| Budget Amount *help |
¥19,370,000 (Direct Cost: ¥14,900,000、Indirect Cost: ¥4,470,000)
Fiscal Year 2012: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
Fiscal Year 2011: ¥3,640,000 (Direct Cost: ¥2,800,000、Indirect Cost: ¥840,000)
Fiscal Year 2010: ¥13,260,000 (Direct Cost: ¥10,200,000、Indirect Cost: ¥3,060,000)
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| Research Abstract |
A new method for obtaining the interface structure of ultra-thin films on substrates from the analysis of X-Ray CTR scattering has been developed with a holographic method and iterative phase retrieval methods. In the method, inter-atomic layer distances, electron density and its distribution in each atomic layer are obtained for ultra-thin films on substrate. The results give valuable information on electronic states and crystal growth mechanisms.
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