Development of a new soft-ionization method of organic molecules on surfaces for imaging mass spectrometry
Project/Area Number |
22550091
|
Research Category |
Grant-in-Aid for Scientific Research (C)
|
Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Analytical chemistry
|
Research Institution | National Institute of Advanced Industrial Science and Technology |
Principal Investigator |
FUJIWARA Yukio 独立行政法人産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (60415742)
|
Project Period (FY) |
2010 – 2012
|
Project Status |
Completed (Fiscal Year 2012)
|
Budget Amount *help |
¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000)
Fiscal Year 2012: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2011: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Fiscal Year 2010: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
|
Keywords | 表面分析 / 質量分析 / ソフトイオン化 / 表面・界面物性 / 分析科学 / 放射線、X線、粒子線 / 放射線、X線、粒子線 |
Research Abstract |
Secondary ion mass spectrometry (SIMS) is a powerful technique for characterizing surfaces. In the present study, we fabricated an apparatus for producing a beam of multiply-charged droplets that contain hydrogen and hydrocarbon, thereby investigating siz
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Report
(4 results)
Research Products
(7 results)