| Project/Area Number |
21750030
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Physical chemistry
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| Research Institution | Institute for Molecular Science |
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Principal Investigator |
YAMANE Hiroyuki Institute for Molecular Science, 光分子科学研究領域, 助教 (50402459)
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| Project Period (FY) |
2009 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
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| Budget Amount *help |
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2010: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2009: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
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| Keywords | 軟X線吸収分光法 / 軟X線発光分光法 / 角度分解光電子分光法 / 局所電子状態 / 電荷輸送 / 分子配向 / 有機半導体 / フタロシアニン / 電子状態 / 表面・界面 / 共鳴光電子分光法 / 放射光 / シンクロトロン放射光 |
|---|
| Research Abstract |
The electronic structure of organic thin films and interfaces plays a crucial role in the performance of organic devices such as light-emitting diodes, field-effect transistors, and photovoltaic cells. The functionality of these devices is dominated by the geometric film/interface structure, which varies depending on the molecular structure and the sample preparation. In this work, we succeeded to clarify the correlation between the geometric and electronic structure of organic thin films and interfaces by means of the combination of (i) the control of geometric film/interface structure and (ii) local electronic structure analyses based on soft X-ray spectroscopies.
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