Development of techniques for the manipulation of a nano-meter scale single crystal

• Project/Area Number: 21710118
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Single-year Grants
• Research Field: Nanomaterials/Nanobioscience
• Research Institution: Japan Synchrotron Radiation Research Institute
• Principal Investigator: YASUDA Nobuhiro Japan Synchrotron Radiation Research Institute, 利用研究促進部門, 研究員 (10393315)
• Project Period (FY): 2009 – 2010
• Project Status: Completed (Fiscal Year 2010)
• Budget Amount: ¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000); Fiscal Year 2010: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000); Fiscal Year 2009: ¥3,380,000 (Direct Cost: ¥2,600,000、Indirect Cost: ¥780,000)
• Keywords: 単結晶X線構造解析 / 微小結晶 / 放射光 / ナノ試料マニピュレーション / 結晶構造 / Focused Ion Beam(FIB)

Research Abstract

The purpose of this study is the development of "the manipulation technique for a nano-meter scale single crystal". This technique enables us to select a grain of nano-meter scale single crystal from powdery sample and to attach it on the sample holder.
The handling of a 250 nm BaTiO_3 crystal and diffraction measurement using synchrotron X-ray beam of SPring-8 succeeded. The data analysis indicates two domains are contained in the measured 250 nm BaTiO_3 crystal.

Research Products

• [Journal Article] ubmicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination. (2010)
  • Author(s): N.Yasuda、Y.Fukuyama、K.Toriumi、S.Kimura、M.Takata.
  • Journal Title: IP Conference Proceedings. 1234巻 Pages: 147-150
  • Peer Reviewed
• [Journal Article] Submicrometer Single Crystal Diffractometry for Highl Accurate Structure Determination (2010)
  • Author(s): Nobuhiro Yasuda
  • Journal Title: AIP Conference Proceedings
  • Peer Reviewed
• [Journal Article] X線ピンポイント構造計測による粉末試料1粒からの単結晶構造解析 (2009)
  • Author(s): 安田伸広、福山祥光、金廷恩、木村滋、村山美乃
  • Journal Title: 日本結晶学会誌 51巻 Pages: 201-204
  • NAID: 10025158295
• [Journal Article] X線ピンポイント構造計測による粉末試料1粒からの単結晶構造解析 (2009)
  • Author(s): 安田伸広
  • Journal Title: 日本結晶学会誌 51 Pages: 201-204
  • NAID: 10025158295
• [Presentation] 放射光結晶化学研究における時分割測定と極微小結晶構造解析の将来展望 (2010)
  • Author(s): 安田伸広
  • Organizer: 平成22年度日本結晶学会年会
  • Place of Presentation: 大阪大学コンベンションセンター
  • Year and Date: 2010-12-05
• [Presentation] 放射光結晶化学研究における時分割測定と極微小結晶構造解析の将来展望 (2010)
  • Author(s): 安田伸広
  • Organizer: 平成22年度 日本結晶学会年会
  • Place of Presentation: 大阪大学コンベンションセンター
  • Year and Date: 2010-12-05
• [Presentation] 極微小単結晶を利用した精密構造解析 (2010)
  • Author(s): 安田伸広
  • Organizer: 第23回日本放射光学会年会放射光化学合同シンポジウム
  • Place of Presentation: イーグレひめじ(兵庫県)
  • Year and Date: 2010-01-08
• [Presentation] Nanometer-scale single crystal diffractometry for highly accurate structure determination (2009)
  • Author(s): Nobuhiro Yasuda
  • Organizer: The 10th International Conference on Synchrotron Radiation Instrumentation(SRI09)
  • Place of Presentation: Melbourne Convention and Exhibition Centre(オーストラリア)
  • Year and Date: 2009-09-30