| Project/Area Number |
22656091
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Single-year Grants |
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| Research Field |
Measurement engineering
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| Research Institution | The University of Tokyo |
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Principal Investigator |
KAJIHARA Yusuke 東京大学, 大学院・総合文化研究科, 研究員 (60512332)
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| Project Period (FY) |
2010 – 2011
|
| Project Status |
Completed (Fiscal Year 2011)
|
| Budget Amount *help |
¥3,590,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥390,000)
Fiscal Year 2011: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2010: ¥1,900,000 (Direct Cost: ¥1,900,000)
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| Keywords | テラヘルツ波 / パッシブ計測 / エバネッセント波 / 赤外光 / プローブ顕微鏡 / ナノサーモメトリー |
|---|
| Research Abstract |
We have developed an ultra-sensitive scanning near-field THz microscope with a method of forming a near-field probe and with a home-made scanning probe microscope. With the developed microscope, we have achieved passive near-field images with 60 nm spatial resolution. By studying a GaAs/Au sample at room temperature without an external light, we obtained evanescent field near the surface. Through many experimental examinations, the signal origin was turned out to be thermal charge/current fluctuation, which had not been experimentally probed.
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