Three-dimensional mapping of electrical transport characteristics in organic semiconductors using independently-driven four-probe method
| Project/Area Number |
21760024
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | The University of Tokyo |
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Principal Investigator |
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| Project Period (FY) |
2009 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
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| Budget Amount *help |
¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
Fiscal Year 2010: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2009: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
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| Keywords | 表面・界面物性 / 有機薄膜 / 有機半導体 / 電気伝導 / 探針 / 4探針 |
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| Research Abstract |
We have developed an independently driven four-probe method to investigate field-effect transistor (FET) characteristics in organic semiconductors. The independently driven four-probe method enables us to investigate local FET characteristics in organic semiconductors without damaging the samples. We demonstrated four-probe FET measurement on a pentacene thin film, and we have succeeded to obtain single grain mobility in the polycrystalline pentacene film.
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Report
(3 results)
Research Products
(5 results)
