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Study of the ground state of 4f electrons near a quantum critical point by means of "soft x-ray absorption spectroscopy" under pressure

Research Project

Project/Area Number 22654042
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeSingle-year Grants
Research Field Condensed matter physics II
Research InstitutionJapan Atomic Energy Agency

Principal Investigator

INAMI Toshiya  独立行政法人日本原子力研究開発機構, 量子ビーム応用研究部門, 研究主幹 (30354989)

Co-Investigator(Renkei-kenkyūsha) ISHII Kenji  独立行政法人日本原子力研究開発機構, 量子ビーム応用研究部門, 研究主幹 (40343933)
JARRIGE Ignace  独立行政法人日本原子力研究開発機構, 量子ビーム応用研究部門, 研究主幹 (00455289)
Project Period (FY) 2010 – 2011
Project Status Completed (Fiscal Year 2011)
Budget Amount *help
¥2,900,000 (Direct Cost: ¥2,600,000、Indirect Cost: ¥300,000)
Fiscal Year 2011: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2010: ¥1,600,000 (Direct Cost: ¥1,600,000)
Keywordsf電子系 / 非弾性X線散乱 / X線ラマン散乱 / 内殻励起スペクトル / 価数転移
Research Abstract

X-ray absorption spectroscopy(XAS) at M and N edges is a powerful tool that can detect valency, spatial symmetry and hybridization of 4f electrons. However, this technique is not applicable for measurements under pressure, because of short penetration depth of soft x-rays. X-ray Raman spectroscopy(XRS) is an alternative method to obtain XAS spectra using hard x-rays. We therefore carried out feasibility study of XRS and confirmed that XRS is a potential tool for observing the electronic ground states of f-electrons under pressure. At the same time, however, we found that XRS is not perfectly equivalent to XAS and this result points out that particular care must be taken for the interpretation of XRS data.

Report

(3 results)
  • 2011 Annual Research Report   Final Research Report ( PDF )
  • 2010 Annual Research Report

Research Products

(6 results)

All 2012 2011

All Presentation

  • [Presentation] X線ラマン散乱法によるEuPd2Si2の価数転移の研究(II)2012

    • Author(s)
      稲見俊哉
    • Organizer
      日本物理学会第67回年次大会
    • Place of Presentation
      関西学院大学
    • Year and Date
      2012-03-24
    • Related Report
      2011 Final Research Report
  • [Presentation] X線ラマン散乱法によるEuPd_2Si_2の価数転移の研究(II)2012

    • Author(s)
      稲見俊哉
    • Organizer
      日本物理学会第67回年次大会
    • Place of Presentation
      関西学院大学(西宮)
    • Year and Date
      2012-03-24
    • Related Report
      2011 Annual Research Report
  • [Presentation] X線ラマン散乱法によるEuPd2Si2の価数転移の研究2011

    • Author(s)
      稲見俊哉
    • Organizer
      日本物理学会2011年秋季大会
    • Place of Presentation
      富山大学
    • Year and Date
      2011-09-23
    • Related Report
      2011 Final Research Report
  • [Presentation] X線ラマン散乱法によるEuPd_2Si_2の価数転移の研究2011

    • Author(s)
      稲見俊哉
    • Organizer
      日本物理学会2011年秋季大会
    • Place of Presentation
      富山大学(富山)
    • Year and Date
      2011-09-23
    • Related Report
      2011 Annual Research Report
  • [Presentation] X-ray Raman scattering experiment on the valence transition of EuPd2Si22011

    • Author(s)
      稲見俊哉
    • Organizer
      Strongly Correlated Electron Systems 2011
    • Place of Presentation
      Cambridge、United Kingdom
    • Year and Date
      2011-08-30
    • Related Report
      2011 Final Research Report
  • [Presentation] X-ray Raman scattering experiment on the valence transition of EuPd_2Si_22011

    • Author(s)
      稲見俊哉
    • Organizer
      Strongly Correlated Electron Systems 2011
    • Place of Presentation
      Cambridge (UK)
    • Year and Date
      2011-08-30
    • Related Report
      2011 Annual Research Report

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Published: 2010-08-23   Modified: 2016-04-21  

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