Development of a new soft-ionization method of organic molecules on surfaces for imaging mass spectrometry

• Project/Area Number: 22550091
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Analytical chemistry
• Research Institution: National Institute of Advanced Industrial Science and Technology
• Principal Investigator: FUJIWARA Yukio 独立行政法人産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (60415742)
• Project Period (FY): 2010 – 2012
• Project Status: Completed (Fiscal Year 2012)
• Budget Amount: ¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000); Fiscal Year 2012: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000); Fiscal Year 2011: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000); Fiscal Year 2010: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
• Keywords: 表面分析 / 質量分析 / ソフトイオン化 / 表面・界面物性 / 分析科学 / 放射線、Ｘ線、粒子線 / 放射線、X線、粒子線

Research Abstract

Secondary ion mass spectrometry (SIMS) is a powerful technique for characterizing surfaces. In the present study, we fabricated an apparatus for producing a beam of multiply-charged droplets that contain hydrogen and hydrocarbon, thereby investigating siz

Research Products

• [Journal Article] Emission characteristics of a charged-droplet beam source using vacuum electrospray of an ionic liquid (2013)
  • Author(s): Yukio Fujiwara, Naoaki Saito, Hidehiko Nonaka, Shingo Ichimura
  • Journal Title: Surface and Interface Analysis Volume: 45巻 Issue: 1 Pages: 517-521
  • DOI: 10.1002/sia.5071
  • Peer Reviewed
• [Presentation] Charged-droplet beam source using vacuum electrospray of an ionic liquid for secondary ion mass spectrometry (SIMS) (2012)
  • Author(s): 藤原幸雄
  • Organizer: 19th International Mass Spectrometry Conference (IMSC 2012)
  • Place of Presentation: 国立京都国際会館(京都市)
  • Year and Date: 2012-09-17
• [Presentation] Development of an ion beam source for Cluster SIMS using vacuum electrospray of an ionic liquid (2011)
  • Author(s): 藤原幸雄
  • Organizer: 18th International Conference on Secondary Ion Mass Spectrometry
  • Place of Presentation: トレント市(伊国)
  • Year and Date: 2011-09-21
• [Presentation] Development of an ion beam source for Cluster SIMS using vacuum electrospray of an ionic liquid (2011)
  • Author(s): 藤原幸雄
  • Organizer: 18th International Conference on Secondary Ion Mass Spectrometry
  • Place of Presentation: 伊国トレント
  • Year and Date: 2011-09-21
• [Presentation] Application of an electrospray technique to Secondary Ion Mass Spectrometry (SIMS) (2010)
  • Author(s): 藤原幸雄
  • Organizer: American Vacuum Society 57th International Symposium
  • Place of Presentation: アルバカーキ市(米国)
  • Year and Date: 2010-10-19
• [Presentation] Application of an electrospray technique to Secondary Ion Mass Spectrometry (SIMS) (2010)
  • Author(s): 藤原幸雄
  • Organizer: American Vacuum Society 57th International Symposium
  • Place of Presentation: 米国アルバカーキ市
  • Year and Date: 2010-10-19
• [Presentation] Charged-droplet beam source using vacuum electrospray of an ionic liquid for secondary ion mass spectrometry (SIMS)
  • Author(s): 藤原幸雄
  • Organizer: 19th International Mass Spectrometry Conference (IMSC 2012)
  • Place of Presentation: 国立京都国際会館（京都市）