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Precision cutting of metal by the newly tools with the Schottky contact

Research Project

Project/Area Number 22360061
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Production engineering/Processing studies
Research InstitutionNagoya Institute of Technology

Principal Investigator

ERYU Osamu  名古屋工業大学, 工学研究科, 教授 (10223679)

Project Period (FY) 2010 – 2012
Project Status Completed (Fiscal Year 2012)
Budget Amount *help
¥18,850,000 (Direct Cost: ¥14,500,000、Indirect Cost: ¥4,350,000)
Fiscal Year 2012: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2011: ¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2010: ¥12,870,000 (Direct Cost: ¥9,900,000、Indirect Cost: ¥2,970,000)
Keywords切削・研削加工 / 元素ドーピング / 刃物センサ / 切削加工 / 単結晶刀具 / ショットキー接触 / SiC
Research Abstract

The result is classified roughly into two kinds of follows.
1: I checked a doping element effect for single-crystal SiC production for knives. I have doped pure titanium or pure aluminum at the time of crystal growth. A purpose is to reduce the cleavage of the crystal.
1-1 Titanium doping: There becomes extremely little cleavage. On the other hand, the tool became easy to be worn.
1-2 Iron doping: Restraint of the cleavage of the tool is not enough. However, the knife is hard to perform cleavage in comparison with the single crystal which I do not dope. The crystal was made foil with a diamond wire. Processing distorted layer was 10 microns of SiC. On the other hand, processing distorted layer more than 3 times is formed of the non-dopod crystal. Iron is one of the doping elements which is appropriate as a blade tool. The function of the sensor for processing was incorporated in SiC tool.
2: The point of a tool got the function of the processing sensor. Specifically, I formed Schottky electrode on SiC and formed ohmic electrode to a pedestal. I utilized the piezoelectric nature of SiC and detected stress to occur on the point of a tool at the time of processing as an electrical signal. The output signal changes according to cut thickness. However, quantity of signal and the correlation of the processing depth are not provided. It is cited in the main cause that the motor noise of the processingmachine overlaps with the output signal of the sensor. I try the output signal takeoff using lock in amplifiers. Because the pedestal is metal, the formation of the ohmic electrode is easy. On the other hand, I think that the linear nature as the sensor was not provided because I was not able to get ohmic electrode in the silicon carbide side. The doping of the iron greatly changed an electronic property of SiC. The development of the ohmic electrode formation technology for SiC where iron was doped is necessary.

Report

(4 results)
  • 2012 Annual Research Report   Final Research Report ( PDF )
  • 2011 Annual Research Report
  • 2010 Annual Research Report
  • Research Products

    (17 results)

All 2012 2011 2010 Other

All Journal Article (1 results) Presentation (11 results) (of which Invited: 1 results) Book (2 results) Remarks (3 results)

  • [Journal Article] The atomic step induced by off angle CMP influences the electrical properties of the SiC surface2012

    • Author(s)
      Yayoi Tanaka, Takao Kanda, Kazuyuki Nagatoshi, Masamiichi Yoshimura and Osamu Eryu
    • Journal Title

      Silicon Carbide and Related Materials 2011

      Volume: Part 1 Pages: 569-572

    • Related Report
      2012 Final Research Report
  • [Presentation] SiCの加工技術2012

    • Author(s)
      江龍 修
    • Organizer
      応用物理学会第21回SiC及び関連ワイドギャップ半導体研究会
    • Place of Presentation
      大阪市中央公会堂
    • Year and Date
      2012-11-20
    • Related Report
      2012 Final Research Report
  • [Presentation] 金属加工製品の上位価値を創成する工具イノベーション2012

    • Author(s)
      江龍 修
    • Organizer
      日本MOT学会
    • Place of Presentation
      名古屋工業大学
    • Year and Date
      2012-03-01
    • Related Report
      2012 Final Research Report 2011 Annual Research Report
  • [Presentation] SiCの加工技術2012

    • Author(s)
      江龍 修
    • Organizer
      応用物理学会第21回 SiC及び関連ワイドギャップ半導体研究会
    • Place of Presentation
      大阪市中央公会堂
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] 省エネルギー、省電力のための半導体デバイスの先端加工技術、半導体デバイス加工総論2011

    • Author(s)
      江龍 修
    • Organizer
      日本機械学会 招待講演
    • Place of Presentation
      日本機械学会会議室
    • Year and Date
      2011-08-03
    • Related Report
      2012 Final Research Report
  • [Presentation] 省エネルギー、省電力のための半導体デバイスの先端加工技術半導体デバイス加工総論2011

    • Author(s)
      江龍修
    • Organizer
      日本機械学会
    • Place of Presentation
      日本機械学会会議室(東京)(招待講演)
    • Year and Date
      2011-08-03
    • Related Report
      2011 Annual Research Report
  • [Presentation] SiC加工表面の非接触評価2011

    • Author(s)
      江龍 修
    • Organizer
      応用物理学会 表面分科会 招待講演
    • Place of Presentation
      京都テルサ 大会議室
    • Year and Date
      2011-06-23
    • Related Report
      2012 Final Research Report
  • [Presentation] SiC加工表面の非接触評価2011

    • Author(s)
      江龍修
    • Organizer
      応用物理学会
    • Place of Presentation
      京都テルサ大会議室(招待講演)
    • Year and Date
      2011-06-23
    • Related Report
      2011 Annual Research Report
  • [Presentation] パワーデバイス用SiCの最先端研磨技術とその評価技術2010

    • Author(s)
      江龍 修
    • Organizer
      砥粒加工学会招待講演
    • Place of Presentation
      ニコン相模原製作所
    • Year and Date
      2010-12-08
    • Related Report
      2012 Final Research Report
  • [Presentation] パワーデバイス用SiCの最先端研磨技術とその評価技術2010

    • Author(s)
      江龍修
    • Organizer
      砥粒加工学会
    • Place of Presentation
      ニコン相模原製作所
    • Year and Date
      2010-12-08
    • Related Report
      2010 Annual Research Report
  • [Presentation] SiCの研磨技術一原子・電子から見た表面2010

    • Author(s)
      江龍 修
    • Organizer
      砥粒加工学会 招待講演
    • Place of Presentation
      新東工業(株)豊川製作所
    • Year and Date
      2010-10-15
    • Related Report
      2012 Final Research Report
  • [Presentation] SiCの研磨技術-原子・電子から見た表面2010

    • Author(s)
      江龍修
    • Organizer
      砥粒加工学会
    • Place of Presentation
      新東工業(株)豊川製作所
    • Year and Date
      2010-10-15
    • Related Report
      2010 Annual Research Report
  • [Book] SiCパワーデバイス最新技術2010

    • Author(s)
      分担執筆江龍修他34名
    • Total Pages
      314
    • Related Report
      2012 Final Research Report
  • [Book] SiCパワーデバイス最新技術2010

    • Author(s)
      江龍修, 他34名
    • Total Pages
      314
    • Publisher
      サイエンス&テクノロジー
    • Related Report
      2010 Annual Research Report
  • [Remarks] 研究協力者 企業ホームページ

    • URL

      http://www.chubu.meti.go.jp/koho/kigyo/20091225monodukuri.Htm

    • Related Report
      2012 Final Research Report
  • [Remarks]

    • URL

      http://ioncafe.web.nitech.ac.jp/achievement2011.html

    • Related Report
      2011 Annual Research Report
  • [Remarks] 研究成果物であるSiC単結晶を活用した刃物に関して、第25回日本国際工作機械見本市(JIMTOF2010)にて現状展示による経過報告と研究のポスター発表を行った

    • Related Report
      2010 Annual Research Report

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Published: 2010-08-23   Modified: 2019-07-29  

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