Lunar X-ray elemental mapping with roughness effect correction
| Project/Area Number |
22540442
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Solid earth and planetary physics
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| Research Institution | Japan Aerospace Exploration Agency |
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Principal Investigator |
OKADA Tatsuaki 独立行政法人宇宙航空研究開発機構, 宇宙科学研究所, 准教授 (30321566)
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| Project Period (FY) |
2010 – 2012
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| Project Status |
Completed (Fiscal Year 2012)
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| Budget Amount *help |
¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2012: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2011: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2010: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
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| Keywords | 固体惑星探査 / 蛍光Ｘ線分光 / 月探査 / かぐや / チャンドラヤーン１号 / 表面粗さ効果 / 主要元素組成 / 蛍光X線分光 / チャンドラヤーン1号 / 蛍光エックス線 / 粗さ効果 / 角度依存性 |
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| Research Abstract |
Lunar major elements were mapped in cooperation of the X-ray Fluorescence Spectrometer teams from Japanese and Indian lunar orbiter missions. In spite of a dimmed solar activity which excites lunar X-rays much fainter than expected as well as troubles in instrumentation, mapped area of major elements (Mg-Al-Si ratios) has doubled from that by Apollo missions and heavier elements such as Ca, Ti and Fe were locally observed. Roughness effect correction could not be done because no regions were observed from multiple solar angles.
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Report
(4 results)
Research Products
(26 results)
