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Acceleration of Timing Analysis using Monte Carlo Methods

Research Project

Project/Area Number 22360143
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electron device/Electronic equipment
Research InstitutionKyoto University

Principal Investigator

SATO Takashi  京都大学, 大学院・情報学研究科, 教授 (20431992)

Co-Investigator(Kenkyū-buntansha) OCHI Hiroyuki  京都大学, 大学院・情報学研究科, 准教授 (40264957)
TSUTSUI Hiroshi  京都大学, 大学院・情報学研究科, 助教 (30402803)
Project Period (FY) 2010 – 2012
Project Status Completed (Fiscal Year 2012)
Budget Amount *help
¥18,850,000 (Direct Cost: ¥14,500,000、Indirect Cost: ¥4,350,000)
Fiscal Year 2012: ¥5,590,000 (Direct Cost: ¥4,300,000、Indirect Cost: ¥1,290,000)
Fiscal Year 2011: ¥5,720,000 (Direct Cost: ¥4,400,000、Indirect Cost: ¥1,320,000)
Fiscal Year 2010: ¥7,540,000 (Direct Cost: ¥5,800,000、Indirect Cost: ¥1,740,000)
Keywords集積回路設計技術 / CAD / タイミング解析 / モンテカルロ法 / 集積回路設計 / 電子回路CAD
Research Abstract

Timing constraint is one of the most important objectives in advanced integrated circuit design. In this project, acceleration of the timing analysis is studied. Based on the measurements on test-chips, variability- and degradation-aware device models have been first proposed to accurately handle timing information of miniaturized devices. A new algorithm of timing analysis has then been implemented on a hardware, thorough which by more than ten times acceleration has been achieved while maintaining advantages of Monte Carlo based methods that can handle arbitrary delay distribution.

Report

(4 results)
  • 2012 Annual Research Report   Final Research Report ( PDF )
  • 2011 Annual Research Report
  • 2010 Annual Research Report
  • Research Products

    (77 results)

All 2013 2012 2011 2010

All Journal Article (8 results) (of which Peer Reviewed: 8 results) Presentation (69 results)

  • [Journal Article] Parallel Acceleration Scheme for Monte Carlo Based SSTA Using Generalized STA Processing Element2013

    • Author(s)
      Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi and Takashi Sato
    • Journal Title

      IEICE Transactions on Electronics

      Volume: E96.C Issue: 4 Pages: 473-481

    • DOI

      10.1587/transele.E96.C.473

    • NAID

      10031182823

    • ISSN
      0916-8524, 1745-1353
    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Device-Parameter Estimation through IDDQ Signatures2013

    • Author(s)
      Michihiro Shintani and Takashi Sato
    • Journal Title

      IEICE Transactions on Information and Systems

      Volume: E96.D Issue: 2 Pages: 303-313

    • DOI

      10.1587/transinf.E96.D.303

    • NAID

      10031167410

    • ISSN
      0916-8532, 1745-1361
    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] A Cost-Effective Selective TMR for Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis2013

    • Author(s)
      Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi and Takashi Sato
    • Journal Title

      IEICE Transactions on Electronics

      Volume: E96.C Issue: 4 Pages: 454-462

    • DOI

      10.1587/transele.E96.C.454

    • NAID

      10031182821

    • ISSN
      0916-8524, 1745-1353
    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Power Distribution Network Optimization for Timing Improvement with Statistical Noise Model and Timing Analysis2012

    • Author(s)
      Takashi Enami, Takashi Sato, and Masanori Hashimoto
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: E95.A Issue: 12 Pages: 2261-2271

    • DOI

      10.1587/transfun.E95.A.2261

    • NAID

      10031161360

    • ISSN
      0916-8508, 1745-1337
    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method2012

    • Author(s)
      Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: E95.A Issue: 12 Pages: 2272-2283

    • DOI

      10.1587/transfun.E95.A.2272

    • NAID

      10031161361

    • ISSN
      0916-8508, 1745-1337
    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] A Variability-Aware Energy-Minimization Strategy for Subthreshold Circuits2012

    • Author(s)
      Junya Kawashima, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: E95.A Issue: 12 Pages: 2242-2250

    • DOI

      10.1587/transfun.E95.A.2242

    • NAID

      10031161358

    • ISSN
      0916-8508, 1745-1337
    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Linear time calculation of on-chip power distribution network capacitance considering state-dependence2010

    • Author(s)
      Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato
    • Journal Title

      IEICE Transactions of Fundamentals on Electronics, Communications and Computer Sciences

      Volume: Vol.E93-A, No.12 Pages: 2409-2416

    • NAID

      120005323043

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Reliability evaluation environment for exploring design space of coarse-grained reconfigurable architectures2010

    • Author(s)
      Takashi Imagawa, Masayuki Hiromoto, Hiroyuki Ochi, Takashi Sato
    • Journal Title

      IEICE Transactions of Fundamentals on Electronics, Communications and Computer Sciences

      Volume: Vol.E93-A, No.12 Pages: 2524-2532

    • NAID

      10027985803

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Presentation] A Bayesian-Based Process Parameter Estimation using IDDQ Current Signature2013

    • Author(s)
      Michihiro Shintani and Takashi Sato
    • Organizer
      IEEE VLSI Test Symposium (VTS)
    • Place of Presentation
      Hyatt Maui, Hawaii, USA
    • Year and Date
      2013-04-23
    • Related Report
      2012 Final Research Report
  • [Presentation] 回路構造の異なるラッチの消費エネルギーの比較2013

    • Author(s)
      藤田 隆史, 筒井 弘, 越智 裕之, 佐藤高史
    • Organizer
      電子情報通信学会総合大会
    • Place of Presentation
      岐阜大学,岐阜市
    • Year and Date
      2013-03-19
    • Related Report
      2012 Final Research Report
  • [Presentation] Evaluation of dependent node selection of histogram propagation based statistical timing analysis2013

    • Author(s)
      Shiyi Zhang, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      電子情報通信学会総合大会
    • Place of Presentation
      岐阜大学,岐阜市
    • Year and Date
      2013-03-19
    • Related Report
      2012 Final Research Report
  • [Presentation] Multi-Trap RTN Parameter Extraction Based on Bayesian Inference2013

    • Author(s)
      Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      International Symposium on Quality Electrical Design (ISQED) (Techmart Center
    • Place of Presentation
      Santa Clara, USA
    • Year and Date
      2013-03-06
    • Related Report
      2012 Final Research Report
  • [Presentation] オンラインテストを指向したIDDQ電流しきい値決定手法の検討2013

    • Author(s)
      Santa Clara, USA
    • Organizer
      電子情報通信学会 VLSI設計技術研究会
    • Place of Presentation
      沖縄青年会館,那覇市
    • Year and Date
      2013-03-04
    • Related Report
      2012 Final Research Report
  • [Presentation] An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation2013

    • Author(s)
      Michihiro Shintani and Takashi Sato
    • Organizer
      ACM/IEEE Asia South Pacific Design Automation Conference (ASP-DAC)
    • Place of Presentation
      Pacifico Yokohama, Yokohama, Japan
    • Year and Date
      2013-01-25
    • Related Report
      2012 Final Research Report
  • [Presentation] Realization of frequency-domain circuit analysis through random walk2013

    • Author(s)
      Tetsuro Miyakawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC)
    • Place of Presentation
      Pacifico Yokohama, Yokohama
    • Related Report
      2012 Annual Research Report
  • [Presentation] An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation2013

    • Author(s)
      Michihiro Shintani and Takashi Sato
    • Organizer
      ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC)
    • Place of Presentation
      Pacifico Yokohama, Yokohama
    • Related Report
      2012 Annual Research Report
  • [Presentation] オンラインテストを指向したIDDQ電流しきい値決定手法の検討2013

    • Author(s)
      新谷 道弘, 佐藤 高史
    • Organizer
      電子情報通信学会 VLSI設計技術研究会
    • Place of Presentation
      沖縄青年会館,那覇市
    • Related Report
      2012 Annual Research Report
  • [Presentation] Multi-trap RTN parameter extraction based on Bayesian inference2013

    • Author(s)
      Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      International Symposium on Quality Electronic Design (ISQED)
    • Place of Presentation
      Techmart Center, Santa Clara, USA
    • Related Report
      2012 Annual Research Report
  • [Presentation] ランダムウォーク線形回路解析のスレッド並列化における電圧源化排他制御の検討2013

    • Author(s)
      岡崎 剛, 筒井 弘, 越智 裕之, 佐藤 高史
    • Organizer
      電子情報通信学会 総合大会
    • Place of Presentation
      岐阜大学,岐阜市
    • Related Report
      2012 Annual Research Report
  • [Presentation] Evaluation of dependent node selection of histogram propagation based statistical timing analysis2013

    • Author(s)
      Shiyi Zhang, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      電子情報通信学会 総合大会
    • Place of Presentation
      岐阜大学,岐阜市
    • Related Report
      2012 Annual Research Report
  • [Presentation] 回路構造の異なるラッチの消費エネルギーの比較2013

    • Author(s)
      藤田 隆史, 筒井 弘, 越智 裕之, 佐藤 高史
    • Organizer
      電子情報通信学会 総合大会
    • Place of Presentation
      岐阜大学,岐阜市
    • Related Report
      2012 Annual Research Report
  • [Presentation] チップ試作による最小動作電圧予測手法の評価2012

    • Author(s)
      川島 潤也, 筒井 弘, 越智 裕之, 佐藤高史
    • Organizer
      電子情報通信学会 ICD研究会
    • Place of Presentation
      東京工業大学大岡山キャンパス 東工大大蔵前会館ロイアルブルーホール,東京都
    • Year and Date
      2012-12-17
    • Related Report
      2012 Final Research Report
  • [Presentation] Accurate I/O Buffer Impedance Self-Adjustment using Vth and Temperature Sensors2012

    • Author(s)
      Zhi Li, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      デザインガイア
    • Place of Presentation
      九州大学医学部百年講堂,福岡市
    • Year and Date
      2012-11-27
    • Related Report
      2012 Final Research Report
  • [Presentation] 情報量規準を用いるRTNモデルパラメータ推定の自動化2012

    • Author(s)
      清水 裕史, 筒井 弘, 越智 裕之, 佐藤高史
    • Organizer
      DAシンポジウム
    • Place of Presentation
      ホテル下呂温泉水明館,下呂市
    • Year and Date
      2012-08-29
    • Related Report
      2012 Final Research Report
  • [Presentation] 回路の最小動作電圧改善とその予測精度向上の一検討2012

    • Author(s)
      川島 潤也, 越智 裕之, 筒井 弘, 佐藤高史
    • Organizer
      第25回回路とシステムワークショップ
    • Place of Presentation
      淡路夢舞台国際会議場,淡路市
    • Year and Date
      2012-07-31
    • Related Report
      2012 Final Research Report
  • [Presentation] Physics Matters: Statistical Aging Prediction Under Trapping/detrapping2012

    • Author(s)
      Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
    • Organizer
      ACM/IEEE Design Automation Conference (DAC)
    • Place of Presentation
      Moscone Center, San Francisco, USA
    • Year and Date
      2012-06-05
    • Related Report
      2012 Final Research Report
  • [Presentation] Statistical Observations of NBTI-Induced Threshold Voltage Shifts on Small Channel-Area Devices2012

    • Author(s)
      Takashi Sato, Hiromitsu Awano, Hirofumi Shimizu, Hiroshi Tsutsui, Hiroyuki Ochi
    • Organizer
      International Symposium on Quality Electrical Design (ISQED)
    • Place of Presentation
      Santa Clara, CA USA
    • Year and Date
      2012-03-20
    • Related Report
      2011 Annual Research Report
  • [Presentation] GPU Acceleration of Cycle-Based Soft-Error Simulation for Reconfigurable Array Architectures2012

    • Author(s)
      Takashi Imagawa, Takahiro Oue, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
    • Organizer
      the 17th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI2012)
    • Place of Presentation
      B-con Plaza, Beppu, Oita, Japan
    • Year and Date
      2012-03-08
    • Related Report
      2011 Annual Research Report
  • [Presentation] Hardware Architecture for Accelerating Monte Carlo Based SSTA using Generalized STA Processing Element2012

    • Author(s)
      Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
    • Organizer
      the 17th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI2012)
    • Place of Presentation
      B-con Plaza, Beppu, Oita, Japan
    • Year and Date
      2012-03-08
    • Related Report
      2011 Annual Research Report
  • [Presentation] IDDQ電流による大域プロセスばらつきの推定手法2012

    • Author(s)
      新谷道広, 佐藤高史
    • Organizer
      VLSI設計技術研究会(VLD)
    • Place of Presentation
      ビーコンプラザ(大分県)
    • Year and Date
      2012-03-06
    • Related Report
      2011 Annual Research Report
  • [Presentation] プロセスばらつき推定に基づくIDDQテスト良品判定基準決定の試み2012

    • Author(s)
      新谷道広, 佐藤高史
    • Organizer
      電子情報通信学会技術研究報告(ディペンダブルコンピューティング研究会)
    • Place of Presentation
      機械振興会館(東京都)
    • Year and Date
      2012-02-13
    • Related Report
      2011 Annual Research Report
  • [Presentation] Acceleration Scheme for Monte Carlo Based SSTA using Generalized STA Processing Element2012

    • Author(s)
      Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      ACM/IEEE International Workshop on Timing Issues (TAU)
    • Place of Presentation
      National Taiwan University, Taipei, Taiwan
    • Year and Date
      2012-01-18
    • Related Report
      2012 Final Research Report
  • [Presentation] Acceleration Scheme for Monte Carlo Based SSTA using Generalized STA Processing Element2012

    • Author(s)
      Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
    • Organizer
      ACM/IEEE International Workshop on Timing Issues (TAU)
    • Place of Presentation
      Taipei, Taiwan
    • Year and Date
      2012-01-18
    • Related Report
      2011 Annual Research Report
  • [Presentation] Statistical Aging Under Dynamic Voltage Scaling: a Logarithmic Model Approach2012

    • Author(s)
      Jyothi Bhaskarr Velamala, Ketul B. Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, and Yu Cao
    • Organizer
      IEEE Custom Integrated Circuits Conference (CICC)
    • Place of Presentation
      DoubleTree Hotel, San Jose, USA
    • Related Report
      2012 Final Research Report
  • [Presentation] Aging Statistics Based on Trapping/detrapping: Silicon Evidence, Modeling and Prediction2012

    • Author(s)
      Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
    • Organizer
      IEEE International Reliability Physics Symposium
    • Place of Presentation
      Hyatt Regency Orange County, Anaheim, USA
    • Related Report
      2012 Final Research Report
  • [Presentation] Aging statistics based on trapping/detrapping: silicon evidence, modeling and long-term prediction2012

    • Author(s)
      Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
    • Organizer
      IEEE International Reliability Physics Symposium (IRPS)
    • Place of Presentation
      Hyatt Regency Orange County, Anaheim, USA
    • Related Report
      2012 Annual Research Report
  • [Presentation] A Bayesian-based process parameter estimation using IDDQ current signature2012

    • Author(s)
      Michihiro Shintani and Takashi Sato
    • Organizer
      IEEE VLSI test symposium (VTS)
    • Place of Presentation
      Hyatt Maui, Hawaii, USA
    • Related Report
      2012 Annual Research Report
  • [Presentation] Physics matters: statistical aging prediction under trapping/detrapping2012

    • Author(s)
      Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao
    • Organizer
      ACM/IEEE Design Automation Conference (DAC)
    • Place of Presentation
      Moscone Center, San Francisco, USA
    • Related Report
      2012 Annual Research Report
  • [Presentation] 回路の最小動作電圧改善とその予測精度向上の一検討2012

    • Author(s)
      川島 潤也, 越智 裕之, 筒井 弘, 佐藤 高史
    • Organizer
      回路とシステムワークショップ
    • Place of Presentation
      淡路夢舞台国際会議場,淡路市
    • Related Report
      2012 Annual Research Report
  • [Presentation] クリロフ部分空間法を用いた電源回路網解析の GPU 実装による高速化2012

    • Author(s)
      森下 拓海, 筒井 弘, 越智 裕之, 佐藤 高史
    • Organizer
      回路とシステムワークショップ
    • Place of Presentation
      淡路夢舞台国際会議場,淡路市
    • Related Report
      2012 Annual Research Report
  • [Presentation] 情報量規準を用いる RTN モデルパラメータ推定の自動化2012

    • Author(s)
      清水裕史, 筒井弘, 越智裕之, 佐藤高史
    • Organizer
      DA シンポジウム
    • Place of Presentation
      ホテル下呂温泉水明館,下呂市
    • Related Report
      2012 Annual Research Report
  • [Presentation] Statistical Aging under dynamic voltage scaling: A logarithmic model approach2012

    • Author(s)
      Jyothi Bhaskarr Velamala, Ketul B. Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato and Yu Cao
    • Organizer
      IEEE Custom Integrated Circuits Conference (CICC)
    • Place of Presentation
      DoubleTree Hotel San Jose, San Jose, USA
    • Related Report
      2012 Annual Research Report
  • [Presentation] Accurate I/O Buffer Impedance Self-Adjustment using Vth and Temperature Sensors2012

    • Author(s)
      Zhi Li, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      デザインガイア
    • Place of Presentation
      九州大学医学部百年講堂,福岡市
    • Related Report
      2012 Annual Research Report
  • [Presentation] チップ試作による最小動作電圧予測手法の評価2012

    • Author(s)
      川島 潤也, 筒井 弘, 越智 裕之, 佐藤 高史
    • Organizer
      電子情報通信学会 ICD研究会
    • Place of Presentation
      東京工業大学大岡山キャンパス 東工大蔵前会館ロイアルブルーホール ,東京都
    • Related Report
      2012 Annual Research Report
  • [Presentation] ランダムテレグラフノイズモデル化のためのパラメータ推定法の検討2011

    • Author(s)
      粟野皓光, 清水裕史, 筒井弘, 越智裕之, 佐藤高史
    • Organizer
      電子情報通信学会技術研究報告(デザインガイア2011-VLSI設計の新しい大地-)
    • Place of Presentation
      ニューウェルシティ宮崎(宮崎県)
    • Year and Date
      2011-11-28
    • Related Report
      2011 Annual Research Report
  • [Presentation] ゼロ分散推定重点的サンプリングを用いたランダムウォークによる線形回路の過渡解析2011

    • Author(s)
      宮川哲朗, 筒井弘, 越智裕之, 佐藤高史
    • Organizer
      電子情報通信学会技術研究報告(デザインガイア2011-VLSI設計の新しい大地-)
    • Place of Presentation
      ニューウェルシティ宮崎(宮崎県)
    • Year and Date
      2011-11-28
    • Related Report
      2011 Annual Research Report
  • [Presentation] ブロック反復法による電源回路網解析の高速化2011

    • Author(s)
      森下拓海, 筒井弘, 越智裕之, 佐藤高史
    • Organizer
      電子情報通信学会技術研究報告(デザインガイア2011-VLSI設計の新しい大地-)
    • Place of Presentation
      ニューウェルシティ宮崎(宮崎県)
    • Year and Date
      2011-11-28
    • Related Report
      2011 Annual Research Report
  • [Presentation] A transistor-array for parallel BTI-effects measurements2011

    • Author(s)
      Takumi Uezono, Tadamichi Kozaki, Hiroyuki Ochi, Takashi Sato
    • Organizer
      Workshop on variability modeling and characterization (VMC)
    • Place of Presentation
      San Jose, USA
    • Year and Date
      2011-11-11
    • Related Report
      2010 Annual Research Report
  • [Presentation] Statistical Aging Prediction and Characterization using Trapping/detrapping Based NBTI Models2011

    • Author(s)
      Jyothi Bhaskarr Velamala, Takashi Sato, and Yu Cao
    • Organizer
      Workshop on Variability Modeling and Characterization (VMC)
    • Place of Presentation
      DoubleTree Hotel, San Jose, USA
    • Year and Date
      2011-11-10
    • Related Report
      2012 Final Research Report
  • [Presentation] Getting the Most Out of IDDQ Testing2011

    • Author(s)
      Michihiro Shintani, Takashi Sato
    • Organizer
      Workshop on Variability Modeling and Characterization (VMC)
    • Place of Presentation
      San Jose, CA USA
    • Year and Date
      2011-11-10
    • Related Report
      2011 Annual Research Report
  • [Presentation] Statistical Aging Prediction and Characterization using Trapping/detrapping Based NBTI Models2011

    • Author(s)
      Jyothi Bhaskarr Velamala, Takashi Sato, Yu Cao
    • Organizer
      Workshop on Variability Modeling and Characterization (VMC)
    • Place of Presentation
      San Jose, CA USA
    • Year and Date
      2011-11-10
    • Related Report
      2011 Annual Research Report
  • [Presentation] A Design Strategy for Sub-Threshold Circuits Considering Energy-Minimization and Yield-Maximization2011

    • Author(s)
      Junya Kawashima, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      IEEE International SOC Conference (SOCC)
    • Place of Presentation
      Grand Hotel, Taipei, Taiwan
    • Year and Date
      2011-09-26
    • Related Report
      2012 Final Research Report
  • [Presentation] A Design Strategy for Sub-Threshold Circuits Considering Energy-Minimization and Yield-Maximization2011

    • Author(s)
      Junya Kawashima, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
    • Organizer
      IEEE International SOC Conference (SOCC)
    • Place of Presentation
      Taipei, Taiwan
    • Year and Date
      2011-09-26
    • Related Report
      2011 Annual Research Report
  • [Presentation] A Sensor-Based Self-Adjustment Approach for Controlling I/O Buffer Impedance2011

    • Author(s)
      Zhi Li, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
    • Organizer
      IEICE Society Conference
    • Place of Presentation
      Hokkaido University, Sapporo Campus
    • Year and Date
      2011-09-15
    • Related Report
      2011 Annual Research Report
  • [Presentation] ヤコビ法を用いた電源回路網解析のGPU実装2011

    • Author(s)
      森下拓海, 筒井弘, 越智裕之, 佐藤高史
    • Organizer
      電子情報通信学会ソサイエティ大会
    • Place of Presentation
      北海道大学,札幌キャンパス
    • Year and Date
      2011-09-15
    • Related Report
      2011 Annual Research Report
  • [Presentation] EM法によるMOSデバイス界面状態数の自動推定2011

    • Author(s)
      清水 裕史, 筒井 弘, 越智 裕之, 佐藤高史
    • Organizer
      電子情報通信学会 ソサイエティ大会
    • Place of Presentation
      北海道大学,札幌市
    • Year and Date
      2011-09-13
    • Related Report
      2012 Final Research Report
  • [Presentation] A Device Array for Efficient Bias-Temperature Instability Measurements2011

    • Author(s)
      Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, a nd Hiroyuki Ochi
    • Organizer
      European Solid-State Device Research Conference (ESSDERC)
    • Place of Presentation
      Finlandia Hall, Helsinki, Finland
    • Year and Date
      2011-09-13
    • Related Report
      2012 Final Research Report
  • [Presentation] EM法によるMOSデバイス界面状態数の自動推定2011

    • Author(s)
      清水裕史, 筒井弘, 越智裕之, 佐藤高史
    • Organizer
      電子情報通信学会ソサイエティ大会
    • Place of Presentation
      北海道大学,札幌キャンパス
    • Year and Date
      2011-09-13
    • Related Report
      2011 Annual Research Report
  • [Presentation] A Device Array for Efficient Bias-Temperature Instability Measurements2011

    • Author(s)
      Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, Hiroyuki Ochi
    • Organizer
      European Solid-State Device Research Conference (ESSDERC)
    • Place of Presentation
      Helsinki, Finland
    • Year and Date
      2011-09-13
    • Related Report
      2011 Annual Research Report
  • [Presentation] 配線資源の信頼性モデルを用いた粗粒度再構成可能アーキテクチャ向け選択的三重化の最適化手法2011

    • Author(s)
      今川隆司, 湯浅洋史, 筒井弘, 越智裕之, 佐藤高史
    • Organizer
      情報処理学会DAシンポジウム2011
    • Place of Presentation
      ホテル下呂温泉水明館(岐阜県)
    • Year and Date
      2011-09-01
    • Related Report
      2011 Annual Research Report
  • [Presentation] 複数不良領域を持つ回路歩留まり解析のための逐次重点的サンプリング法2011

    • Author(s)
      片山健太朗, 筒井弘, 越智裕之, 佐藤高史
    • Organizer
      情報処理学会DAシンポジウム2011
    • Place of Presentation
      ホテル下呂温泉水明館(岐阜県)
    • Year and Date
      2011-08-31
    • Related Report
      2011 Annual Research Report
  • [Presentation] エネルギー最小化と動作保証を考慮したサブスレッショルド回路の設計指針の検討2011

    • Author(s)
      川島 潤也, 越智 裕之, 筒井 弘, 佐藤高史
    • Organizer
      第24回回路とシステムワークショップ
    • Place of Presentation
      淡路夢舞台国際会議場,淡路市
    • Year and Date
      2011-08-02
    • Related Report
      2012 Final Research Report
  • [Presentation] エネルギー最小化と動作保証を考慮したサブスレッショルド回路の設計指針の検討2011

    • Author(s)
      川島潤也, 越智裕之, 筒井弘, 佐藤高史
    • Organizer
      第24回回路とシステムワークショップ
    • Place of Presentation
      淡路夢舞台国際会議場(兵庫県)
    • Year and Date
      2011-08-02
    • Related Report
      2011 Annual Research Report
  • [Presentation] A Stress-Parallelized Device Array for Efficient Bias-Temperature Stability Measurements2011

    • Author(s)
      Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, and Hiroyuki Ochi
    • Organizer
      IEEE International Workshop on Design for Manufacturability and Yield 2011(DFM&Y)
    • Place of Presentation
      San Diego Convention Center, San Diego, USA
    • Year and Date
      2011-06-06
    • Related Report
      2012 Final Research Report
  • [Presentation] A Stress-Parallelized Device Array for Efficient Bias-Temperature Stability Measurement2011

    • Author(s)
      Takashi Sato, Tadamichi Kozaki, Takumi Uezono, Hiroshi Tsutsui, Hiroyuki Ochi
    • Organizer
      IEEE International Workshop on Design for Manufacturability and Yield 2011 (DFM&Y)
    • Place of Presentation
      San Diego, California, USA
    • Year and Date
      2011-06-06
    • Related Report
      2011 Annual Research Report
  • [Presentation] Acceleration of Random-Walk-Based Linear Circuit Analysis using Importance Sampling2011

    • Author(s)
      Tetsuro Miyakawa, Koh Yamanaga, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
    • Organizer
      GLSVLSI 2011
    • Place of Presentation
      Lausanne, Switzerland
    • Year and Date
      2011-05-04
    • Related Report
      2011 Annual Research Report
  • [Presentation] 混合正規分布による重点的サンプリングの高次元ばらつき解析への適用2011

    • Author(s)
      萩原汐, 伊達貴徳, 上薗巧, 益一哉, 佐藤高史
    • Organizer
      情報処理学会第148回システムLSI設計技術研究会
    • Place of Presentation
      沖縄県 宮古島
    • Year and Date
      2011-03-18
    • Related Report
      2010 Annual Research Report
  • [Presentation] A fully pipelined implementation of Monte Carlo based SSTA on FPGAs2011

    • Author(s)
      Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      International Symposium on Quality Electrical Design (ISQED)
    • Place of Presentation
      Techmart Center, Santa Clara, USA
    • Year and Date
      2011-03-16
    • Related Report
      2012 Final Research Report
  • [Presentation] A fully pipelined implementation of Monte Carlo based SSTA on FPGAs2011

    • Author(s)
      Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
    • Organizer
      International Symposium on Quality Electrical Design (ISQED)
    • Place of Presentation
      Santa Clara, USA
    • Year and Date
      2011-03-16
    • Related Report
      2010 Annual Research Report
  • [Presentation] A transistor-array for parallel BTI-effects measurements2010

    • Author(s)
      Takumi Uezono, Tadamichi Kozaki, Hiroyuki Ochi, and Takashi Sato
    • Organizer
      Workshop on Variability Modeling and Characterization (VMC)
    • Place of Presentation
      DoubleTreeHotel, San Jose, USA
    • Year and Date
      2010-11-11
    • Related Report
      2012 Final Research Report
  • [Presentation] Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis2010

    • Author(s)
      Kentaro Katayama, Shiho Hagiwara, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato
    • Organizer
      ACM/IEEE International Conference on Computer-Aided Design (ICCAD)
    • Place of Presentation
      San Jose, USA
    • Year and Date
      2010-11-11
    • Related Report
      2010 Annual Research Report
  • [Presentation] リングオシレータによるしきい値簡易測定の温度依存性の検討2010

    • Author(s)
      上薗巧, 越智裕之, 佐藤高史
    • Organizer
      電子情報通信学会 VLSI設計技術研究会(VLD)
    • Place of Presentation
      京都府 京都工芸繊維大学
    • Year and Date
      2010-09-28
    • Related Report
      2010 Annual Research Report
  • [Presentation] A routing architecture exploration for coarse-grained reconfigurable architecture with an automation of SEU-tolerance evaluation2010

    • Author(s)
      Takashi Imagawa, Masayuki Hiromoto, Hiroyuki Ochi, Takashi Sato
    • Organizer
      23rd IEEE International SOC Conference (SOCC)
    • Place of Presentation
      Las Vegas, USA
    • Year and Date
      2010-09-28
    • Related Report
      2010 Annual Research Report
  • [Presentation] A tool chain for generating SEU-vulnerability map for coarse-grained reconfigurable architecture2010

    • Author(s)
      Takashi Imagawa, Masayuki Hiromoto, Hiroyuki Ochi, Takashi Sato
    • Organizer
      The 25th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
    • Place of Presentation
      Bangkok, Thai
    • Year and Date
      2010-07-06
    • Related Report
      2010 Annual Research Report
  • [Presentation] Decomposition of drain-current variation into gain-factor and threshold voltage variations2010

    • Author(s)
      Takashi Sato, Takumi Uezono, Noriaki Nakayama, Kazuya Masu
    • Organizer
      IEEE International Symposium on Circuits and Systems (ISCAS)
    • Place of Presentation
      Paris, France
    • Year and Date
      2010-05-31
    • Related Report
      2010 Annual Research Report
  • [Presentation] Small delay and area overhead process parameter estimation through path-delay inequalities2010

    • Author(s)
      Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato
    • Organizer
      IEEE International Symposium on Circuits and Systems (ISCAS)
    • Place of Presentation
      Paris, France
    • Related Report
      2010 Annual Research Report
  • [Presentation] Path clustering for adaptive test2010

    • Author(s)
      Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato
    • Organizer
      IEEE VLSI test symposium (VTS)
    • Place of Presentation
      Santa Cruz, USA
    • Related Report
      2010 Annual Research Report

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Published: 2010-08-23   Modified: 2019-07-29  

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