Study on Secondary Electron Emission from Insulator and Construction of Database of Secondary Electron Yield
| Project/Area Number |
21686005
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| Research Category |
Grant-in-Aid for Young Scientists (A)
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| Allocation Type | Single-year Grants |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Osaka University |
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Principal Investigator |
NAGATOMI Takaharu Osaka University, 工学研究科, 助教 (90314369)
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| Project Period (FY) |
2009 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
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| Budget Amount *help |
¥10,140,000 (Direct Cost: ¥7,800,000、Indirect Cost: ¥2,340,000)
Fiscal Year 2010: ¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2009: ¥5,980,000 (Direct Cost: ¥4,600,000、Indirect Cost: ¥1,380,000)
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| Keywords | 二次電子 / 絶縁物 / エキソ電子 |
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| Research Abstract |
We have been developing the exoelectron detection system, and we have succeeded to develop and improve the accuracy of the measurement of the secondary electron yield from insulators by developing and modifying the pulsed-ion beam irradiation system. In addition, we developed the experimental system to measure the variations in the secondary electron yield of practical materials, which are induced by the gas absorption on the sample surface and/or heating the sample. We succeeded to develop the system to quantitatively measure the change in the secondary electron yield of practical materials. Furthermore, we established the working group for the construction of the database of the secondary electron yield in the 141st committee on Microbeam Analysis of Japan Society for the Promotion of Science, and started activities relating to the database construction with the committee members belonging to industrial companies.
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Report
(3 results)
Research Products
(74 results)
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[Journal Article] Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels2011
Author(s)
K.Yoshino, Y.Morita, T.Nagatomi, M.Terauchi, T.Tsujita, T.Nakayama, Y.Yamauchi, M.Nishitani, M.Kitagawa, Y.Yamauchi, Y.Takai
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Journal Title
Journal of Surface Analysis
Volume: (掲載確定)
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Peer Reviewed
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[Presentation] Determination of IMFP, SEP and DSEP by absolute REELS analysis2010
Author(s)
T.Nagatomi
Organizer
Hungarian-Japanese Joint Working Seminar on Studies of Fundamental Parameter Database and Atomic Processes for High Precision Quantitative Analysis using X-Ray Photoelectron Spectroscopy (in the frame of the bilateral MTA-JSPS scientific research cooperation project)
Place of Presentation
MTA ATOMKI, Debrecen (Hungary)(招待講演)
Year and Date
2010-10-27
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[Presentation] Band Alignment and Defect States in Amorphous Si-N Compounds on Si Substrates2010
Author(s)
S.Heo, J.G.Chung, H.I.Lee, J.C.Lee, G.S.Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
Organizer
5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
Place of Presentation
Gyeongju, Korea.
Related Report
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[Presentation] Surface Defect States of MgO Films2010
Author(s)
S.Heo, J.G.Chung, H.I.Lee, J.C.Lee, G.S. Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
Organizer
5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
Place of Presentation
Gyeongju, Korea.
Related Report
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[Presentation] Surface Defect States of MgO Films2010
Author(s)
S.Heo, J.G Chung, H.I.Lee, J.C.Lee, G.S.Park, D.Tahir, S.K.Oh, H.J.Kang, T.Nagatomi, Y.Takai
Organizer
5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10)
Place of Presentation
Hyundae Hotel in Gyeongju (Korea)
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