Development of high-sensitivity near-field fluorescence thermal nanoscopy for in-situ measurement of thermophysical properties.
| Project/Area Number |
21760163
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Thermal engineering
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| Research Institution | Keio University |
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Principal Investigator |
TAGUCHI Yoshihiro Keio University, 理工学部, 専任講師 (30433741)
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| Project Period (FY) |
2009 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
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| Budget Amount *help |
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2010: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2009: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
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| Keywords | 近接場蛍光 / 走査プローブ顕微鏡 / マイクロ・ナノデバイス / ナノ熱工学 / 近接場光 / 走査型プローブ顕微鏡 / 計測技術 / 蛍光寿命 |
|---|
| Research Abstract |
Real-time and in situ monitoring of local temperature and thermal properties of nano material is extremely important for the system design of nano devices. In this study, high-sensitivity near-field fluorescence thermal nanoscopy was proposed, and its validity was successfully verified.
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Report
(3 results)
Research Products
(49 results)
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[Presentation] Development of Nanometer Scale Temperature Measurement Method by Polarized Near-field Light2010
Author(s)
Hosaka, S., Kasakake, T., Taguchi, Y., Saiki, T., Nagasaka, Y.
Organizer
9th Asian Thermophysical Properties Conference
Place of Presentation
Beijing, China
Year and Date
2010-10-20
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