Development ofhigh-angle triple-axis specimen holders for spherical aberration-corrected electron microscopes
Project/Area Number |
22310068
|
Research Category |
Grant-in-Aid for Scientific Research (B)
|
Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Nanomaterials/Nanobioscience
|
Research Institution | Kyushu University |
Principal Investigator |
HATA Satoshi 九州大学, 総合理工学研究院, 准教授 (60264107)
|
Co-Investigator(Renkei-kenkyūsha) |
MITSUHARA Masatoshi 九州大学, 大学院・総合理工学研究院, 助教 (10514218)
IKEDA Ken-ichi 九州大学, 大学院・総合理工学研究院, 助教 (20335996)
NAKASHIMA Hidaharu 九州大学, 大学院・総合理工学研究院, 教授 (80180280)
|
Project Period (FY) |
2010 – 2012
|
Project Status |
Completed (Fiscal Year 2012)
|
Budget Amount *help |
¥17,680,000 (Direct Cost: ¥13,600,000、Indirect Cost: ¥4,080,000)
Fiscal Year 2012: ¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2011: ¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2010: ¥8,580,000 (Direct Cost: ¥6,600,000、Indirect Cost: ¥1,980,000)
|
Keywords | 3次元観察 / トモグラフィー / 球面収差補整 / 試料ホルダー / 電子顕微鏡 / 球面収差補正 / 3次元観察 / 原子分解能観察 / 試料ドリフト / 転位 / 回折 |
Research Abstract |
A high-angle triple-axis specimen holder capable of high-resolution three-dimensional (3D) transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) has been developed. This specimen holder can align a spherical aberration-corrected lens system without exchanging specimens. This function is effective for reducing influences of thermal-drift and magnetism of magnetic samples.
|
Report
(4 results)
Research Products
(54 results)
-
[Journal Article] Microscopic role of carbon on MgB2 wire for critical current density comparable to NbTi2012
Author(s)
J. H. Kim, S. Oh, Y.-U. Heo, S. Hata, H. Kumakura, A. Matsumoto, M. Mitsuhara, S. Choi, Y. Shimada, M. Maeda, J. L. MacManus-Driscoll, S. X. Dou
-
Journal Title
NPG Asia Materials
Volume: 4
Issue: 1
Pages: e3-e3
DOI
Related Report
Peer Reviewed
-
-
-
-
-
-
-
-
-
-
-
-
-
[Presentation] Fitting tomography-based transmission electron microscopy (TEM) to structural material problems: toward effective 3D TEM imaging and analysis2012
Author(s)
S. Hata, R. Akiyoshi, K. Ogata, M. Mitsuhara, K. Ikeda, H. Nakashima, S. Matsumura, M. Doi, M. Murayama
Organizer
NIMS Conference 2012, Structural Materials Science and Strategy for Sustainability -Back to the Basics-
Place of Presentation
Epochal Tsukuba, Tsukuba, Ibaraki, Japan
Year and Date
2012-06-05
Related Report
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
[Presentation] Three-dimensional microstructural observation in crystalline materials by transmission electron microscopy2010
Author(s)
S. Hata, M. Mitsuhara, T. Kawai, K. Ogata, K. Ikeda, H. Nakashima, M. Nishida, S. Matsumura, T. Daio, M. Doi, H. Miyazaki
Organizer
MRS Fall Meeting 2010
Place of Presentation
Boston, USA
Year and Date
2010-12-02
Related Report
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-