| Project/Area Number |
21760576
|
|---|
| Research Category |
Grant-in-Aid for Young Scientists (B)
|
| Allocation Type | Single-year Grants |
|---|
| Research Field |
Material processing/treatments
|
|---|
| Research Institution | Kyoto University (2010)
Tohoku University (2009) |
|---|
Principal Investigator |
MORISHITA Kohei Kyoto University, 大学院・エネルギー科学研究科, 特定助教 (00511875)
|
|---|
| Project Period (FY) |
2009 – 2010
|
| Project Status |
Completed (Fiscal Year 2010)
|
| Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2010: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2009: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
|
|---|
| Keywords | 半導体結晶 / 高温塑性変形 / X線点集光素子 / X線分光素子 / シリコン / ゲルマニウム |
|---|
| Research Abstract |
Single crystal semiconducting wafers such as silicon and germanium are widely used for monochromators or analyzers of X-rays thanks to their excellent crystallographic quality. However, owing to their brittleness due to their intrinsic nature, they are easily broken when strong deformation is applied. In the present work, by using plastic deformation of them at the temperatures just below the melting points of them, the author realized a Johansson type point-focusing monochromator with R=300mm concave surface, much higher efficiency and shorter focal length than that of conventional ones, and realized also integrated conical analyzer which make it possible to simultaneous focusing of several characteristic lines onto the detector plane of a small-area (20×20mm) X-ray CCD. The present results are breakthrough in X-ray spectrometry.
|
