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Development of power transistors using ultra-wide-bandgap AlN-based semiconductors

Research Project

Project/Area Number 21H01389
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Review Section Basic Section 21060:Electron device and electronic equipment-related
Research InstitutionNagoya Institute of Technology

Principal Investigator

Miyoshi Makoto  名古屋工業大学, 工学(系)研究科(研究院), 教授 (30635199)

Co-Investigator(Kenkyū-buntansha) 佐藤 威友  北海道大学, 量子集積エレクトロニクス研究センター, 准教授 (50343009)
Project Period (FY) 2021-04-01 – 2024-03-31
Project Status Completed (Fiscal Year 2023)
Budget Amount *help
¥13,780,000 (Direct Cost: ¥10,600,000、Indirect Cost: ¥3,180,000)
Fiscal Year 2023: ¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000)
Fiscal Year 2022: ¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2021: ¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Keywords窒化物半導体 / パワートランジスタ / 高周波トランジスタ / ワイドバンドギャップ / AlN / ヘテロ接合FET
Outline of Research at the Start

本研究では、将来社会の省エネ化ニーズに応えるアイテムとして、GaN、SiC以上の超ワイドバンドギャップ半導体であるAlN系ヘテロ構造をベースとしたパワートランジスタを着想、その実現に向けた課題と方策を以下のように設定し、その実現に向けた研究計画を策定した。
1. AlN系ヘテロ構造のエピタキシャル成長技術確立
2. AlN系トランジスタのデバイス化技術構築
3. AlN系トランジスタの試作と到達性能の確認

Outline of Final Research Achievements

Aluminum nitride (AlN) is viewed as semiconductor material for next-generation power electronic devices due to its superior properties exceeding GaN and SiC. AlN also has high chemical stability and excellent mechanical strength and hardness. However, these properties also pose technical difficulties when considering application to practical device manufacturing. In this study, we conducted study on the crystal growth and the device prototype fabrication using AlN-based heterostructure electronic devices. As a result of our research, we successfully fabricated AlGaN-channel power transistors with AlN mole fractions up to 70% and high-frequency transistors using single-crystal AlN substrates, and confirmed their good device characteristics.

Academic Significance and Societal Importance of the Research Achievements

窒化アルミニウム(AlN)は、次世代パワーデバイス材料としてGaNやSiCなど既存の半導体材料を凌駕する物性を備えているが、ウルトラワイドバンドギャップ半導体の特徴でもある化学的安定性や機械的強度・硬度に起因してデバイス作製が困難であった。本研究を遂行した事で、AlN系半導体トランジスタの設計、結晶成長、デバイスプロセスについて、多くの知見を得る事が出来た。本研究で得られた知見は、電子デバイス応用に限らず、AlN系半導体を用いた光・電子デバイスの実現に大きく寄与できる。

Report

(4 results)
  • 2023 Annual Research Report   Final Research Report ( PDF )
  • 2022 Annual Research Report
  • 2021 Annual Research Report
  • Research Products

    (21 results)

All 2024 2023 2022 2021 Other

All Journal Article (3 results) (of which Peer Reviewed: 3 results,  Open Access: 1 results) Presentation (17 results) (of which Int'l Joint Research: 6 results,  Invited: 1 results) Remarks (1 results)

  • [Journal Article] DC and pulse I-V characteristics of strain-engineered AlGaInN/GaN HEMTs fabricated on single-crystal AlN substrate2023

    • Author(s)
      Miyoshi Makoto、Tanaka Sakura、Kawaide Tomoyuki、Inoue Akiyoshi、Egawa Takashi
    • Journal Title

      physica status solidi (a)

      Volume: 220 Issue: 16 Pages: 2200733-2200733

    • DOI

      10.1002/pssa.202200733

    • Related Report
      2022 Annual Research Report
    • Peer Reviewed
  • [Journal Article] High drain-current-density and high breakdown-field Al<sub>0.36</sub>Ga<sub>0.64</sub>N-channel heterojunction field-effect transistors with a dual AlN/AlGaInN barrier layer2022

    • Author(s)
      Inoue Akiyoshi、Tanaka Sakura、Egawa Takashi、Miyoshi Makoto
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 61 Issue: SC Pages: SC1039-SC1039

    • DOI

      10.35848/1347-4065/ac4b09

    • Related Report
      2021 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Improved on-state performance in AlGaN-channel heterojunction field-effect transistors with a quaternary AlGaInN barrier layer and a selectively grown n++-GaN contact layer2021

    • Author(s)
      Miyoshi Makoto、Inoue Akiyoshi、Yamanaka Mizuki、Harada Hiroki、Egawa Takashi
    • Journal Title

      Materials Science in Semiconductor Processing

      Volume: 133 Pages: 105960-105960

    • DOI

      10.1016/j.mssp.2021.105960

    • Related Report
      2021 Annual Research Report
    • Peer Reviewed
  • [Presentation] Fabrication of high AlN-mole-fraction Al0.7Ga0.3N channel HFETs using a single-crystal AlN substrate2024

    • Author(s)
      Y. Kometani, T. Kawaide, S. Tanaka, T. Egawa, M. Miyoshi
    • Organizer
      16th International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma 2024)
    • Related Report
      2023 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 単結晶AlN基板上の薄層UID-GaNチャネルを備えた AlGaInN/GaN HEMTの作製と特性評価2023

    • Author(s)
      川出 智之,米谷 宜展,田中 さくら,江川 孝志,三好 実人
    • Organizer
      電子情報通信学会CPM/ED/LQE研究会
    • Related Report
      2023 Annual Research Report
  • [Presentation] Device characteristics of AlGaInN/GaN HEMTs with a thin 150-nm-thick UID-GaN channel fabricated on single-crystal AlN substrate2023

    • Author(s)
      T. Kawaide, Y. Kometani, S. Tanaka, T. Egawa, M. Miyoshi
    • Organizer
      14th International Conference on Nitride Semiconductors (ICNS-14)
    • Related Report
      2023 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 単結晶AlN基板上の薄層UID-GaNチャネルを備えた AlGaInN/GaN HEMTの作製と特性評価2023

    • Author(s)
      川出 智之,米谷 宜展,田中 さくら,江川 孝志,三好 実人
    • Organizer
      第84回応用物理学会秋季学術講演会
    • Related Report
      2023 Annual Research Report
  • [Presentation] 単結晶AlN基板上高AlN比Al0.7Ga0.3NチャネルHFETの作製(II)2023

    • Author(s)
      米谷 宜展,川出 智之,田中 さくら,江川 孝志,三好 実人
    • Organizer
      第84回応用物理学会秋季学術講演会
    • Related Report
      2023 Annual Research Report
  • [Presentation] 単結晶AlN基板上への高AlN比Al0.7Ga0.3NチャネルHFETの作製2023

    • Author(s)
      川出 智之、田中 さくら、米谷 宜展、江川 孝志、三好 実人
    • Organizer
      第70回応用物理学会春季学術講演会
    • Related Report
      2022 Annual Research Report
  • [Presentation] 単結晶AlN基板上AlGaInN/GaN HEMTの作製と特性評価 (II)2023

    • Author(s)
      川出 智之、田中 さくら、井上 暁喜、江川 孝志、三好 実人
    • Organizer
      第70回応用物理学会春季学術講演会
    • Related Report
      2022 Annual Research Report
  • [Presentation] UWBG窒化物AlN系パワートランジスタの進展2023

    • Author(s)
      三好 実人
    • Organizer
      電子情報通信学会総合大会
    • Related Report
      2022 Annual Research Report
    • Invited
  • [Presentation] Device characteristics of strain-engineered AlGaInN/GaN HEMTs on single-srystal AlN substrate2023

    • Author(s)
      T. Kawaide, S. Tanaka, A. Inoue, T. Egawa, M. Miyoshi
    • Organizer
      15th International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma 2023)
    • Related Report
      2022 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 単結晶AlN基板上AlGaInN/GaN HEMTの作製と特性評価2022

    • Author(s)
      田中 さくら、川出 智之、井上 暁喜、江川 孝志、三好 実人
    • Organizer
      電子情報通信学会 CPM/ED/LQE研究会
    • Related Report
      2022 Annual Research Report
  • [Presentation] AlGaInN/GaN HEMTs on single-crystal AlN substrate2022

    • Author(s)
      Sakura Tanaka, Tomoyuki Kawaide, Akiyoshi Inoue, Takashi Egawa, Makoto Miyoshi
    • Organizer
      International Workshop on Nitride Semiconductors 2022 (IWN 2022)
    • Related Report
      2022 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Fabrication and device characteristics of AlGaInN/GaN HEMTs on single-crystal AlN Substrate2022

    • Author(s)
      S. Tanaka, T. Kawaide, A. Inoue, T. Egawa, M. Miyoshi
    • Organizer
      14th Topical Workshop on Heterostructure Microelectronics (TWHM 2022)
    • Related Report
      2022 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 単結晶AlN基板上AlGaInN/GaN HEMTの作製と特性評価2022

    • Author(s)
      田中 さくら、井上 暁喜、川出 智之、江川 孝志、三好 実人
    • Organizer
      第69回応用物理学会春季学術講演会
    • Related Report
      2021 Annual Research Report
  • [Presentation] AlN/AlGaInNバリアを備えた高耐圧Al0.36Ga0.64NチャネルHFET2021

    • Author(s)
      井上 暁喜、田中 さくら、江川 孝志、三好 実人
    • Organizer
      電子情報通信学会 CPM/ED/LQE研究会
    • Related Report
      2021 Annual Research Report
  • [Presentation] 光電気化学エッチング法を用いたAlGaInN/AlGaN HFETの作製2021

    • Author(s)
      伊藤 滉朔、小松 祐斗、渡久地 政周、井上 暁喜、田中 さくら、三好 実人、佐藤 威友
    • Organizer
      電子情報通信学会 CPM/ED/LQE研究会
    • Related Report
      2021 Annual Research Report
  • [Presentation] 選択再成長オーミックコンタクトおよびAlNバリアを用いた四元混晶AlGaInN/Al0.36Ga0.64N HFETの作製と特性評価2021

    • Author(s)
      井上 暁喜、田中 さくら、江川 孝志、三好 実人
    • Organizer
      第82回応用物理学会秋季学術講演会
    • Related Report
      2021 Annual Research Report
  • [Presentation] High-breakdown-voltage Al0.36Ga0.64N-channel HFETs with a dual AlN/AlGaInN barrier layer and selective-area regrowth ohmic contacts2021

    • Author(s)
      Akiyoshi Inoue, Sakura Tanaka, Takashi Egawa, Makoto Miyoshi
    • Organizer
      2021 International Conference on Solid State Devices and Materials (SSDM 2021)
    • Related Report
      2021 Annual Research Report
    • Int'l Joint Research
  • [Remarks] 名古屋工業大学 三好実人研究室のホームページ

    • URL

      https://miyoshi.web.nitech.ac.jp/index.html

    • Related Report
      2023 Annual Research Report

URL: 

Published: 2021-04-28   Modified: 2025-01-30  

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