / 二酸化チタン / 単分子膜 / ケルビンカ顕微鏡 |
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| Research Abstract |
Mixed monolayers of acetate and trifluoroacetate anions were examined by a Kelvin probe force microscope(KPFM). Obtained contact potential difference(CPD) maps showed the CPD change on the molecules. Such nanometer scale contrast in the CPD map was independent of the perturbation of cantilever oscillation frequency, cantilever oscillation amplitude, and tunneling current flowing between the tip and sample. The results proved that the nanometer scale CPD contrast by the KPFM shows true surface potential. It was found that the control of the cantilever oscillation amplitude and the investigation of tip-induced charges on the sample surface are necessary for further precise CPD analysis.
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Report
(4 results)
Research Products
(26 results)
