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Study of a Strong FUF for Light Weight Authentication without Cryptography

Research Project

Project/Area Number 21K04201
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Review Section Basic Section 21060:Electron device and electronic equipment-related
Research InstitutionWaseda University

Principal Investigator

Shinohara Hirofumi  早稲田大学, 理工学術院(情報生産システム研究科・センター), 特任教授 (50531810)

Project Period (FY) 2021-04-01 – 2024-03-31
Project Status Completed (Fiscal Year 2023)
Budget Amount *help
¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2023: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2022: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2021: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
KeywordsストロングPUF / 機械学習攻撃 / モデリング攻撃 / ビットエラー率 / 認証 / ハードウェアセキュリティ / PUF / IoTセキュリティ
Outline of Research at the Start

ストロングPUFは複製不能関数PUFの一分類で、それ自身で実質無尽蔵のデバイス固有のチェレンジレスポンスペアを生成できる。このため暗号を用いない軽量認証が期待されている。しかし、a)機械学習によるモデリング攻撃耐性が低い b)ビットエラー率が高い c)消費エネルギーと処理サイクル数が多い と言った課題がある。
参照テーブルの組み合わせから成る独自アーキテクチャの改良、ならびにホットキャリア注入に適した回路技術開発により、a)b)を解決したうえで、c)を削減して従来の暗号を用いた方法を凌ぐ低エネルギーで高速な認証を実現する。これにより、IoTセキュリティの向上に貢献する。

Outline of Final Research Achievements

Strong PUFs are researched for low energy consumption and fast authentication of connected things. Based on the SPN architecture proposed by a group of primary researchor of this project, techniques of response accumulation, blending, additional rounds are newly developed. And response bit width is extended from conventional 1bit to 5bit and as large as 100bit.
Experimental results demonstrated world record machine learning attack resiliency of 40million CRP learning and 1billion bit learning. Energy consumption of 2.17pJ/bit and throughput of 3.7bit/cycle far exceeded those of previous works. To solve bit error problem, hot carrier injection stabilization has been applied. And zero-bit error (error rate<2E-8) was fist achieved as a strong PUF.

Academic Significance and Societal Importance of the Research Achievements

ストロングPUFはそれ自体で実質無尽蔵のレスポンスを生成できることから認証などのセキュリティ応用が期待されていたが、機械学習攻撃耐性が低いこととビットエラー率が高いことが大きな壁となっていた。本研究ではその両方を解決したことと、レスポンス出力を従来の1ビットから一気に100ビットまで広めることに成功した点に、高い学術的意義がある。
本研究成果により、暗号を必要としない低消費エネルギーで高速なIoTに適した認証の可能性が示された。セキュリティ向上に寄与する社会的意義は大きい。

Report

(3 results)
  • 2023 Final Research Report ( PDF )
  • 2022 Research-status Report
  • 2021 Research-status Report
  • Research Products

    (5 results)

All 2023 2022 2021

All Journal Article (1 results) (of which Int'l Joint Research: 1 results,  Peer Reviewed: 1 results) Presentation (4 results) (of which Int'l Joint Research: 4 results)

  • [Journal Article] A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement2021

    • Author(s)
      Liu Kunyang、Chen Xinpeng、Pu Hongliang、Shinohara Hirofumi
    • Journal Title

      IEEE Journal of Solid-State Circuits

      Volume: 56 Issue: 7 Pages: 2193-2204

    • DOI

      10.1109/jssc.2020.3035207

    • Related Report
      2021 Research-status Report
    • Peer Reviewed / Int'l Joint Research
  • [Presentation] Vss-Bias-Based Measurement of Random Telegraph Noise in Hybrid SRAM PUF after Hot Carrier Injection Burn-In2023

    • Author(s)
      Kunyang Liu, Yichen Tang, Shufan Xu, and Hirofumi Shinohara
    • Organizer
      2023 IEEE Int. Conf. Microelectronic Test Structures (ICMTS)
    • Related Report
      2022 Research-status Report
    • Int'l Joint Research
  • [Presentation] Effect of Quadruple Size Transistor on SRAM Physically Unclonable Function Stabilized by Hot Carrier Injection2023

    • Author(s)
      Shufan Xu, Kunyang Liu, Yichen Tang, Ruilin Zhang, and Hirofumi Shinohara
    • Organizer
      2023 IEEE Int. Conf. Microelectronic Test Structures (ICMTS)
    • Related Report
      2022 Research-status Report
    • Int'l Joint Research
  • [Presentation] A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance2023

    • Author(s)
      Kunyang Liu, Gen Li, Zihan Fu, Xuanzhen Wang, and Hirofumi Shinohara
    • Organizer
      IEEE, 48th Europian Solid state Circuits Conference (ESSCIRC)
    • Related Report
      2022 Research-status Report
    • Int'l Joint Research
  • [Presentation] Statistical Modeling of SRAM PUF Cell Mismatch Shift Distribution After Hot Carrier Injection Burn-In2022

    • Author(s)
      Kunyang Liu, Kiyoshi Takeuchi, and Hirofumi Shinohara
    • Organizer
      2022 IEEE International conference on Microelectronics Test Structures (ICMTS)
    • Related Report
      2021 Research-status Report
    • Int'l Joint Research

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Published: 2021-04-28   Modified: 2025-01-30  

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