Establishment of element-specific coherent X-ray diffraction microscopy and 4D nano-meso structural analysis of metallic materials

• Project/Area Number: 21686060
• Research Category: Grant-in-Aid for Young Scientists (A)
• Allocation Type: Single-year Grants
• Research Field: Physical properties of metals
• Research Institution: Osaka University
• Principal Investigator: TAKAHASHI Yukio 大阪大学, 大学院・工学研究科, 准教授 (00415217)
• Project Period (FY): 2009 – 2011
• Project Status: Completed (Fiscal Year 2011)
• Budget Amount: ¥25,610,000 (Direct Cost: ¥19,700,000、Indirect Cost: ¥5,910,000); Fiscal Year 2011: ¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000); Fiscal Year 2010: ¥10,140,000 (Direct Cost: ¥7,800,000、Indirect Cost: ¥2,340,000); Fiscal Year 2009: ¥11,310,000 (Direct Cost: ¥8,700,000、Indirect Cost: ¥2,610,000)
• Keywords: コヒーレントX線光学 / X線顕微鏡 / 金属ナノ組織解析 / X線構造解析

Research Abstract

Element-specific high-resolution coherent X-ray diffraction microscopy with energy-tunable X-ray focusing mirrors has been developed at SPring-8 that is the third-generation synchrotron radiation facility and has been applied to nano-meso structural analysis of functional metallic nanoparticles. 2 nm resolution, which is the world record of the spatial resolution of X-ray microscopy, has been achieved at the measurements of a Ag nanocube particle. Three-dimensional electron density mapping of a Au/ Ag nanobox particle has been visualized. In addition, large-field-of-view imaging has been also realized by extending to a scanning scheme.

Research Products

• [Journal Article] Multiscale element mapping of buried structures by ptychographic x-ray diffraction microscopy using anomalous scattering (2011)
  • Author(s): Y. Takahashi, A. Suzuki, N. Zettsu, Y. Kohmura, K. Yamauchi and T. Ishikawa
  • Journal Title: Appl. Phys. Lett. Volume: 99 Pages: 131905-131905
  • Peer Reviewed
• [Journal Article] Towards High-Resolution Ptychographic X-ray Diffraction Microscopy (2011)
  • Author(s): Y. Takahashi, A. Suzuki, N. Zettsu, Y. Kohmura, Y. Senba, H. Ohashi, K. Yamauchi and T. Ishikawa
  • Journal Title: Phys. Rev. B Volume: 83 Pages: 214109-214109
  • Peer Reviewed
• [Journal Article] Coherent diffraction microscopy at SPring-8 : instrumentation, data acquisition and data analysis (2011)
  • Author(s): R.Xu, S.Salha, K.Raines, H.Jiang, C-.C.Chen, Y.Takahashi, Y.Kohmura, Y.Nishino, C.Song, T.Ishikawa, J.Miao
  • Journal Title: Journal of Synchrotron Radiation Volume: 18 Issue: 2 Pages: 293-298
  • DOI: 10.1107/s0909049510051733
  • Peer Reviewed
• [Journal Article] Element-specific High-resolution Diffraction Microscopy using Focused Hard X-ray Beam (2011)
  • Author(s): Y.Takahashi, Y.Nishino, R.Tsutsumi, H.Kubo, N.Zettsu, K.Yamauchi, T.Ishikawa, E.Matsubara
  • Journal Title: Diamond Light Source Proceedings(SRMS-7 2011) Volume: 1 Issue: SRMS-7
  • DOI: 10.1017/s2044820111000013
  • Peer Reviewed
• [Journal Article] Development of Coherent X-ray Diffraction Apparatus with Kirkpatrick-Baez Mirror Optics (2011)
  • Author(s): Y.Takahashi, R.Tsutsumi, H.Kubo, Y.Nishino, H.Mimura, S.Matsuyama, T.Ishikawa, K.Yamauchi
  • Journal Title: AIP Conference Proceedings (The 10th International Conference on x-ray microscopy) Volume: 1635 Pages: 231-234
  • DOI: 10.1063/1.3625346
  • Peer Reviewed
• [Journal Article] Towards High-Resolution Ptychographic X-ray Diffraction Microscopy (2011)
  • Author(s): Y.Takahashi, A.Suzuki, N.Zettsu, Y.Kohmura, Y.Senba, H.Ohashi, K.Yamauchi, T.Ishikawa
  • Journal Title: Physical Review B Volume: 83 Issue: 21 Pages: 214109-214109
  • DOI: 10.1103/physrevb.83.214109
  • Peer Reviewed
• [Journal Article] Multiscale element mapping of buried structures by ptychographic x-ray diffraction microscopy using anomalous scattering (2011)
  • Author(s): Y.Takahashi, A.Suzuki, N.Zettsu, Y.Kohmura, K.Yamauchi, T.Ishikawa
  • Journal Title: Applied Physics Letters Volume: 99 Issue: 13 Pages: 131905-131905
  • DOI: 10.1063/1.3644396
  • Peer Reviewed
• [Journal Article] High-Resolution Projection Image Reconstruction of Thick Objects by Hard X-ray Diffraction Microscopy (2010)
  • Author(s): Y. Takahashi, Y. Nishino, R. Tsutsumi, N. Zettsu, E. Matsubara, K. Yamauchi and T. Ishikawa
  • Journal Title: Phys. Rev. B Volume: 82 Pages: 214102-214102
  • Peer Reviewed
• [Journal Article] Three-dimensional electron density mapping of shape-controlled nanoparticle by focused hard x-ray diffraction microscopy (2010)
  • Author(s): Y. Takahashi, N. Zettsu, Y. Nishino, R. Tsutsumi, E. Matsubara, T. Ishikawa and K. Yamauchi
  • Journal Title: Nano Lett. Volume: 10 Pages: 1922-1926
  • Peer Reviewed
• [Journal Article] Two-dimensional measurement of focused x-ray beam profile using coherent x-ray diffraction of isolated nanoparticle (2010)
  • Author(s): Y. Takahashi, H. Kubo, R. Tsutsumi, S. Sakaki, N. Zettsu, Y. Nishino, T. Ishikawa and K. Yamauchi
  • Journal Title: Nuclear Instruments and Methods in Physics Research Section A : Accelerators, Spectrometers, Detectors and Associated Equipment Volume: 616 Pages: 266-269
  • Peer Reviewed
• [Journal Article] An experimental procedure for precise evaluation of electron density distribution of a nanostructured material by coherent x-ray diffraction microscopy (2010)
  • Author(s): Y. Takahashi, H. Kubo, Y. Nishino, H. Furukawa, R. Tsutsumi, K. Yamauchi, T. Ishikawa and E. Matsubara
  • Journal Title: Rev. Sci. Instrum. Volume: 81 Pages: 3707-3707
  • Peer Reviewed
• [Journal Article] Three-dimensional electron density mapping of shape-controlled nanoparticle by focused hard x-ray diffraction microscopy (2010)
  • Author(s): Y.Takahashi, N.Zettsu, Y.Nishino, R.Tsutsumi, E.Matsubara, T.Ishikawa, K.Yamauchi
  • Journal Title: Nano Letters Volume: 10 Pages: 1922-1926
  • Peer Reviewed
• [Journal Article] High-Resolution Projection Image Reconstruction of Thick Objects by Hard X-ray Diffraction Microscopy (2010)
  • Author(s): Y.Takahashi, Y.Nishino, R.Tsutsumi, N.Zettsu, E.Matsubara, K.Yamauchi, T.Ishikawa
  • Journal Title: Physical Review B Volume: 82 Pages: 214102-214102
  • Peer Reviewed
• [Journal Article] An experimental procedure for precise evaluation of electron density distribution of a nanostructured material by coherent x-ray diffraction microscopy (2010)
  • Author(s): Y.Takahashi, H.Kubo, Y.Nishino, H.Furukawa, R.Tsutsumi, K.Yamauchi, T.Ishikawa, E.Matsubara
  • Journal Title: Review of Scientific Instruments Volume: 81 Pages: 33707-33707
  • Peer Reviewed
• [Journal Article] Two-dimensional measurement of focused x-ray beam profile using coherent x-ray diffraction of isolated nanoparticle (2010)
  • Author(s): Y.Takahashi, H.Kubo, R.Tsutsumi, S.Sakaki, N.Zettsu, Y.Nishino, T.Ishikawa, K.Yamauchi
  • Journal Title: Nuclear Instruments and Methods in Physics Researth Section A : Accelerators, Spectrometers, Detectors and Associated Equipment (印刷中)
  • Peer Reviewed
• [Journal Article] An experimental procedure for precise evaluation of electron density distribution of a nanostructured material by coherent x-ray diffraction microscopy (2010)
  • Author(s): Y.Takahashi, H.Kubo, Y.Nishino, H.Furukawa, R.Tsutsumi, K.Yamauchi, T.Ishikawa, E.Matsubara
  • Journal Title: Review of Scientific Instruments (印刷中)
  • Peer Reviewed
• [Journal Article] High-Resolution Diffraction Microscopy Using the Plane-Wave Field of a Nearly Diffraction-Limited Focusing X ray (2009)
  • Author(s): Y. Takahashi, Y. Nishino, R. Tsutsumi, H. Kubo, H. Furukawa, H. Mimura, S. Matsuyama, N. Zettsu, E. Matsubara, T. Ishikawa and K. Yamauchi
  • Journal Title: Phys. Rev. B Volume: 80 Pages: 54103-54103
  • Peer Reviewed
• [Journal Article] Observation of electromigration voids in a Cu thin line by in situ coherent x-ray diffraction microscopy (2009)
  • Author(s): Y. Takahashi, Y. Nishino, H. Furukawa, H. Kubo, K. Yamauchi, T. Ishikawa and E. Matsubara
  • Journal Title: J. Appl. Phys. Volume: 105 Pages: 124911-124911
  • Peer Reviewed
• [Journal Article] Feasibility study of high-resolution coherent diffraction microscopy using synchrotron x rays focused by Kirkpatrick-Baez mirrors (2009)
  • Author(s): Y. Takahashi, Y. Nishino, H. Mimura, R. Tsutsumi, H. Kubo, T. Ishikawa and K. Yamauchi
  • Journal Title: J. Appl. Phys. Volume: 105 Pages: 83106-83106
  • Peer Reviewed
• [Journal Article] Feasibility study of high-resolution coherent diffraction microscopy using synchrotron x rays focused by Kirkpatrick-Baez mirrors (2009)
  • Author(s): Y.Takahashi, Y.Nishino, H.Mimura, R.Tsutsumi, H.Kubo, T.Ishikawa, K.Yamauchi
  • Journal Title: Journal of Applied Physics 105
  • Peer Reviewed
• [Journal Article] Observation of electromigration voids in a Cu thin line by in situ coherent x-ray diffraction microscopy (2009)
  • Author(s): Y.Takahashi, Y.Nishino, H.Furukawa, H.Kubo, K.Yamauchi, T.Ishikawa, E.Matsubara
  • Journal Title: Journal of Applied Physics 105
  • Peer Reviewed
• [Journal Article] High-Resolution Diffraction Microscopy Using the Plane-Wave Field of a Nearly Diffraction-Limited Focusing X ray (2009)
  • Author(s): Y.Takahashi, Y.Nishino, R.Tsutsumi, H.Kubo, H.Furukawa, H.Mimura, S.Matsuyama, N.Zettsu, E.Matsubara, T.Ishikawa, K.Yamauchi
  • Journal Title: Physical Review B 80
  • Peer Reviewed
• [Journal Article] Development of incident x-ray flux monitor for coherent x-ray diffraction microscopy (2009)
  • Author(s): Y.Takahashi, H.Kubo, H.Furukawa, K.Yamauchi, E.Matsubara, T.Ishikawa, Y.Nishino
  • Journal Title: Journal of Physics : Conference Series 186
  • Peer Reviewed
• [Journal Article] Nanostructure analysis by coherent hard X-ray diffraction (2009)
  • Author(s): Y.Nishino, Y.Takahashi, H.Kubo, H.Furukawa, K.Yamauchi, K.Maeshima, N.Imamoto, R.Hirohata, E.Matsubara, T.Ishikawa
  • Journal Title: Journal of Physics : Conference Series 186
  • Peer Reviewed
• [Presentation] X線集光ビームを利用したコヒーレント回折技術の開発と応用 (2012)
  • Author(s): 高橋幸生
  • Organizer: アモルファス・ナノ材料第147委員会第112回研究会
  • Place of Presentation: 弘済会館
  • Year and Date: 2012-05-27
• [Presentation] コヒーレントX線回折による構造可視化の新手法 (2012)
  • Author(s): 高橋幸生
  • Organizer: 多元物質科学研究所若手交流研究会
  • Place of Presentation: 東北大学多元物質科学研究所
  • Year and Date: 2012-02-24
• [Presentation] コヒーレントX線回折による構造可視化の新手法 (2012)
  • Author(s): 高橋幸生
  • Organizer: 多元物質科学研究所若手交流研究会
  • Place of Presentation: 東北大学多元物質科学研究所(仙台市)(招待講演)
  • Year and Date: 2012-02-24
• [Presentation] What lies beneath : mapping hidden nanostructures (2012)
  • Organizer: RIKEN Research
  • Year and Date: 2012-02-10
• [Presentation] 高分解能X線タイコグラフィーの開発と元素識別イメージング (2012)
  • Author(s): 鈴木明大、高橋幸生、是津信行、香村芳樹、仙波泰得、大橋治彦、山内和人、石川哲也
  • Organizer: 第25回日本放射光学会年会
  • Place of Presentation: 鳥栖中央公民館(鳥栖市)
  • Year and Date: 2012-01-07
• [Presentation] 高分解能コヒーレントX線回折顕微法の現状と将来展望 (2012)
  • Author(s): 高橋幸生
  • Organizer: 日本顕微鏡学会の電顕技術開発若手研究部会ワークショップ「様々なイメージング技術の現況と展望」
  • Place of Presentation: 名古屋ファインセラミックスセンター
  • Year and Date: 2012-01-05
• [Presentation] 高分解能コヒーレントX線回折顕微法の現状と将来展望 (2012)
  • Author(s): 高橋幸生
  • Organizer: 日本顕微鏡学会の電顕技術開発若手研究部会ワークショップ「様々なイメージング技術の現況と展望」
  • Place of Presentation: 名古屋ファインセラミックスセンター(名古屋市)(招待講演)
  • Year and Date: 2012-01-05
• [Presentation] 高分解能走査型コヒーレントX線回折顕微法の開発と金属材料のナノ組織解析への応用 (2011)
  • Author(s): 鈴木明大、高橋幸生、山内和人、是津信行、香村芳樹、石川哲也
  • Organizer: 優秀ポスター賞
  • Place of Presentation: 日本金属学会
  • Year and Date: 2011-11-08
• [Presentation] 高分解能走査型コヒーレントX線回折顕微法の開発と金属材料のナノ組織解析への応用 (2011)
  • Author(s): 鈴木明大、高橋幸生、山内和人、是津信行、香村芳樹、石川哲也
  • Organizer: 日本金属学会秋期大会
  • Place of Presentation: ロワジールホテル那覇(那覇市)
  • Year and Date: 2011-11-08
• [Presentation] 高分解能走査型コヒーレントX線回折顕微法の開発と金属材料のナノ組織解析への応用 (2011)
  • Author(s): 鈴木明大、高橋幸生、山内和人、是津信行、香村芳樹、石川哲也
  • Organizer: 日本金属学会秋期大会
  • Place of Presentation: 沖縄コンベンションセンター
  • Year and Date: 2011-11-07
• [Presentation] Development of High-Resolution Ptychographic X-ray Diffraction Microscopy using Focused Hard X-ray Beam (2011)
  • Author(s): A.Suzuki, Y.Takahashi, N.Zettsu, Y.Kohmura, K.Yamauchi, T.Ishikawa
  • Organizer: International Global COE Symposium on Atomically Controlled Fabrication Technology 2011
  • Place of Presentation: Osaka University Nakanoshima Center, Osaka, Japan
  • Year and Date: 2011-11-01
• [Presentation] Element-Specific Ptychographic X-ray Diffraction Microscopy using Anomalous Scattering (2011)
  • Author(s): Y.Takahashi, A.Suzuki, N.Zettsu, Y.Kohmura, K.Yamauchi, T.Ishikawa
  • Organizer: International Global COE Symposium on Atomically Controlled Fabrication Technology 2011
  • Place of Presentation: Osaka University Nakanoshima Center, Osaka, Japan
  • Year and Date: 2011-11-01
• [Presentation] 物質中の電子密度や特定元素の分布観察大視野・高分解能X線顕微鏡阪大、名大、理研の研究グループ開発 (2011)
  • Organizer: 科学新聞
  • Year and Date: 2011-10-14
• [Presentation] High-resolution coherent diffraction imaging using focused hard x-ray beam at SPring-8 (2011)
  • Author(s): Y. Takahashi, A. Suzuki, Y. Kohmura, Y. Nishino, K. Yamauchi and Tetsuya Ishikawa
  • Organizer: CXS Annual Workshop 2011
  • Place of Presentation: Bio21 Institute Melbourne, Victoria, Australia
  • Year and Date: 2011-10-10
• [Presentation] High-resolution coherent diffraction imaging using focused hard x-ray beam at SPring-8 (2011)
  • Author(s): Y.Takahashi, A.Suzuki, Y.Kohmura, Y.Nishino, K.Yamauchi, T.Ishikawa
  • Organizer: CXC Annual Workshop 2011
  • Place of Presentation: Bio21 Institute, Melbourne, Victoria, Australia(招待講演)
  • Year and Date: 2011-10-10
• [Presentation] 元素識別が可能に大視野、高分解能X線顕微鏡を開発阪大など (2011)
  • Organizer: 化学工業日報
  • Year and Date: 2011-10-03
• [Presentation] 大視野で高空間分解能阪大などがX線顕微鏡 (2011)
  • Organizer: 日刊工業新聞
  • Year and Date: 2011-10-03
• [Presentation] 原子見分ける顕微鏡阪大・理研など開発 (2011)
  • Organizer: 読売新聞
  • Year and Date: 2011-09-29
• [Presentation] Development and application of high-resolution diffraction microscopy using focused hard x-ray beam (2011)
  • Author(s): Y. Takahashi
  • Organizer: The 4th International Workshop on FEL Science
  • Place of Presentation: Peppers Beach Club and Spa, Palm Cove, Cairns, Queensland, Australia
  • Year and Date: 2011-09-01
• [Presentation] Development and application of high-resolution diffraction microscopy using focused hard x-ray beam (2011)
  • Author(s): Y.Takahashi
  • Organizer: The 4th International Workshop on FEL Science
  • Place of Presentation: Cairns, Queensland, Australia(招待講演)
  • Year and Date: 2011-08-31
• [Presentation] Development of high-resolution coherent X-ray diffraction microscopy and its application in materials science (2011)
  • Author(s): Y. Takahashi
  • Organizer: International conference on processing & manufacturing of advanced materials
  • Place of Presentation: Quebec city convention centre, Quebec, Canada
  • Year and Date: 2011-08-03
• [Presentation] Development of high-resolution coherent X-ray diffraction microscopy and its application in materials science (2011)
  • Author(s): Y.Takahashi
  • Organizer: International conference on processing & manufacturing of advanced materials
  • Place of Presentation: Quebec city convention centre, Quebec, Canada(招待講演)
  • Year and Date: 2011-08-03
• [Presentation] X線集光ビームを利用したコヒーレント回折技術の開発と応用 (2011)
  • Author(s): 高橋幸生
  • Organizer: アモルファス・ナノ材料第147委員会第112回研究会
  • Place of Presentation: 弘済会館(東京都)(招待講演)
  • Year and Date: 2011-05-27
• [Presentation] コヒーレントX線散乱イメージング技術の開発と応用の研究 (2011)
  • Author(s): 高橋幸生
  • Organizer: 文部科学大臣表彰若手科学者賞(科学技術部門)
  • Place of Presentation: 文部科学省
  • Year and Date: 2011-04-20
• [Presentation] 高分解能コヒーレントX線回折顕微法による金銀ナノボックス粒子の三次元電子密度マッピング (2011)
  • Author(s): 高橋幸生、是津信行、西野吉則、堤良輔、松原英一郎、石川哲也、山内和人
  • Organizer: 第61回金属組織写真賞奨励賞(顕微鏡関連部門)
  • Place of Presentation: 日本金属学会
  • Year and Date: 2011-03-25
• [Presentation] KBミラー集光X線を用いた高分解能走査型回折顕微法の開発 (2011)
  • Author(s): 鈴木明大、高橋幸生、堤良輔、西野吉則、松原英一郎、山内和人、石川哲也
  • Organizer: 第24回日本放射光学会年会
  • Place of Presentation: エポカルつくば(筑波市)
  • Year and Date: 2011-01-09
• [Presentation] 高分解能コヒーレントX線回折顕微法による金銀ナノボックスの三次元電子密度マッピング (2011)
  • Author(s): 堤良輔、高橋幸生、鈴木明大、西野吉則、是津信行、松原英一郎、石川哲也、山内和人
  • Organizer: 第24回日本放射光学会年会
  • Place of Presentation: エポカルつくば(筑波市)
  • Year and Date: 2011-01-09
• [Presentation] 試料厚さの効果を考慮した高分解能コヒーレントX線回折顕微法 (2011)
  • Author(s): 高橋幸生、堤良輔、西野吉則、是津信行、松原英一郎、山内和人、右川哲也
  • Organizer: 第24回日本放射光学会年会
  • Place of Presentation: エポカルつくば(筑波市)
  • Year and Date: 2011-01-09
• [Presentation] 試料厚さの効果を考慮した高分解能コヒーレントX線回折顕微法 (2011)
  • Author(s): 高橋幸生、堤良輔、西野吉則、是津信行、松原英一郎、山内和人、石川哲也
  • Organizer: 第24回日本放射光学会年会
  • Place of Presentation: エポカルつくば
  • Year and Date: 2011-01-08
• [Presentation] Development and application of high-resolution X-ray diffraction microscopy using advanced mirror optics (2010)
  • Author(s): Y.Takahashi
  • Organizer: International Global COE Symposium on Atomically Controlled Fabrication Technology 2010
  • Place of Presentation: 大阪大学中之島センター(大阪市)
  • Year and Date: 2010-11-25
• [Presentation] Development and application of high-resolution X-ray diffraction microscopy using advanced mirror optics (2010)
  • Author(s): Y. Takahashi
  • Organizer: International Global COE Symposium on Atomically Controlled Fabrication Technology 2010
  • Place of Presentation: Osaka University Nakanoshima Center, Osaka, Japan
  • Year and Date: 2010-11-24
• [Presentation] Development of high-resolution X-ray diffraction microscopy using Kirkpatrick and Baez mirrors (2010)
  • Author(s): R.Tsutsumi, Y.Takahashi, N.Zettsu, A.Suzuki, Y.Nishino, E.Matsubara, T.Ishikawa, K.Yamauchi
  • Organizer: International Global COE Symposium on Atomically Controlled Fabrication Technology 2010
  • Place of Presentation: 大阪大学中之島センター(大阪市)
  • Year and Date: 2010-11-24
• [Presentation] Development and application of high-resolution X-ray diffraction microscopy (2010)
  • Author(s): Y.Takahashi
  • Organizer: International Symposium at Frontier Research Base for Global Young Researchers
  • Place of Presentation: 大阪大学銀杏会館(吹田市)
  • Year and Date: 2010-11-16
• [Presentation] 高分解能コヒーレントX線回折顕微法による金属ナノ粒子の三次元電子密度マッピング (2010)
  • Author(s): 高橋幸生、是津信行、堤良輔、山内和人、西野吉則、石川哲也、松原英一郎
  • Organizer: 日本金属学会秋期大会
  • Place of Presentation: 北海道大学(札幌市)
  • Year and Date: 2010-09-26
• [Presentation] 高分解能コヒーレントX線回折顕微法による金属ナノ粒子の三次元電子密度マッピング (2010)
  • Author(s): 高橋幸生、是津信行、堤良輔、山内和人、西野吉則、石川哲也、松原英一郎
  • Organizer: 日本金属学会秋期大会
  • Place of Presentation: 北海道大学
  • Year and Date: 2010-09-25
• [Presentation] Development and application of high-resolution diffraction microscopy using focused hard X-ray beam (2010)
  • Author(s): Y.Takahashi, Y.Nishino, E.Matsubara, T.Ishikawa, K.Yamauchi
  • Organizer: The 10th International Conference of X-ray Microscopy
  • Place of Presentation: Chicago, Illinois, U.S.A
  • Year and Date: 2010-08-17
• [Presentation] Development and application of high-resolution diffraction microscopy using focused hard X-ray beam (2010)
  • Author(s): Y. Takahashi, Y. Nishino, E. Matsubara, T. Ishikawa and Kazuto Yamauchi
  • Organizer: the 10th International Conference of X-ray Microscopy
  • Place of Presentation: chicago, illinois, USA
  • Year and Date: 2010-08-16
• [Presentation] Development of coherent x-ray diffraction microscopy and its application in materials science (2010)
  • Author(s): Y.Takahashi
  • Organizer: The 7th International Conference on Synchrotron Radiation in Materials Science
  • Place of Presentation: The Said Business School, Oxford, UK
  • Year and Date: 2010-07-13
• [Presentation] Development of coherent x-ray diffraction microscopy and its application in materials science (2010)
  • Author(s): Y. Takahashi
  • Organizer: The 7th International Conference on Synchrotron Radiation in Materials Science
  • Place of Presentation: Oxford, UK
  • Year and Date: 2010-07-12
• [Presentation] 10ナノのくぼみはっきり新型のX線顕微鏡阪大グループ開発 (2010)
  • Organizer: 朝日新聞
  • Year and Date: 2010-05-11
• [Presentation] X線顕微鏡観察精度10ナノ以下阪大などSPring-8活用 (2010)
  • Organizer: 日経産業新聞
  • Year and Date: 2010-04-21
• [Presentation] Development and application of coherent x-ray diffraction microscopy at SPring-8 (2010)
  • Author(s): Y.Takahashi
  • Organizer: TMS annual meeting
  • Place of Presentation: Seattle, Washington, USA
  • Year and Date: 2010-02-17
• [Presentation] Development of coherent x-ray diffraction microscopy and its application in materials science (2010)
  • Author(s): Y. Takahashi
  • Organizer: TMS annual meeting
  • Place of Presentation: Seattle, Washington, USA
  • Year and Date: 2010-02-16
• [Presentation] 2010 JIM/ TMS Young Leader International Scholar (2010)
  • Author(s): Y. Takahashi
  • Organizer: The Minerals, Metals & Materials Society The Minerals, Metals & Materials Society
  • Year and Date: 2010-02-14
• [Presentation] KBミラー放射光集光X線を用いた高分解能コヒーレントX線回折顕微法の開発 (2010)
  • Author(s): 堤良輔、高橋幸生、西野吉則、久保英人、榊茂之、三村秀和、松山智至、是津信行、石川哲也、松原英一郎、山内和人
  • Organizer: 第23回日本放射光学会年会
  • Place of Presentation: イーグレ姫路、姫路
  • Year and Date: 2010-01-09
• [Presentation] KBミラー集光X線を用いたコヒーレントX線回折顕微法の応用 (2010)
  • Author(s): 久保英人、高橋幸生、是津信行、堤良輔、榊茂之、西野吉則、石川哲也、松原英一郎、山内和人
  • Organizer: 第23回日本放射光学会年会
  • Place of Presentation: イーグレ姫路、姫路
  • Year and Date: 2010-01-09
• [Presentation] 高分解能X線回折顕微法を実現するための回折強度データ取得法の検討-ピクセルシフトによる回折パターンの高解像度化- (2010)
  • Author(s): 榊茂之、高橋幸生
  • Organizer: 第23回日本放射光学会年会
  • Place of Presentation: イーグレ姫路、姫路
  • Year and Date: 2010-01-09
• [Presentation] コヒーレントX線散乱・回折イメージング技術の開発と応用 (2010)
  • Author(s): 高橋幸生
  • Organizer: 第14回日本放射光学会奨励賞
  • Place of Presentation: 日本放射光学会
  • Year and Date: 2010-01-07
• [Presentation] コヒーレントX線回折・散乱イメージング技術の開発とその応用 (2010)
  • Author(s): 高橋幸生
  • Organizer: 第23回日本放射光学会年会
  • Place of Presentation: イーグレ姫路、姫路
  • Year and Date: 2010-01-07
• [Presentation] コヒーレントX線回折・散乱イメージング技術の開発とその応用 (2010)
  • Author(s): 高橋幸生
  • Organizer: 第23回日本放射光学会年会
  • Place of Presentation: イーグレ姫路
  • Year and Date: 2010-01-06
• [Presentation] Development and application of coherent x-ray diffraction microscopy at SPring-8 (2009)
  • Author(s): Y. Takahashi
  • Organizer: X-ray coherent diffraction" Workshop & XFEL Meeting, SOLEIL Synchrotron facility
  • Place of Presentation: France
  • Year and Date: 2009-12-14
• [Presentation] Development and application of coherent x-ray diffraction microscopy at SPring-8 (2009)
  • Author(s): Y.Takahashi
  • Organizer: "X-ray coherent diffraction" Workshop & XFEL Meeting
  • Place of Presentation: SOLEIL Synchrotron facility, Saint-Aubin France
  • Year and Date: 2009-12-14
• [Presentation] 硬X線集光ビームを用いた高分解能回折顕微法の開発 (2009)
  • Author(s): 高橋幸生
  • Organizer: 第10回X線結像光学シンポジウム
  • Place of Presentation: つくばエポカル
  • Year and Date: 2009-11-07
• [Presentation] 硬X線集光ビームを用いた高分解能回折顕微法の開発 (2009)
  • Author(s): 高橋幸生
  • Organizer: 第10回X線結像光学シンポジウム
  • Place of Presentation: エポカルつくば、筑波
  • Year and Date: 2009-11-07
• [Presentation] KBミラー集光システムを備えた高分解能コヒーレントX線回折顕微法装置の開発 (2009)
  • Author(s): 久保英人、高橋幸生、堤良輔、榊茂之、西野吉則、石川哲也、山内和人
  • Organizer: 第10回X線結像光学シンポジウム
  • Place of Presentation: エポカルつくば、筑波
  • Year and Date: 2009-11-07
• [Presentation] High-resolution diffraction microscopy using the plane-wave field of a nearly diffraction limited focused x-ray beam (2009)
  • Author(s): Y.Takahashi, Y.Nishino, R.Tsutsumi, H.Kubo, H.Furukawa, H.Mimura, S.Matsuyama, N.Zettsu, T.Ishikawa, K.Yamauchi
  • Organizer: "Developments in Coherent X-ray Methods" SRI2009 Satellite Workshop
  • Place of Presentation: Melbourne University, Melbourne, Australia
  • Year and Date: 2009-10-03
• [Presentation] Development and application of high-resolution diffraction microscopy using synchrotron x-ray beam focused Kirkpatrick-Baez mirrors (2009)
  • Author(s): Y.Takahashi, Y.Nishino, R.Tsutsumi, H.Kubo, H.Furukawa, H.Mimura, S.Matsuyama, N.Zettsu, T.Ishikawa, K.Yamauchi
  • Organizer: The 10 the international conference on synchrotron radiation instrumentation
  • Place of Presentation: The melbourne convention and exhibition center, Melbourne, Australia
  • Year and Date: 2009-09-29
• [Presentation] High-resolution diffraction microscopy using synchrotron X-ray beam focused by Kirkpatrick-Baez mirrors (2009)
  • Author(s): Y.Takahashi, Y.Nishino, R.Tsutsumi, H.Kubo, H.Furukawa, H.Mimura, S.Matsuyama, N.Zettsu, T.Ishikawa, K.Yamauchi
  • Organizer: International Workshop on X-ray Mirror Design, Fabrication, and Metrology
  • Place of Presentation: 銀杏会館、大阪大学
  • Year and Date: 2009-09-23
• [Presentation] 集光X線を利用した高分解能回折顕微法の開発 (2009)
  • Author(s): 高橋幸生
  • Organizer: 日本放射光学会第一回若手研究会「X線ナノ集光技術研究会」
  • Place of Presentation: 大阪大学
  • Year and Date: 2009-08-10
• [Presentation] 集光X線を利用した高分解能回折顕微法の開発 (2009)
  • Author(s): 高橋幸生
  • Organizer: 日本放射光学会第一回若手研究会
  • Place of Presentation: 大阪大学理工学図書館、図書館ホール、大阪大学
  • Year and Date: 2009-08-10
• [Presentation] KBミラー集光放射光X線を用いた高分解能回折顕微法の実現可能性の検討 (2009)
  • Author(s): 堤良輔、高橋幸生、西野吉則、三村秀和、久保英人、石川哲也、山内和人
  • Organizer: 精密工学会関西支部 2009年度関西地方定期学術講演会
  • Place of Presentation: 千里ライフサイエンスセンター、大阪
  • Year and Date: 2009-05-13
• [Book] SPring-8 Research Frontiers 2010 (2011)
  • Author(s): Y.Takahashi, N.Zettsu
  • Publisher: SPring-8
• [Remarks]
  • URL: http://www-up.prec.eng.osaka-u.ac.jp/takahashi/
• [Remarks]
  • URL: http://www-up.prec.eng.osaka-u.ac.jp/takahashi/
• [Remarks]
  • URL: http://www.wakate.frc.eng.osaka-u.ac.jp/takahashi/
• [Remarks]
  • URL: http://www.wakate.frc.eng.osaka-u.ac.jp/takahashi/