| Budget Amount *help |
¥10,140,000 (Direct Cost: ¥7,800,000、Indirect Cost: ¥2,340,000)
Fiscal Year 2010: ¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2009: ¥5,980,000 (Direct Cost: ¥4,600,000、Indirect Cost: ¥1,380,000)
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| Research Abstract |
We have been developing the exoelectron detection system, and we have succeeded to develop and improve the accuracy of the measurement of the secondary electron yield from insulators by developing and modifying the pulsed-ion beam irradiation system. In addition, we developed the experimental system to measure the variations in the secondary electron yield of practical materials, which are induced by the gas absorption on the sample surface and/or heating the sample. We succeeded to develop the system to quantitatively measure the change in the secondary electron yield of practical materials. Furthermore, we established the working group for the construction of the database of the secondary electron yield in the 141st committee on Microbeam Analysis of Japan Society for the Promotion of Science, and started activities relating to the database construction with the committee members belonging to industrial companies.
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