Structural incommensuration and imaging for valence fluctuation of conductive ions for misfit-layered thermoelectric compounds
| Project/Area Number |
21760545
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
Structural/Functional materials
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| Research Institution | Tohoku University |
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Principal Investigator |
YUBUTA Kunio Tohoku University, 金属材料研究所, 准教授 (00302208)
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| Project Period (FY) |
2009 – 2010
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| Project Status |
Completed (Fiscal Year 2010)
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| Budget Amount *help |
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2010: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2009: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
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| Keywords | ミスフィット化合物 / 層状構造 / 電子顕微鏡 / 熱電変換材料 / 実空間イメージング / 熱電変換 |
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| Research Abstract |
On the basis of electron diffraction and HREM observations, relationships between crystal structures with incommensuration and valence fluctuation of metal ions for misfit-layered thermoelectric compounds are investigated. In addition, structural features of "tiling defect" in layered boride TmAlB_4 are studied by direct observations.
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Report
(3 results)
Research Products
(66 results)
