| Budget Amount *help |
¥6,500,000 (Direct Cost: ¥5,000,000、Indirect Cost: ¥1,500,000)
Fiscal Year 2012: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2011: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2010: ¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
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| Research Abstract |
There are two major problems in LSI testing, namely decreasing test yield due to excessive delay along sensitized paths and decreasing test quality due to inadequate delay along sensitized paths. In this research, a novel scheme has been established, which dynamically adjusts regional power dissipation in the neighborhood of sensitized paths to minimize its impact on test yield and test quality. This scheme of power adjustment testing is expected to contribute to higher test yield and better test quality.
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