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Property control of oxides from impurity doping toward materials design

Research Project

Project/Area Number 21760030
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeSingle-year Grants
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionNational Institute for Materials Science

Principal Investigator

UMEZAWA Naoto  National Institute for Materials Science, 光触媒材料センター, 主任研究員 (20455273)

Project Period (FY) 2009 – 2010
Project Status Completed (Fiscal Year 2010)
Budget Amount *help
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2010: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2009: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000)
Keywords不純物 / 格子欠陥 / 第一原理計算 / 酸化物 / ゲート絶縁膜 / 光触媒 / 不純物ドープ / 界面制御 / 電子相関 / 欠陥密度 / high-k / 多価元素 / 相関汎関数
Research Abstract

This theoretical study revealed that the properties of oxide materials used in semiconductor devices or photocatalysis can be improved by making contacts with other materials or doping with foreign elements. In particular, the proposed method for minimizing defect concentrations by controlling oxygen flows through interfaces between two materials is a noticeable achievement since it gives a new guideline for materials design.

Report

(3 results)
  • 2010 Annual Research Report   Final Research Report ( PDF )
  • 2009 Annual Research Report
  • Research Products

    (21 results)

All 2011 2010 2009

All Journal Article (12 results) (of which Peer Reviewed: 12 results) Presentation (7 results) Patent(Industrial Property Rights) (2 results)

  • [Journal Article] Electronic coupling assembly of semiconductor nanocrystals : self-narrowed band gap to promise solar energy utilization2011

    • Author(s)
      Hua Tong, Naoto Umezawa, Jinhua Ye, Takahisa Ohno
    • Journal Title

      Energy, Environmental Science 4

      Pages: 1684-1689

    • Related Report
      2010 Final Research Report
    • Peer Reviewed
  • [Journal Article] Facet Effect of Single-Crystalline Ag3PO4 Sub-microcrystals on Photocatalytic Properties2011

    • Author(s)
      Yingpu Bi, Shuxin Ouyang, Naoto Umezawa, Junyu Cao, Jinhua Ye
    • Journal Title

      J.Am.Chem.Soc. 133

      Pages: 6490-6492

    • Related Report
      2010 Final Research Report
    • Peer Reviewed
  • [Journal Article] Visible light photoactivity from a bonding assembly of titanium oxide nonocrystals2011

    • Author(s)
      Hua Tong, Naoto Umezawa, Jinhua Ye
    • Journal Title

      Chem.Comm. 47

      Pages: 4219-4221

    • Related Report
      2010 Final Research Report
    • Peer Reviewed
  • [Journal Article] Theoretical study of high photocatalytic performance of Ag3PO42011

    • Author(s)
      Naoto Umezawa, Ouyang Shuxin, Jinhua Ye
    • Journal Title

      Phys.Rev.B 83

    • Related Report
      2010 Final Research Report
    • Peer Reviewed
  • [Journal Article] Theoretical study of high photocatalytic performance of Ag3PO42011

    • Author(s)
      Naoto Umezawa, Ouyang Shuxin, Jinhua Ye
    • Journal Title

      Physical Review B

      Volume: 83

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Visible light photoactivity from a bonding assembly of titanium oxide nonocrystals2011

    • Author(s)
      Hua Tong, Naoto Umezawa, Jinhua Ye
    • Journal Title

      Chemical Communications

      Volume: 47 Pages: 4219-4221

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Facet Effect of Single-Crystalline Ag3PO4 Sub-microcrystals on Photocatalytic Properties2011

    • Author(s)
      Yingpu Bi, Shuxin Ouyang, Naoto Umezawa, Junyu Cao, Jinhua Ye
    • Journal Title

      Journal of the American Chemical Society

      Volume: 133 Pages: 6490-6492

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Electronic coupling assembly of semiconductor nanocrystals : self-narrowed band gap to promise solar energy utilization2011

    • Author(s)
      Hua Tong, Naoto Umezawa, Jinhua Ye, Takahisa Ohno
    • Journal Title

      Energy & Environmental Science

      Volume: 4 Pages: 1684-1689

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Origin of high solubility of silicon in La_2O_3 : A first-principles study2010

    • Author(s)
      Naoto Umezawa, Kenji Shiraishi
    • Journal Title

      Appl.Phys.Lett. 97

    • Related Report
      2010 Final Research Report
    • Peer Reviewed
  • [Journal Article] Effects of capping HfO2 with multivalent oxides toward reducing the number of charge defects2010

    • Author(s)
      Naoto Umezawa
    • Journal Title

      Appl.Phys.Lett. 96

    • Related Report
      2010 Final Research Report
    • Peer Reviewed
  • [Journal Article] Origin of high solubility of silicon in La2O3 : A first-principles study2010

    • Author(s)
      Naoto Umezawa, Kenji Shiraishi
    • Journal Title

      Applied Physics Letters

      Volume: 97

    • NAID

      120007137820

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Effects of capping HfO_2 with multivalent oxides toward reducing the number of charged defects2010

    • Author(s)
      Naoto Umezawa
    • Journal Title

      Applied Physics Letters 96

    • Related Report
      2009 Annual Research Report
    • Peer Reviewed
  • [Presentation] Building correlation energy functional from transcorrelated approach2010

    • Author(s)
      Naoto Umezawa, Brian Austin, William A.Lester, Jr.
    • Organizer
      Psi-k meeting 2010
    • Place of Presentation
      Berlin.
    • Year and Date
      2010-09-15
    • Related Report
      2010 Final Research Report
  • [Presentation] Building correlation energy functional from transcorrelated approach2010

    • Author(s)
      Naoto Umezawa, Brian Austin, William A.Lester, Jr.
    • Organizer
      Psi-k meeting 2010
    • Place of Presentation
      Berlin
    • Year and Date
      2010-09-15
    • Related Report
      2010 Annual Research Report
  • [Presentation] Remote Control of High-k/Si Gate Stack Properties2010

    • Author(s)
      Naoto Umezawa
    • Organizer
      2010 Materials Research Society Spring Meeting
    • Place of Presentation
      San Francisco, California, USA
    • Year and Date
      2010-04-07
    • Related Report
      2010 Final Research Report 2009 Annual Research Report
  • [Presentation] Self-interaction-free nonlocal correlation energy functional associated with a Jastrow function2010

    • Author(s)
      Naoto Umezawa, Brian Austin, William A.Lester, Jr.
    • Organizer
      American Physical Society, March Meeting 2010
    • Place of Presentation
      Portland, Oregon, USA.
    • Year and Date
      2010-03-17
    • Related Report
      2010 Final Research Report
  • [Presentation] Self-interaction-free nonlocal correlation energy functional associated with a Jastrow function2010

    • Author(s)
      Naoto Umezawa, Brian Austin, William A.Lester, Jr.
    • Organizer
      American Physical Society, March Meeting 2010
    • Place of Presentation
      Portland, Oregon, USA
    • Year and Date
      2010-03-17
    • Related Report
      2009 Annual Research Report
  • [Presentation] Quality Control of High-k gate Oxides by Doping with Impurities : Guidelines from Theoretical Analysis2009

    • Author(s)
      Naoto Umezawa
    • Organizer
      40th IEEE Semiconductor Interface Specialists Conference
    • Place of Presentation
      Arlington, Virginia, USA
    • Year and Date
      2009-12-03
    • Related Report
      2010 Final Research Report
  • [Presentation] Quality Control of High-k gate Oxides by Doping with Impurities : Guidelines from Theoretical Analysis2009

    • Author(s)
      Naoto Umezawa
    • Organizer
      40^<th> IEEE Semiconductor Interface Specialists Conference
    • Place of Presentation
      Arlington, Virginia, USA
    • Year and Date
      2009-12-03
    • Related Report
      2009 Annual Research Report
  • [Patent(Industrial Property Rights)] 界面層削減方法、高誘電率ゲート絶縁膜の形成方法、高誘電率絶縁膜、及び高誘電率ゲート酸化膜を有するトランジスタ2009

    • Inventor(s)
      梅澤直人、知京豊裕、生田目俊秀
    • Industrial Property Rights Holder
      独立行政法人物質・材料研究機構
    • Filing Date
      2009-12-01
    • Related Report
      2010 Final Research Report
  • [Patent(Industrial Property Rights)] 界面層削減方法、高誘電率ゲート絶縁膜の形成方法、高誘電率絶縁膜、及び高誘電率ゲート酸化膜を有するトランジスタ2009

    • Inventor(s)
      梅澤直人, 知京豊裕, 生田目俊秀
    • Industrial Property Rights Holder
      物質・材料研究機構
    • Industrial Property Number
      2009-273000
    • Filing Date
      2009-12-01
    • Related Report
      2009 Annual Research Report

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Published: 2009-04-01   Modified: 2016-04-21  

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