Development of passive millimeter-wave microscopy

• Project/Area Number: 22360162
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Measurement engineering
• Research Institution: University of Toyama
• Principal Investigator: NOZOKIDO Tatsuo 富山大学, 大学院・理工学研究部(工学), 准教授 (00261149)
• Co-Investigator(Kenkyū-buntansha): KUDO Hiroyuki 筑波大学, システム情報工学研究科, 教授 (60221933) ; BAE Jongsuck 名古屋工業大学, 工学(系)研究科(研究院), 教授 (20165525) ; KISHIGAMI Akio 岐阜女子大学, 家政学部, 教授 (40261177)
• Project Period (FY): 2010 – 2012
• Project Status: Completed (Fiscal Year 2012)
• Budget Amount: ¥19,110,000 (Direct Cost: ¥14,700,000、Indirect Cost: ¥4,410,000); Fiscal Year 2012: ¥3,380,000 (Direct Cost: ¥2,600,000、Indirect Cost: ¥780,000); Fiscal Year 2011: ¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000); Fiscal Year 2010: ¥11,570,000 (Direct Cost: ¥8,900,000、Indirect Cost: ¥2,670,000)
• Keywords: ミリ波 / マイクロスコピー / 走査型近接場顕微鏡技術 / パッシブ計測 / 無侵襲計測 / 熱画像計測 / 低温 / 画像化 / 温度分布計測

Research Abstract

In this research project, passive millimeter-wave microscopy that enables imaging of the thermal radiation emitted from a sample with a spatial resolution below the diffraction limit is investigated to demonstrate the imaging capability of this microscopy format at low temperatures. This technique utilizes a sensitive radiometric receiver in combination with a scanning near-field microscope. Experiments performed at 50 GHz （wavelength: 6 mm) at various sample temperatures show that our passive millimeter-wave microscope system can successfully image thermal radiation even in the low temperature range where passive imaging systems in the infrared region are ineffective.

Research Products

• [Journal Article] Near-Field Imaging of Thermal Radiation at Low Temperatures by Passive Millimeter-Wave Microscopy (2013)
  • Author(s): T. Nozokido、M. Ishino、H. Kudo、and J. Bae
  • Journal Title: Review of Scientific Instruments Volume: Vol. 84 Issue: 3
  • DOI: 10.1063/1.4794911
  • Peer Reviewed
• [Journal Article] Apertureless Near-Field Microscopy Using a Knife Blade as a Scanning Probe at Millimeter Wavelengths (2012)
  • Author(s): T. Nozokido、M. Ishino、M. Tokuriki、H. Kamikawa、and J. Bae
  • Journal Title: Journal of Applied Physics Volume: Vol. 112 Issue: 7 Pages: 74907-74907
  • DOI: 10.1063/1.4757954
  • Peer Reviewed
• [Journal Article] Near-field Slit Probe Incorporating a Micromachined Silicon Chip for MillimeterWave Microscopy (2011)
  • Author(s): T. Nozokido、N. Miyasaka、and J. Bae
  • Journal Title: Microwave and Optical Technology Letters Volume: Vol. 53 Issue: 3 Pages: 660-664
  • DOI: 10.1002/mop.25793
  • Peer Reviewed
• [Journal Article] Millimeter-Wave Scattering Microscopy Using a Knife Blade as a Scanning Probe (2011)
  • Author(s): T.Nozokido, Y.Nakahashi, Y.Ohmiya, K.Yamamoto
  • Journal Title: Proceedings of the Asia-Pacific Microwave Conference 2011 Pages: 1578-1580
  • Peer Reviewed
• [Journal Article] Near-Field Slit Probe Incorporating a Micromachined Silicon Chip for Millimeter-Wave Microscopy (2011)
  • Author(s): T.Nozokido, N.Miyasaka, J.Bae
  • Journal Title: Microwave and Optical Technology Letters Volume: Vol.53 Pages: 660-664
  • Peer Reviewed
• [Journal Article] Enhancing the Resolution of Millimeter-Wave Microscopy Using a Metal Slit-Type Probe (2010)
  • Author(s): N.Miyasaka, T.Nozokido
  • Journal Title: 電子情報通信学会技術報告 Volume: Vol.110 Pages: 29-34
  • NAID: 110008676279
• [Presentation] MillimeterWave Active and Passive Microscopies (2013)
  • Author(s): 【招待講演】T. Nozokido
  • Organizer: 2013 URSI Commission B International Symposium on Electromagnetic Theory
  • Place of Presentation: Hiroshima、Japan
  • Year and Date: 2013-05-21
• [Presentation] Near-Field Thermal Imaging by Passive MillimeterWave Microscopy、IEEE AP/MTT-S Nagoya Chapters (2012)
  • Author(s): M. Ishino and T. Nozokido
  • Organizer: Midland Student Express
  • Place of Presentation: 金沢工業大学
  • Year and Date: 2012-11-09
• [Presentation] Near-Field Imaging of Thermal Radiation by Passive Millimeter-Wave Microscopy、37th International Conference on Infrared (2012)
  • Author(s): M. Ishino、Y. Yoshida、and T. Nozokido
  • Organizer: Terahertz and Millimeter Waves
  • Place of Presentation: Wollongong、Australia
  • Year and Date: 2012-09-25
• [Presentation] Millimeter-Wave Apertureless Near-FieldMicroscopy Using a Knife Blade as a Scanning Probe (2012)
  • Author(s): T. Nozokido、Y.Ohmiya、and M. Ishino
  • Organizer: 37th International Conference on Infrared, Terahertz and Millimeter Waves
  • Place of Presentation: Wollongong、Australia
  • Year and Date: 2012-09-25
• [Presentation] ミリ波帯パッシブマイクロスコピーによる熱放射の近接場イメージング (2012)
  • Author(s): 石野学、吉田健太郎、莅戸立夫
  • Organizer: 2012電子情報通信学会ソサイエティ大会
  • Place of Presentation: 富山大学
  • Year and Date: 2012-09-14
• [Presentation] Millimeter-Wave Scattering Microscopy Using a Knife Blade as a Scanning Probe (2011)
  • Author(s): T. Nozokido、Y.Nakahashi、Y. Ohmiya、and K. Yamamoto
  • Organizer: Asia-Pacific Microwave Conference 2011
  • Place of Presentation: Melbourne、Australia
  • Year and Date: 2011-12-08
• [Presentation] Development of Passive Millimeter-Wave Microscopy (2011)
  • Author(s): M. Ishino and T. Nozokido
  • Organizer: IEEE AP/MTT-S Nagoya Chapters, Midland Student Express
  • Place of Presentation: 金沢工業大学
  • Year and Date: 2011-11-05
• [Presentation] Signal Processing for High-Resolution MillimeterWave Microscopy Using Scanning Probes with Line-Like Tips (2011)
  • Author(s): H. Kamikawa and T. Nozokido
  • Organizer: IEEE AP/MTT-S Nagoya Chapters, Midland Student Express
  • Place of Presentation: 金沢工業大学
  • Year and Date: 2011-11-05
• [Presentation] Signal Processing for High-Resolution Millimeter-Wave Microscopy Using Scanning Probes with Line-Like Tips (2011)
  • Author(s): H.Kamikawa
  • Organizer: IEEE AP/MTT-S Nagoya Chapters, Midland Student Express
  • Place of Presentation: 金沢工業大学
  • Year and Date: 2011-11-05
• [Presentation] ミリ波マイクロスコピー用高分解能スリット型プローブの開発 (2010)
  • Author(s): 莅戸立夫、宮坂紀行
  • Organizer: 電子情報通信学会技術報告
  • Place of Presentation: 金沢工業大学
  • Year and Date: 2010-12-16
• [Presentation] ミリ波マイクロスコピー用高分解能スリット型プローブの開発 (2010)
  • Author(s): 莅戸立夫
  • Organizer: 電子情報通信学会マイクロ波研究会
  • Place of Presentation: 金沢工業大学
  • Year and Date: 2010-12-16
• [Presentation] ミリ波マイクロスコピーによる熱放射の近接場イメージング
  • Author(s): 石野学, 吉田健太郎, 莅戸立夫
  • Organizer: 2012年電子情報通信学会ソサイエティ大会
  • Place of Presentation: 富山大学
• [Presentation] Near-Field Imaging of Thermal Radiation by Passive Millimeter-Wave Microscopy
  • Author(s): M. Ishino, K. Yoshida, and T. Nozokido
  • Organizer: 37th International Conference on Infrared, Terahertz and Millimeter Waves
  • Place of Presentation: Wollongong, Austraria
• [Presentation] Millimeter-Wave Apertureless Near-Field Microscopy Using a Knife Blade as a Scanning Probe
  • Author(s): T. Nozokido, Y. Ohmiya, and M. Ishino
  • Organizer: 37th International Conference on Infrared, Terahertz and Millimeter Waves
  • Place of Presentation: Wollongong, Austraria
• [Presentation] Near-Field Thermal Imaging by Passive Millimeter-Wave Microscopy
  • Author(s): M. Ishino and T. Nozokido
  • Organizer: IEEE AP/MTT-S Nagoya Chapters, Midland Student Express 2012 Autumn
  • Place of Presentation: 金沢工業大学
• [Presentation] Millimeter-Wave Active and Passive Microscopies
  • Author(s): T. Nozokido
  • Organizer: 2013 International Symposium on Electromagnetic Theory
  • Place of Presentation: Hiroshima, Japan
  • Invited