Development of nanometer-resolution XAFS imaging method and structural evaluation of nanostructured materials
| Project/Area Number |
22651040
|
|---|
| Research Category |
Grant-in-Aid for Challenging Exploratory Research
|
| Allocation Type | Single-year Grants |
|---|
| Research Field |
Nanomaterials/Nanobioscience
|
|---|
| Research Institution | Osaka University |
|---|
Principal Investigator |
TAKAHASHI Yukio 大阪大学, 大学院・工学研究科, 准教授 (00415217)
|
|---|
| Project Period (FY) |
2010 – 2011
|
| Project Status |
Completed (Fiscal Year 2011)
|
| Budget Amount *help |
¥3,070,000 (Direct Cost: ¥2,800,000、Indirect Cost: ¥270,000)
Fiscal Year 2011: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2010: ¥1,900,000 (Direct Cost: ¥1,900,000)
|
|---|
| Keywords | コヒーレントX線光学 / X線顕微鏡 / X線構造解析 / 金属ナノ組織解析 |
|---|
| Research Abstract |
In principle, X-ray absorption spectrum at the nanometer scale can be derived from the coherent X-ray diffraction imaging at the X-ray energies around the X-ray absorption edge of a specific element. In such an experiment, the dose per surface unit of X-rays illuminated onto a sample has to be determined. In this study, incident X-ray intensity monitoring system for coherent X-ray diffraction imaging was developed. By using this system, we determined the dose of X-rays illuminated onto a nanostructured sample and quantitatively derived the electron density distribution of the sample.
|
Report
(3 results)
Research Products
(49 results)
-
-
-
[Journal Article] Coherent diffraction microscopy at SPring-8 : instrumentation, data acquisition and data analysis2011
Author(s)
R.Xu, S.Salha, K.Raines, H.Jiang, C-.C.Chen, Y.Takahashi, Y.Kohmura, Y.Nishino, C.Song, T.Ishikawa, J.Miao
-
Journal Title
Journal of Synchrotron Radiation
Volume: 18
Issue: 2
Pages: 293-298
DOI
Related Report
Peer Reviewed
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
