Implementation of sub-A resolution by a new imaging method based on electron diffraction patterns and towards its application for materials science

• Project/Area Number: 21760026
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Single-year Grants
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Nagoya University
• Principal Investigator: YAMASAKI Jun Nagoya University, エコトピア科学研究所, 助教 (40335071)
• Project Period (FY): 2009 – 2010
• Project Status: Completed (Fiscal Year 2010)
• Budget Amount: ¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000); Fiscal Year 2010: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000); Fiscal Year 2009: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000)
• Keywords: 電子顕微鏡 / 回折顕微法 / 制限視野回折 / 電子線 / サブオングストローム分解能

Research Abstract

We succeeded in making large progresses in possibility and versatility of electron diffractive imaging. Spatial resolution of 0.078nm, reconstruction of areas 6nm in diameter, and reconstruction of compound crystalline materials were achieved in the present study.

Research Products

• [Journal Article] Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture (2011)
  • Author(s): S.Morishita, J.Yamasaki, N.Tanaka
  • Journal Title: Journal of Electron Microscopy 60(2) Pages: 101-108
  • Peer Reviewed
• [Journal Article] Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture (2011)
  • Author(s): S.Morishita, J.Yamasaki, N.Tanaka
  • Journal Title: Journal of Electron Microscopy Volume: 60(2) Pages: 101-108
  • Peer Reviewed
• [Journal Article] 回折顕微法による原子配列構造の可視化 -制限視野回折図形からのSiダンベル構造再生- (2009)
  • Author(s): 山崎順、田中信夫、森下茂幸
  • Journal Title: まてりあ 48巻12号 Pages: 604-604
  • NAID: 10026268055
  • Peer Reviewed
• [Journal Article] 回折顕微法による原子配列構造の可視化-制限視野回折図形からのSiダンベル構造再生- (2009)
  • Author(s): 山崎順、田中信夫、森下茂幸
  • Journal Title: まてりあ特集「顕微鏡法による材料開発のための微細構造研究最前線(9)」 48(12) Pages: 604-604
  • NAID: 10026268055
  • Peer Reviewed
• [Presentation] (2011)
  • Author(s): 太田圭佑、森下茂幸、山崎順、田中信夫
  • Organizer: 日本顕微鏡学会67回学術講演会
  • Place of Presentation: 福岡国際会議場
  • Year and Date: 2011-05-17
• [Presentation] 電子回折顕微法を用いた位相像観察 (2011)
  • Author(s): 太田圭佑、森下茂幸、山崎順、田中信夫
  • Organizer: 日本顕微鏡学会67回学術講演会
  • Place of Presentation: 福岡国際会議場(発表確定)
  • Year and Date: 2011-05-17
• [Presentation] (2010)
  • Author(s): 山崎順
  • Organizer: 原子分解能ホログラフィー研究会ワークショップ
  • Place of Presentation: 東北大学
  • Year and Date: 2010-11-13
• [Presentation] 電子回折顕微法を用いた結晶原子配列の可視化 (2010)
  • Author(s): 山崎順
  • Organizer: 原子分解能ホログラフィー研究会ワークショップ
  • Place of Presentation: 東北大学金属材料研究所
  • Year and Date: 2010-11-13
• [Presentation] (2010)
  • Author(s): J.Yamasaki, A.Hirata, Y.Hirotsu, N.Tanaka
  • Organizer: The 17th IFSM International Microscopy Congress
  • Place of Presentation: Rio de Janeilo, Brazil
  • Year and Date: 2010-09-23
• [Presentation] (2010)
  • Author(s): J.Yamasaki, S.Morishita, N.Tanaka
  • Organizer: The 17th IFSM International Microscopy Congress
  • Place of Presentation: Rio de Janeilo, Brazil
  • Year and Date: 2010-09-23
• [Presentation] (2010)
  • Author(s): S.Morishita, J.Yamasaki, T.Kato
  • Organizer: The 17th IFSM International Microscopy Congress
  • Place of Presentation: Rio de Janeilo, Brazil
  • Year and Date: 2010-09-23
• [Presentation] (2010)
  • Author(s): S.Morishita, J.Yamasaki, T.Kato, N.Tanaka
  • Organizer: The 2nd International Symposium on Advanced Microscopy and Theoretical Calculations
  • Place of Presentation: 名古屋国際会議場
  • Year and Date: 2010-06-25
• [Presentation] (2010)
  • Author(s): J.Yamasaki, S.Morishita, N.Tanaka
  • Organizer: COHERENCE 2010
  • Place of Presentation: Rostock-Warnemunde, Germany
  • Year and Date: 2010-06-09
• [Presentation] (2010)
  • Author(s): S.Morishita, J.Yamasaki, N.Tanaka
  • Organizer: COHERENCE 2010
  • Place of Presentation: Rostock-Warnemunde, Germany
  • Year and Date: 2010-06-09
• [Presentation] Reconstruction of Crystalline Structures at 78 pmResolution by Electron Diffractive Imaging (2010)
  • Author(s): J.Yamasaki, S.Morishita, N.Tanaka
  • Organizer: COHERENCE 2010
  • Place of Presentation: Rostock-Warnemunde, Germany.
  • Year and Date: 2010-06-09
• [Presentation] Measurement of Wavefront Curvature and Spatial Coherenceof Electron Beams by Using a Small Aperture (2010)
  • Author(s): S.Morishita, J.Yamasaki, N.Tanaka
  • Organizer: COHERENCE 2010
  • Place of Presentation: Rostock-Warnemunde, Germany.
  • Year and Date: 2010-06-09
• [Presentation] (2010)
  • Author(s): 森下茂幸,山崎順,田中信夫
  • Organizer: 日本物理学会第65回年次大会
  • Place of Presentation: 岡山大学
  • Year and Date: 2010-03-21
• [Presentation] (2010)
  • Author(s): 濱邊麻衣子, 齋藤晃, 森下茂幸, 山崎順, 田中信夫
  • Organizer: 日本物理学会第65回年次大会
  • Place of Presentation: 岡山大学
  • Year and Date: 2010-03-21
• [Presentation] 電子回折顕微法の再生結果に及ぼす量子ノイズの影響 (2010)
  • Author(s): 森下茂幸, 山崎順, 田中信夫
  • Organizer: 日本物理学会 第65回年次大会
  • Place of Presentation: 岡山大学
  • Year and Date: 2010-03-21
• [Presentation] HOLZ線のロッキングカーブプロファイルをもちいた3次元格子歪み解析II (2010)
  • Author(s): 濱邊麻衣子, 齋藤晃, 森下茂幸, 山崎順, 田中信夫
  • Organizer: 日本物理学会 第65回年次大会
  • Place of Presentation: 岡山大学
  • Year and Date: 2010-03-21
• [Presentation] (2010)
  • Author(s): 森下茂幸, 山崎順, 加藤丈晴, 田中信夫
  • Organizer: 日本顕微鏡学会66回学術講演会
  • Place of Presentation: 名古屋国際会議場
• [Presentation] 制限視野ナノ回折を用いた入射波動場測定と電子回折顕微法 (2010)
  • Author(s): 森下茂幸
  • Organizer: 日本顕微鏡学会66回学術講演会
  • Place of Presentation: 名古屋国際会議場
• [Presentation] (2009)
  • Author(s): Jun Yamasaki, Nobuo Tanaka, Shigeyuki Morishita
  • Organizer: The 12th Frontiers of Electron Microscopy in Materials Science (FEMMS2009)
  • Place of Presentation: 長崎ハウステンボス
  • Year and Date: 2009-09-28
• [Presentation] High-resolution imaging and structure analysis by using aberration-corrected electron diffraction (2009)
  • Author(s): Jun Yamasaki, Nobuo Tanaka, Shigeyuki Morishita
  • Organizer: The 12th Frontiers of Electron Microscopy in Materials Science(FEMM2009)
  • Place of Presentation: 長崎ハウステンボス
  • Year and Date: 2009-09-28
• [Presentation] (2009)
  • Author(s): Jun Yamasaki, et al
  • Organizer: Microscopy & Microanalysis 2009
  • Place of Presentation: Richmond, USA
  • Year and Date: 2009-07-30
• [Presentation] (2009)
  • Author(s): Shigeyuki Morishita, Jun Yamasaki
  • Organizer: Microscopy & Microanalysis 2009
  • Place of Presentation: Richmond, USA
  • Year and Date: 2009-07-30
• [Presentation] Analysis of Crystalline Nano Structures Embedded in Amorphous Films by Selected Area Nano Diffraction in a Cs-corrected TEM (2009)
  • Author(s): Jun Yamasaki, et al.
  • Organizer: Microscopy & Microanalysis 2009
  • Place of Presentation: Richmond, USA
  • Year and Date: 2009-07-30
• [Presentation] (2009)
  • Author(s): 森下茂幸, 山崎順, 加藤丈晴, 田中信夫
  • Organizer: 日本顕微鏡学会第65回学術講演会
  • Place of Presentation: 仙台国際センター
  • Year and Date: 2009-05-27
• [Remarks] ホームページ等
  • URL: http://sirius.cirse.nagoya-u.ac.jp/~tanakalab/research/researches/DiffImg.html
• [Remarks] *11.研究発表の欄に記した雑誌投稿論文は、その号のEditor's Choiceに選出された。
• [Remarks] *研究成果に関するwebページはURLは
  • URL: http://sirius.cirse.nagoya-u.ac.jp/~tanakalab/research/researches/DiffImg.html
• [Remarks]
  • URL: http://sirius.cirse.nagoya-u.ac.jp/~tanakalab/research/researches/DiffImg.html