Development and application of scanning tunneling miscroscope that has femtosecond time resolution

• Project/Area Number: 22686005
• Research Category: Grant-in-Aid for Young Scientists (A)
• Allocation Type: Single-year Grants
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: University of Tsukuba
• Principal Investigator: TAKEUCHI Osamu 筑波大学, 数理物質系, 准教授 (20361321)
• Project Period (FY): 2010 – 2012
• Project Status: Completed (Fiscal Year 2012)
• Budget Amount: ¥26,130,000 (Direct Cost: ¥20,100,000、Indirect Cost: ¥6,030,000); Fiscal Year 2012: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000); Fiscal Year 2011: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000); Fiscal Year 2010: ¥19,630,000 (Direct Cost: ¥15,100,000、Indirect Cost: ¥4,530,000)
• Keywords: 走査プローブ顕微鏡 / 超精密計測 / ナノ材料 / １分子計測(SMD) / 表面・界面物性 / 光物性 / スピン物性(半導体) / 1分子計測(SMD)

Research Abstract

Conventional time-resolved scanning tunneling microscopes(TR-STM) have so long laser repetition periods of ~1 μs that their signal level falls when ultrafast phenomena of time scales less than 1 ns are observed. To solve the problem, two new setups for TR-STM are proposed and confirmed the efficiencies. One of them allowed us to successfully measure decay process of the electron spins in a GaAs sample whose time scale is about 5 ps

Research Products

• [Journal Article] Single-Atomic-Level Probe of Transient Carrier Dynamics by Laser-Combined Scanning Tunneling Microscopy (2013)
  • Author(s): S. Yoshida
  • Journal Title: Applied Physics Express Volume: 6 Issue: 3 Pages: 32401-32401
  • DOI: 10.7567/apex.6.032401
  • Peer Reviewed
• [Journal Article] Direct Probing of Transient Photocurrent Dynamics in p-WSe2 by Time-Resolved Scanning Tunneling Microscopy (2013)
  • Author(s): S. Yoshida
  • Journal Title: Applied Physics Express Volume: 6 Issue: 1 Pages: 16601-16601
  • DOI: 10.7567/apex.6.016601
  • Peer Reviewed
• [Journal Article] Nanoscale probe of transient carrier dynamics modulated in GaAs-PIN junction by laser-combined scanning tunneling microscopy (2012)
  • Author(s): S.Yoshida, Y.Terada, R.Oshima, O.Takeuchi, H.Shigekawa
  • Journal Title: Nanoscale Volume: 2012,4 Issue: 3 Pages: 757-761
  • DOI: 10.1039/c2nr11551d
  • Peer Reviewed
• [Journal Article] Laser-Combined Scanning Tunneling Microscopy on the Carrier Dynamics in Low-Temperature-Grown GaAs/AlGaAs/GaAs (2011)
  • Author(s): Y.Terada, S.Yoshida, O.Takeuchi, H.Shigekawa
  • Journal Title: Advances in Optical Technologies Volume: 2011 Pages: 510186-510186
  • DOI: 10.1155/2011/510186
  • Peer Reviewed
• [Journal Article] Real space imaging of transient carrier dynamics by nanoscale pump-probe microscopy (2010)
  • Author(s): Y. Terada, S. Yoshida, O. Takeuchi and H. Shigekawa
  • Journal Title: Nature Photonics Volume: 4, 12 Issue: 12 Pages: 869-869
  • DOI: 10.1038/nphoton.2010.235
  • NAID: 120007130610
  • Peer Reviewed
• [Journal Article] Laser-combined STM for probing ultrafast transient dynamics (2010)
  • Author(s): Yasuhiko Terada
  • Journal Title: Journal of Physics : Condensed Matter Volume: 22
  • Peer Reviewed
• [Journal Article] Effect of defects buried in pentacene/alkanethiol self-assembled monolayer/Au film on its electronic properties visualized by scanning tunneling microscopy/spectroscopy (2010)
  • Author(s): Yasuhiko Terada
  • Journal Title: Japanese Journal of Applied Physics Volume: 49
  • Peer Reviewed
• [Journal Article] Real space imaging of transient carrier dynamics by nanoscale pump-probe microscopy (2010)
  • Author(s): Yasuhiko Terada
  • Journal Title: Nature Photonics Volume: 4 Pages: 869-874
  • Peer Reviewed
• [Presentation] 時間分解STMによる電子スピン寿命計測 (2013)
  • Author(s): 吉田 昭二
  • Organizer: 2013年第60回応用物理学会春季学術講演会
  • Place of Presentation: 神奈川工科大学
• [Presentation] 単一分子接合の形状変化が伝導に及ぼす影響 (2013)
  • Author(s): 中村美紀
  • Organizer: 2013年第60回応用物理学会春季学術講演会
  • Place of Presentation: 神奈川工科大学
• [Presentation] 時間分解STMによる電子スピン寿命計測 (2013)
  • Author(s): 吉田 昭二，相澤 優太，武内 修，目良 裕，重川 秀実
  • Organizer: 2013年 第60回応用物理学会春季学術講演会
  • Place of Presentation: 神奈川工科大学
• [Presentation] 単一分子接合の形状変化が伝導に及ぼす影響 (2013)
  • Author(s): 中村美紀、吉田昭二、中村徹、目良裕、武内修、重川秀実
  • Organizer: 2013年 第60回応用物理学会春季学術講演会
  • Place of Presentation: 神奈川工科大学
• [Presentation] 時間分解STMを用いたp型WSe2のキャリアダイナミクス計測 (2012)
  • Author(s): 吉田昭二、岩田康史、岸澤利彦、寺田康彦、武内修、重川秀実
  • Organizer: 2012年春季第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学早稲田キャンパス
  • Year and Date: 2012-03-17
• [Presentation] 半導体測定における時間分解STM信号の解析 (2012)
  • Author(s): 横田統徳、吉田昭二、武内修、重川秀実
  • Organizer: 2012年春季第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学早稲田キャンパス
  • Year and Date: 2012-03-17
• [Presentation] 時間分解STM:パルスレーザの干渉が及ぼすトンネル電流への影響の軽減 (2012)
  • Author(s): 岸澤利彦、小室亘、吉田昭二、武内修、重川秀実
  • Organizer: 2012年春季第69回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学早稲田キャンパス
  • Year and Date: 2012-03-17
• [Presentation] 半導体測定における時間分解STM信号の解析 (2012)
  • Author(s): 横田 統徳
  • Organizer: 2012年春季第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学
• [Presentation] Probing Carrier Dynamics Modulated by Atomic-Scale Impurities in GaAs by Femto-Second Time-Resolved Scanning Tunneling Microscopy (2012)
  • Author(s): Shoji Yoshida, Munenori Yokota, Osamu Takeuchi, Hidemi Shigekawa
  • Organizer: International Conference on Nanoscience + Technology (ICN+T2012)
  • Place of Presentation: Paris,France
• [Presentation] Mechanical Conductance Regulation of Si Based Single Molecular Junction (2012)
  • Author(s): Shoji Yoshida, Munenori Yokota, Osamu Takeuchi, Hidemi Shigekawa
  • Organizer: International Conference on Nanoscience + Technology (ICN+T2012)
  • Place of Presentation: Paris,France
• [Presentation] 時間分解STMを用いた表面キャリアダイナミクス計測 (2012)
  • Author(s): 相澤 優太、横田 統徳、吉田 昭二、武内 修、重川 秀実
  • Organizer: 2012年 秋季 第73回応用物理学会学術講演会
  • Place of Presentation: 愛媛大学城北地区, 松山大学文京キャンパス
• [Presentation] Reversible conductance regulation of Si-based single-molecule junction by STM point-contact method (2012)
  • Author(s): M. Nakamura, S. Yoshida, T. Nakamura, O. Takeuchi, and H. Shigekawa
  • Organizer: 14th Vibrations at Surfaces (VAS14)
  • Place of Presentation: Kobe, Japan
• [Presentation] Study on (NH4)2S-treated GaAs(001) Surface by Time-resolved Scanning Tunneling Microscopy (2012)
  • Author(s): H. Oigawa, M. Yokota, T. Kishizawa, S. Yoshida, O. Takeuchi and H. Shigekawa
  • Organizer: 20th International Colloquium on Scanning Probe Microscopy (ICSPM20)
  • Place of Presentation: 沖縄かりゆしアーバンリゾート・ナハ
• [Presentation] Probing Electron Spin Dyamics by Time Resolved STM (2012)
  • Author(s): S. Yoshida, Y. Aizawa, O. Takeuchi, Y. Mera and, H. Shigekawa
  • Organizer: 20th International Colloquium on Scanning Probe Microscopy (ICSPM20)
  • Place of Presentation: 沖縄かりゆしアーバンリゾート・ナハ
• [Presentation] Origin of SPPX-STM signals from semiconductor (2012)
  • Author(s): M. Yokota, S. Yoshida, Y. Mera, O. Takeuchi, and H. Shigekawa
  • Organizer: 20th International Colloquium on Scanning Probe Microscopy (ICSPM20)
  • Place of Presentation: 沖縄かりゆしアーバンリゾート・ナハ
• [Presentation] Mechanically controllable single molecular conductance by changing molecular conformation (2012)
  • Author(s): M. Nakamura, S. Yoshida, T. Nakamura, Y.Mera, O. Takeuchi, and, H. Shigekawa
  • Organizer: 20th International Colloquium on Scanning Probe Microscopy (ICSPM20)
  • Place of Presentation: 沖縄かりゆしアーバンリゾート・ナハ
• [Presentation] Nanoscale Evaluation of Organic Solar Cells by Light-Modulated Scanning Tunneling Microscopy (2012)
  • Author(s): T. Ochiai, H. Kato, S. Yoshida, O. Takeuchi and H. Shigekawa
  • Organizer: 20th International Colloquium on Scanning Probe Microscopy (ICSPM20)
  • Place of Presentation: 沖縄かりゆしアーバンリゾート・ナハ
• [Presentation] Circularly-polarized light modulation for the detection of spin dynamics by Time Resolved STM (2012)
  • Author(s): Y. Aizawa, S. Yoshida, Y. Mera, O. Takeuchi, and H. Shigekawa
  • Organizer: 20th International Colloquium on Scanning Probe Microscopy (ICSPM20)
  • Place of Presentation: 沖縄かりゆしアーバンリゾート・ナハ
• [Presentation] Time-resolved STM on carrier dynamics at metal-nanoparticle/GaAs(110) (2011)
  • Author(s): S.Yoshida, W.Omuro, M.Yokota, Y.Terada, O.Takeuchi, H.Shigekawa
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: 北海道 洞爺湖万世閣
  • Year and Date: 2011-12-19
• [Presentation] Laser-combined STM study on bulk-hetero junction organic solar cell (2011)
  • Author(s): T.Ochiai, N.Takeuchi, S.Yoshida, O.Takeuchi, H.Shigekawa
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: 北海道 洞爺湖万世閣
  • Year and Date: 2011-12-19
• [Presentation] Optical excitation dependence of carrier relaxation processes appearing in SPPX-STM on semiconductor (2011)
  • Author(s): M.Yokota, K.Narita, Y.Terada, S.Yoshida, O.Takeuchi, H.Shigekawa
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: 北海道 洞爺湖万世閣
  • Year and Date: 2011-12-19
• [Presentation] Removal of interference artifact in time-resolved STM by means of precise phase control of laser pulses (2011)
  • Author(s): Wataru Omuro, Toshihiko Kishizawa, Osamu Takeuchi, Hidemi Shigekawa
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: 北海道 洞爺湖万世閣
  • Year and Date: 2011-12-19
• [Presentation] Carrier dynamics of p-Wse_2 measured by time-resolved STM (2011)
  • Author(s): T.Kishizawa, Y.Iwata, M.Yokota, S.Yoshida, O.Takeuchi, H.Shigekawa
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy(ICSPM19)
  • Place of Presentation: 北海道 洞爺湖万世閣
  • Year and Date: 2011-12-19
• [Presentation] 時間分解STMによるGaAs上金属誘起ギャップ準位のキャリア捕獲時間計測 (2011)
  • Author(s): 小室亘, 高橋直希, 横田統徳, 寺田康彦, 吉田昭二, 武内修, 重川秀実
  • Organizer: 2011年秋季第72回応用物理学会学術講演会
  • Place of Presentation: 山形大学小白川キャンパス
  • Year and Date: 2011-08-30
• [Presentation] SPPX-STMで観測されるキャリア緩和過程の物理モデルの検証 (2011)
  • Author(s): 横田統徳、成田和繁、吉田昭二、寺田康彦、武内修、重川秀実
  • Organizer: 2011年秋季第72回応用物理学会学術講演会
  • Place of Presentation: 山形大学小白川キャンパス
  • Year and Date: 2011-08-30
• [Presentation] Local characterization of defect distribution on organic EL device by using STM (2011)
  • Author(s): K.Tamachi, T.Kurita, A.Taninaka, K.Kanazawa, O.Takeuchi, H.Shigekawa
  • Organizer: Symposium on Surface Science-Towards Nano-, Bio-, and Green Innovation-(ISSS-6)
  • Place of Presentation: Tower Hall Funabori(東京都)
  • Year and Date: 2011-08-30
• [Presentation] 時間分解STMで観測される半導体の光キャリア緩和過程と物理モデルの検証 (2011)
  • Author(s): 横田統徳
  • Organizer: 2011年春季第58回応用物理学関係連合講演会
  • Place of Presentation: 神奈川工科大学
  • Year and Date: 2011-03-24
• [Presentation] STMを用いた有機ELデバイスの表面構造と発光分布評価 (2011)
  • Author(s): 田町考至
  • Organizer: 2011年春季第58回応用物理学関係連合講演会
  • Place of Presentation: 神奈川工科大学
• [Presentation] 有機薄膜太陽電池の光励起STM (2011)
  • Author(s): 落合貴大
  • Organizer: 2011年春季第58回応用物理学関係連合講演会
  • Place of Presentation: 神奈川工科大学
• [Presentation] 時間分解STMによる金属ナノ粒子/GaAs構造のキャリア捕獲時間計測 (2011)
  • Author(s): 横田統徳, 小室亘, 高橋直希, 寺田康彦, 吉田昭二, 武内修, 重川秀実
  • Organizer: 第31回 表面科学 学術講演会
  • Place of Presentation: タワーホール船堀(東京都)
• [Presentation] Time Resolved Scanning Tunneling Microscopy ; Principles of Measurement (2010)
  • Author(s): K.Narita
  • Organizer: 18th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: 熱川ハイツ(静岡県)
  • Year and Date: 2010-12-09
• [Presentation] Time resolved Scanning Tunneling Microscopy Results (2010)
  • Author(s): Munenori Yokota
  • Organizer: 18th International Colloquium on Scanning ProbeMicroscopy
  • Place of Presentation: 熱川ハイツ(静岡県)
  • Year and Date: 2010-12-09
• [Presentation] Time resolved Scanning Tunneling Microscopy : Results (2010)
  • Author(s): Munenori Yokota
  • Organizer: 18th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: 熱川ハイツ(静岡県)
  • Year and Date: 2010-12-09
• [Presentation] Time Resolved Scanning Tunneling Microscopy : Instruments (2010)
  • Author(s): Wataru Omuro
  • Organizer: 18th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: 熱川ハイツ(静岡県)
  • Year and Date: 2010-12-09
• [Presentation] 局在ギャップ準位におけるキャリア捕獲過程の時間分解STM計測 (2010)
  • Author(s): 石川智康
  • Organizer: 第30回表面科学学術講演会第51回真空に関する連合講演会
  • Place of Presentation: 大阪大学コンベンションセンター/体育館
  • Year and Date: 2010-11-04
• [Presentation] ギャップ内準位を介したキャリアダイナミックスの時間分解STM (2010)
  • Author(s): 横田統徳
  • Organizer: 2010年秋季第71回応用物理学会学術講演会
  • Place of Presentation: 長崎大学文教キャンパス
  • Year and Date: 2010-09-16
• [Presentation] パルス対励起型STMによる硫黄処理GaAs(001)表面のキャリアダイナミックスと基板依存性 (2010)
  • Author(s): 大井川治宏
  • Organizer: 2010年秋季第71回応用物理学会学術講演会
  • Place of Presentation: 長崎大学文教キャンパス
  • Year and Date: 2010-09-16
• [Presentation] Carrier capture dynamics at localized gap states of Co nanoparticles grown on GaAs(110) probed by time-resolved STM (2010)
  • Author(s): Munenori Yokota
  • Organizer: 4th AEARU Advanced Materials Science Workshop
  • Place of Presentation: 筑波大学
  • Year and Date: 2010-09-01
• [Presentation] 時間分解STMによる電子スピン寿命計測
  • Author(s): 吉田 昭二，武内 修，重川 秀実
  • Organizer: 平成２５年度筑波大=KEK連携推進事業研究会
  • Place of Presentation: 筑波大学
• [Presentation] 新奇分子デバイス機能の創出へ向けた単一分子伝導の精密計測とナノスケール制御
  • Author(s): 中村 美紀, 吉田 昭二，目良裕，武内 修，重川 秀実
  • Organizer: 第6回つくばナノテク拠点シンポジウム
  • Place of Presentation: 東京国際フォーラムガラス棟
• [Remarks]
  • URL: http://dora.bk.tsukuba.ac.jp/
• [Remarks] http://dora.bk.tsukuba.ac.jp/
• [Remarks]
  • URL: http://dora.bk.tsukuba.ac.jp/
• [Remarks]
  • URL: http://dora.bk.tsukuba.ac.jp/
• [Patent(Industrial Property Rights)] ポンププローブ測定装置 (2011)
  • Inventor(s): 重川秀実、武内修
  • Industrial Property Rights Holder: 独立行政法人科学技術振興機構
  • Patent Publication Number: 2013-032993
  • Filing Date: 2011-08-02