Nanometer cale surface charge mapping in liquids

• Project/Area Number: 22686007
• Research Category: Grant-in-Aid for Young Scientists (A)
• Allocation Type: Single-year Grants
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Kyoto University
• Principal Investigator: KOBAYASHI Kei 京都大学, 産官学連携本部, 助教 (40335211)
• Project Period (FY): 2010 – 2012
• Project Status: Completed (Fiscal Year 2012)
• Budget Amount: ¥24,830,000 (Direct Cost: ¥19,100,000、Indirect Cost: ¥5,730,000); Fiscal Year 2012: ¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000); Fiscal Year 2011: ¥8,190,000 (Direct Cost: ¥6,300,000、Indirect Cost: ¥1,890,000); Fiscal Year 2010: ¥11,570,000 (Direct Cost: ¥8,900,000、Indirect Cost: ¥2,670,000)
• Keywords: 走査プローブ顕微鏡 / 原子間力顕微鏡 / カンチレバー / 溶液環境

Research Abstract

A surface charge mapping technique based on frequency modulation atomic force microscopy (FM-AFM) working in liquid environments has been developed. We implemented a phototheimal excitation setup for cantilever oscillation in liquids to perform quantitative force measurements. We analyzed the cantilever oscillation caused by an external modulation voltage between the tip and sample surface, and found that the conventional voltage modulation schemes for surface potential measurement cannot be applied in polar liquids. We also developed a method to estimate surface charge density by comparing measured electrostatic force with theoretically calculated force.

Research Products

• [Journal Article] Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces (2013)
  • Author(s): K.-I. Umeda, K. Kobavashi, N. Oyabu, Y. Hirata, K. Matsushige and H. Yamada
  • Journal Title: J. Appl. Phys Volume: 113 Issue: 15 Pages: 154311-154311
  • DOI: 10.1063/1.4801795
  • Peer Reviewed
• [Journal Article] Monotonic damping in nanoscopic hydration experiments (2013)
  • Author(s): A. Labuda, K. Kobayashi, K. Suzuki, H. Yamada and P. Grittier
  • Journal Title: Phys. Rev. Lett Volume: 110 Issue: 5 Pages: 53703-53703
  • DOI: 10.1063/1.4712286
  • NAID: 120005439729
  • Peer Reviewed
• [Journal Article] Direct actuation of cantilever in aqueous solutions by electrostatic force using high-frequency electric fields (2012)
  • Author(s): K. Umeda, K. Kobayashi, K. Matsushige, H. Yamada
  • Journal Title: Applied Physics Letters Volume: 101 Issue: 12 Pages: 123112-123112
  • DOI: 10.1063/1.4754289
  • Peer Reviewed
• [Journal Article] Atomic-Resolution Imaging of Graphite-Water Interface by Frequency Modulation Atomic Force Microscopy (2011)
  • Author(s): K.Suzuki, N.Oyabu, K.Kobayashi, K.Matsushige, H.Yamada
  • Journal Title: Applied Physics Express Volume: 4 Issue: 12 Pages: 125102-125102
  • DOI: 10.1143/apex.4.125102
  • NAID: 10030154221
  • Peer Reviewed
• [Journal Article] Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment (2011)
  • Author(s): S.Rode, R.Stark, J.Lubbe, L.Troger, J.Schutte, K.Umeda, K.Kobayashi, H.Yamada, A.Kuhnle
  • Journal Title: Rev.Sci.Instrum. Volume: 82 Issue: 7 Pages: 73703-73703
  • DOI: 10.1063/1.3606399
  • Peer Reviewed
• [Journal Article] Comparison of photothermal and piezoacoustic excitation methods for frequency and phase modulation atomic force microscopy in liquid environments (2011)
  • Author(s): A.Labuda, K.Kobayashi, D.Kiracofe, K.Suzuki, P.H.Grutter, H.Yamada
  • Journal Title: AIP Advances Volume: 1 Issue: 2 Pages: 22136-22136
  • DOI: 10.1063/1.3601872
  • Peer Reviewed
• [Journal Article] Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy (2011)
  • Author(s): K. Kobavashi, H. Yamada and K. Matsushige
  • Journal Title: Rev. Sci. Instrum Volume: 82 Issue: 3
  • DOI: 10.1063/1.3557416
  • Peer Reviewed
• [Journal Article] High efficiency laser photothermal excitation of microcantilever vibrations in air and liquids (2011)
  • Author(s): D. Kiracofe, K. Kobayashi, A. Labuda, A. Raman and H. Yamada
  • Journal Title: Rev. Sci. Instrum Volume: 82 Issue: 1
  • DOI: 10.1063/1.3518965
  • NAID: 120004920381
  • Peer Reviewed
• [Journal Article] High efficiency laser photothermal excitation of Microcantilever vibrations in air and liquids (2011)
  • Author(s): Daniel Kiracofe, Kei Kobayashi, Aleksander Labuda, Arvind Raman, Hirofumi Yamada
  • Journal Title: Review of Scientific Instruments Volume: 82
  • NAID: 120004920381
  • Peer Reviewed
• [Journal Article] Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy (2011)
  • Author(s): Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige
  • Journal Title: Review of Scientific Instruments Volume: 82
  • NAID: 120003039149
  • Peer Reviewed
• [Journal Article] Aqueous Solution Structure over a-Al203(01-12) Probed by Frequency-Modulation Atomic Force Microscopy (2010)
  • Author(s): T. Hiasa, K. Kimura, H. Onishi, M. Ohta, K. Watanabe, R. Kokawa, N. Oyabu, K. Kobavashi and H. Yamada
  • Journal Title: J. Phys.Chem Volume: 114
  • Peer Reviewed
• [Journal Article] Development of High-Resolution Imaging of Solid-Liquid Interface by Frequency Modulation Atomic Force Microscopy (2010)
  • Author(s): K. Suzuki, S. Kitamura, S. Tanaka, K. Kobayashi and H. Yamada
  • Journal Title: Jpn. J. Appl. Phys Volume: 49
  • NAID: 210000069135
  • Peer Reviewed
• [Journal Article] High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method (2010)
  • Author(s): K.-I. Umeda, N. Oyabu, K. Kobayashi Y. Hirata, K. Matsushige and H. Yamada
  • Journal Title: Appl. Phys. Volume: 3 Issue: 6 Pages: 065205-065205
  • DOI: 10.1143/apex.3.065205
  • NAID: 10027015527
  • Peer Reviewed
• [Journal Article] High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method (2010)
  • Author(s): Ken-ichi Umeda, Noriaki Oyabu, Kei Kobayashi, Yoshiki Hirata, Kazumi Matsushige, Hirofumi Yamada
  • Journal Title: Applied Physics Express Volume: 3
  • NAID: 10027015527
  • Peer Reviewed
• [Journal Article] Development of High-Resolution Imaging of Solid-Liquid Interface by Frequency Modulation Atomic Force Microscopy (2010)
  • Author(s): Katsuyuki Suzuki, Shin-ichi Kitamura, Shukichi Tanaka, Kei Kobayashi, Hirofumi Yamada
  • Journal Title: Japanese Journal of Applied Physics Volume: 49
  • NAID: 210000069135
  • Peer Reviewed
• [Journal Article] Aqueous Solution Structure over α-Al2O3(01-12) Probed by Frequency-Modulation Atomic Force Microscopy (2010)
  • Author(s): Takumi Hiasa, Kenjiro Kimura, Hiroshi Onishi, Masahiro Ohta, Kazuyuki Watanabe, Ryohei Kokawa, Noriaki Oyabu, Kei Kobayashi, Hirofumi Yamada
  • Journal Title: Journal of Physical Chemistry C Volume: 114 Pages: 21423-21426
  • Peer Reviewed
• [Presentation] Quantitative charge density measurement of biomolecule in aqueous solutions by FM-AFM with force mapping technique (2012)
  • Author(s): K.-I. Umeda, Y. Hirata, N. Oyabu, K. Kobayashi and H. Yamada
  • Organizer: 20th International Colloquium on Scarming Probe Microscopy
  • Place of Presentation: 那覇
  • Year and Date: 2012-12-18
• [Presentation] Molecular-Scale Investigations of Self-Assembled Surfactant Aggregates on Graphite by Force Mapping Using FM-AFM (2012)
  • Author(s): K. Suzuki, K. Kobayashi, K. Matsushige and H. Yamada
  • Organizer: 20th International Colloquium on Scarming Probe Microscopy
  • Place of Presentation: ggg
  • Year and Date: 2012-12-17
• [Presentation] Quantitative study of local electric double layer force by FM-AFM in aqueous solutions (2012)
  • Author(s): Ken-ichi Umeda, Yoshiki Hirata, Noriaki Oyabu, Kei Kobayashi, Kazumi Matsushige, Hirfumi Yamada
  • Organizer: 14th International Conference on non-contact Atomic Force Microscopy
  • Place of Presentation: Lindau, Germany
  • Year and Date: 2012-09-17
• [Presentation] FM-AFMによる界面活性剤分子集合体上の電気二重層力の評価 (2012)
  • Author(s): 鈴木一博,大藪範昭,止埜圭,松重和美,山田啓文
  • Organizer: 第73回応用物理学会学術講演会
  • Place of Presentation: 愛媛大学・松山大学
  • Year and Date: 2012-09-12
• [Presentation] 液中動作周波数変調AFMにおけるエネルギー散逸一定モードを用いた電荷密度計測 (2012)
  • Author(s): 梅田健一,平田芳樹,大藪範昭,小林圭,山田啓文
  • Organizer: 第73回応用物理学会学術講演会
  • Place of Presentation: 愛媛大学・松山大学
  • Year and Date: 2012-09-12
• [Presentation] FM-AFMによる界面活性剤分子集合体上の電気二重層可視化および界面電荷分布の評価 (2012)
  • Author(s): 鈴木一博,大藪範昭,小林圭,松重和美,山田啓文
  • Organizer: 第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学
  • Year and Date: 2012-03-17
• [Presentation] 3次元フォースマッピング法によるカチオン性界面活性剤分子集合体上の電気二重層力評価 (2012)
  • Author(s): 伊藤史晃,鈴木一博,大藪範昭,小林圭,松重和美,山田啓文
  • Organizer: 第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学
  • Year and Date: 2012-03-17
• [Presentation] 液中動作周波数変調AFMにおけるエネルギー散逸像コントラストの起源の解明 (2012)
  • Author(s): 梅田健一,平田芳樹,大藪範昭,小林圭,松重和美,山田啓文
  • Organizer: 第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学
  • Year and Date: 2012-03-17
• [Presentation] Quantitative study of local electric double layer force by FM-AFM in aqueous solutions (2011)
  • Author(s): K.-I. Umeda, Y. Hirata, N. Oyabu, K. Kobayashi, K. Matsushige and H. Yamada
  • Organizer: 14th International Conference on non-contact Atomic Force Microscopy
  • Place of Presentation: Lindau, Germany
  • Year and Date: 2011-09-17
• [Presentation] FM-AFMを用いた局所電荷分布計測技術の開発に向けたコロイダルプローブによる電気二重層力検出 (2011)
  • Author(s): 梅田健一,平田芳樹,大藪範昭,止埜圭,松重和美,山田啓文
  • Organizer: イダルプローブによる電気二重層力検出",第72回応用物理学会学術講演会
  • Place of Presentation: 山形大学
  • Year and Date: 2011-09-01
• [Presentation] FM-AFMを用いた局所電荷分布計測技術の開発に向けたコロイダルプローブによる電気二重層力検出 (2011)
  • Author(s): 梅田健一, 平田芳樹, 大藪範昭, 小林圭, 松重和美, 山田啓文
  • Organizer: 第72回応用物理学会学術講演会
  • Place of Presentation: 山形大学
  • Year and Date: 2011-09-01
• [Presentation] High Efficiency Laser Photothennal Excitation of Microcantilever Vibrations in Air and Liquids (2010)
  • Author(s): D. Kiracofe, K. Kobayashi A. Labuda, A. Raman and H. Yamada
  • Organizer: 18th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: 熱川ハイツ
  • Year and Date: 2010-12-09
• [Presentation] High Efficiency Laser Photothermal Excitation of Microcantilever Vibrations in Air and Liquids (2010)
  • Author(s): Daniel Kiracofe, Kei Kobayashi, Aleksander Labuda, Arvind Raman, Hirofumi Yamada
  • Organizer: 18th International Colloquium on Scanning Probe Microscopy (ICSPM18)
  • Place of Presentation: 熱川ハイツ(静岡県賀茂郡東伊豆町)
  • Year and Date: 2010-12-09
• [Presentation] Force Spectroscopy Study in Liquids by Frequency Modulation AFM Toward Local Charge Mapping at Solid/liquid Interface (2010)
  • Author(s): K.-I. Umeda, Y. Hirata, N. Oyabu, K. Kobayashi, K. Matsushige and H. Yamada
  • Organizer: MRS 2010 Fall Meeting
  • Place of Presentation: Boston, USA
  • Year and Date: 2010-10-29
• [Presentation] Force Spectroscopy Study in Liquids by Frequency Modulation AFM Toward Local Charge Mapping at Solid/liquid Interface (2010)
  • Author(s): Ken-ichi Umeda, Yoshiki Hirata, Noriaki Oyabu, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada
  • Organizer: MRS 2010 Fall Meeting
  • Place of Presentation: Sheraton Boston Hotel (Boston, MA, USA)
  • Year and Date: 2010-10-29
• [Presentation] 液中FM-AFMにおける圧電励起法および光熱励振法の比較 (2010)
  • Author(s): A.Labuda,鈴木一博,⊥埜圭,大藪範昭,P.Grutter,山田啓文
  • Organizer: 第71回応用物理学会学術講演会
  • Place of Presentation: 長崎大学
  • Year and Date: 2010-09-17
• [Presentation] 液中FM-AFMにおける圧電励起法および光熱励振法の比較 (2010)
  • Author(s): Aleksander Labuda, 鈴木一博, 小林圭, 大藪範昭, Peter Grutter, 山田啓文
  • Organizer: 第71回応用物理学会学術講演会
  • Place of Presentation: 長崎大学(長崎県長崎市)
  • Year and Date: 2010-09-17
• [Presentation] 固液界面における局所電荷分布計測へ向けた静電気力の探針-試料間距離依存性に関する研究 (2010)
  • Author(s): 梅田健一,平田芳樹,大藪範昭,止埜圭,松重和美,山田啓文
  • Place of Presentation: 長崎大学
  • Year and Date: 2010-09-16
• [Presentation] 固液界面における局所電荷分布計測へ向けた静電気力の探針-試料間距離依存性に関する研究 (2010)
  • Author(s): 梅田健一, 平田芳樹, 大藪範昭, 小林圭, 松重和美, 山田啓文
  • Organizer: 第71回応用物理学会学術講演会
  • Place of Presentation: 長崎大学(長崎県長崎市)
  • Year and Date: 2010-09-16
• [Presentation] Molecular-Scale Investigations of Self-Assembled Surfactant Aggregates on Graphite by Force Mapping Using FM-AFM
  • Author(s): Kazuhiro Suzuki, Kei Kobayashi, Kazumi Matsushige, and Hirofumi Yamada
  • Organizer: 20th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Naha, Japan
• [Presentation] Quantitative charge density measurement of biomolecule in aqueous solutions by FM-AFM with force mapping technique
  • Author(s): Ken-ichi Umeda, Yoshiki Hirata, Noriaki Oyabu, Kei Kobayashi, and Hirofumi Yamada
  • Organizer: 20th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Naha, Japan
• [Presentation] FM-AFMによる界面活性剤分子集合体上の電気二重層力の評価
  • Author(s): 鈴木一博, 大藪範昭, 小林圭, 松重和美, 山田啓文
  • Organizer: 第73回応用物理学会学術講演会
  • Place of Presentation: 愛媛大学・松山大学
• [Presentation] 液中動作周波数変調AFMにおけるエネルギー散逸一定モードを用いた電荷 密度計測
  • Author(s): 梅田健一, 平田芳樹, 大藪範昭, 小林圭, 山田啓文
  • Organizer: 第73回応用物理学会学術講演会
  • Place of Presentation: 愛媛大学・松山大学
• [Patent(Industrial Property Rights)] 原子間力顕微鏡を用いた表面電荷密度測定装置 (2013)
  • Inventor(s): 大田昌弘, 梅田健一, 小林圭, 山田啓文
  • Industrial Property Rights Holder: 株式会社島津製作所
  • Industrial Property Rights Type: 特許
  • Filing Date: 2013-02-26
• [Patent(Industrial Property Rights)] 原子間力顕微鏡を用いた誘電特性測定方法 (2011)
  • Inventor(s): 粉川良平,大田昌弘,梅田健一,木林圭,山田啓文,松重和美
  • Industrial Property Rights Holder: 株式会社島津製作所
  • Industrial Property Number: 2011-190981
  • Filing Date: 2011-09-01
• [Patent(Industrial Property Rights)] 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 (2011)
  • Inventor(s): 粉川良平,大田昌弘,梅田健一,木林圭,山田啓文,松重和美
  • Industrial Property Rights Holder: 株式会社島津製作所
  • Industrial Property Number: 2011-190980
  • Filing Date: 2011-09-01
• [Patent(Industrial Property Rights)] 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 (2011)
  • Inventor(s): 粉川良平, 大田昌弘, 梅田健一, 小林圭, 山田啓文, 松重和美
  • Industrial Property Rights Holder: 株式会社島津製作所
  • Industrial Property Number: 2011-190980
  • Filing Date: 2011-09-01
• [Patent(Industrial Property Rights)] 原子間力顕微鏡を用いた誘電特性測定方法 (2011)
  • Inventor(s): 粉川良平, 大田昌弘, 梅田健一, 小林圭, 山田啓文, 松重和美
  • Industrial Property Rights Holder: 株式会社島津製作所
  • Industrial Property Number: 2011-190981
  • Filing Date: 2011-09-01
• [Patent(Industrial Property Rights)] 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 (2010)
  • Inventor(s): 粉川良平,大田昌弘,梅田健一,大藪範昭,盛圭,山田啓文,松重和美
  • Industrial Property Rights Holder: 株式会社島津製作所
  • Industrial Property Number: 2010-128127
  • Filing Date: 2010-06-03
• [Patent(Industrial Property Rights)] 原子間力顕微鏡におけるカンチレバー励振方法及び原子間力顕微鏡 (2010)
  • Inventor(s): 粉川良平, 大田昌弘, 梅田健一, 大藪範昭, 小林圭, 山田啓文, 松重和美
  • Industrial Property Rights Holder: 株式会社島津製作所
  • Industrial Property Number: 2010-128127
  • Filing Date: 2010-06-03