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Elucidation of conduction mechanism induced by edges of nanoribbon using multiple-probe scanning probe microscopes

Research Project

Project/Area Number 22710108
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeSingle-year Grants
Research Field Nanomaterials/Nanobioscience
Research InstitutionNational Institute for Materials Science

Principal Investigator

KUBO Osamu  独立行政法人物質・材料研究機構, 国際ナノアーキテクトニクス研究拠点, MANA研究者 (70370301)

Project Period (FY) 2010 – 2011
Project Status Completed (Fiscal Year 2011)
Budget Amount *help
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2011: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2010: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
Keywordsナノ計測 / 多探針 / 走査プローブ顕微鏡 / エッジ伝導 / 多探針電気計測 / グラフェン / ナノリボン
Research Abstract

Electrical conduction property of graphene originated in local structures, such as the edge of ribbons, was verified using multiple-probe atomic force microscopes to promote the development of graphene devices. Increase of the resistivity by electron scattering at edges was confirmed in the ribbon of monolayer graphene exfoliated on a silicon dioxide film. Moreover, in a graphene formed on a vicinal silicon carbide surface by the sublimation method, which is expected as a template method to form large-area graphene, it turned out that the step part has more than ten times as much as conventional graphene, specifying the challenges for device application.

Report

(3 results)
  • 2011 Annual Research Report   Final Research Report ( PDF )
  • 2010 Annual Research Report
  • Research Products

    (22 results)

All 2012 2011 2010

All Journal Article (9 results) (of which Peer Reviewed: 8 results) Presentation (13 results)

  • [Journal Article] Development and application of multiple-probe scanning probe microscopes2012

    • Author(s)
      Tomonobu Nakayama, Osamu Kubo, Yoshitaka Shingaya, 他7名
    • Journal Title

      Advanced Materials

      Volume: Vol.24 Pages: 1675-1692

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Development and application of multiple-probe scanning probe microscopes2012

    • Author(s)
      T.Nakayama, O.Kubo, Y.Shingaya, et al
    • Journal Title

      Advanced Materials

      Volume: 24 Issue: 13 Pages: 1675-1692

    • DOI

      10.1002/adma.201200257

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] 4探針原子間力顕微鏡と膜型表面応力センサーの開発新機能ナノシステムの創成に向けて2012

    • Author(s)
      中山知信、久保理、新ヶ谷義隆、吉川元起、青野正和
    • Journal Title

      NIMS NOW

      Volume: 12

    • Related Report
      2011 Annual Research Report
  • [Journal Article] Octithiophene on Cu(111) and Au(111) : Formation and electronic structure of molecular chains and films2012

    • Author(s)
      T.Kakudate, S.Tsukamoto, O.Kubo, M.Nakaya, T.Nakayama
    • Journal Title

      Journal of Nanoscience and Nanotechnology

      Volume: (in press)

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials2011

    • Author(s)
      Seiji Higuchi, Osamu Kubo, Hiromi Kuramochi, Masakazu Aono, Tomonobu Nakayama
    • Journal Title

      Nanotechnology

      Volume: Vol.22

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Irreversible and Reversible Structural Deformation and Electromechanical Behavior of Carbon nanohorns Probed by Conductive AFM2011

    • Author(s)
      Jianxun Xu, Yoshitaka Shingaya, Hiroyuki Tomimoto, Osamu Kubo, Tomonobu Nakayama
    • Journal Title

      SMALL

      Volume: Vol.7 Pages: 1169-1174

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] Angled long tip to tuning fork probes for atomic force microscopy in various environments2011

    • Author(s)
      Seiji Higuchi, Hiromi Kuramochi, Osamu Kubo, Shintaro Masuda, Yoshitaka Shingaya, Masakazu Aono, Tomonobu Nakayama
    • Journal Title

      Review of Scientific Instruments

      Volume: Vol.82

    • Related Report
      2011 Final Research Report
    • Peer Reviewed
  • [Journal Article] A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials2011

    • Author(s)
      S. Higuchi, O. Kubo, H. Kuramochi, M. Aono, and T. Nakayama
    • Journal Title

      Nanotechnology

      Volume: 22 Issue: 28 Pages: 285205-285205

    • DOI

      10.1088/0957-4484/22/28/285205

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Angled long tip to tuning fork probes for atomic force microscopy in various environments2011

    • Author(s)
      Seiji Higuchi
    • Journal Title

      Review of Scientific Instruments

      Volume: VOL.82

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Presentation] Electron transport of graphene measured by multiple-probe atomic force microscopes2012

    • Author(s)
      Osamu Kubo, Hiromi Kuramochi, Seiji Higuchi, Kouhei Morita, Satoru Tanaka, Kazuhito Tsukagoshi, Masakazu Aono, Tomonobu Nakayama
    • Organizer
      MANA International Symposium 2012
    • Place of Presentation
      つくば国際会議場(茨城県)
    • Year and Date
      2012-03-02
    • Related Report
      2011 Final Research Report
  • [Presentation] Electron transport of graphene measured by multiple-probe atomic force2012

    • Author(s)
      O.Kubo, H.Kuramochi, S.Higuchi, et al
    • Organizer
      MANA International Symposium 2012
    • Place of Presentation
      つくば国際会議場(茨城県)
    • Year and Date
      2012-03-02
    • Related Report
      2011 Annual Research Report
  • [Presentation] Electrical transport in graphene flakes measured by multiple-scanning-probe force microscope2011

    • Author(s)
      Osamu Kubo, Jianxun Xu, Seiji Higuchi, Hiromi Kuramochi, Yoshitaka Shingaya, Masakazu Aono, Tomonobu Nakayama
    • Organizer
      6th International Symposium on Surface Science(ISSS-6)
    • Place of Presentation
      タワーホール船堀(東京都)
    • Year and Date
      2011-12-14
    • Related Report
      2011 Final Research Report
  • [Presentation] Electrical transport in graphene flakes measured by multiple-scanning-probe force microscope2011

    • Author(s)
      O.Kubo, J.Xu, S.Higuchi, et al
    • Organizer
      6th International Symposium on Surface Science (ISSS-6)
    • Place of Presentation
      タワーホール船堀(東京都)
    • Year and Date
      2011-12-14
    • Related Report
      2011 Annual Research Report
  • [Presentation] グラフェン伝導特性の走査4探針原子間力顕微鏡による計測2011

    • Author(s)
      久保理、倉持宏実、樋口誠司、森田康平、田中悟、塚越一仁、青野正和、中山知信
    • Organizer
      第72回応用物理学会学術講演会
    • Place of Presentation
      山形大学(山形県)
    • Year and Date
      2011-08-30
    • Related Report
      2011 Annual Research Report 2011 Final Research Report
  • [Presentation] 走査4探針原子間力顕微鏡によるグラフェン電気抵抗率計測2011

    • Author(s)
      久保理、樋口誠司、倉持宏実、青野正和、中山知信
    • Organizer
      第58回応用物理学関係連合講演会
    • Place of Presentation
      神奈川工科大学(神奈川県)
    • Year and Date
      2011-03-27
    • Related Report
      2011 Final Research Report
  • [Presentation] 走査4探針原子間力顕微鏡によるグラフェン電気抵抗率計測2011

    • Author(s)
      久保理
    • Organizer
      2011年春季第58回応用物理学関係連合講演会
    • Place of Presentation
      神奈川工科大学(神奈川県)
    • Year and Date
      2011-03-27
    • Related Report
      2010 Annual Research Report
  • [Presentation] Application of tuning fork probe for multiple-scanning-probe measurement in various environments2011

    • Author(s)
      Osamu Kubo, Seiji Higuchi, Hiromi Kuramochi, Shintaro Masuda, Yoshitaka Shingaya, Masakazu Aono, Tomonobu Nakayama
    • Organizer
      MANA International Symposium 2011
    • Place of Presentation
      つくば国際会議場(茨城県)
    • Year and Date
      2011-03-03
    • Related Report
      2011 Final Research Report 2010 Annual Research Report
  • [Presentation] Development and application of multiple-scannning-probe microscope for characterization of nanomaterials on insulator2010

    • Author(s)
      Osamu Kubo, Seiji Higuchi, Hiromi Kuramochi, Yoshitaka Shingaya, Masakazu Aono, Tomonobu Nakayama
    • Organizer
      The 9th Japan-France Workshop on Nanomaterials
    • Place of Presentation
      CEMES-CNRS(フランス・トゥールーズ)
    • Year and Date
      2010-11-25
    • Related Report
      2011 Final Research Report
  • [Presentation] Development and Application of Multiple-Scannning-Probe Microscope for Characterization of Nanomaterials on Insulator2010

    • Author(s)
      Osamu Kubo
    • Organizer
      9th Japan-France Workshop on Nanomaterials
    • Place of Presentation
      CNRS(フランス)
    • Year and Date
      2010-11-25
    • Related Report
      2010 Annual Research Report
  • [Presentation] チューニングフォーク探針を用いたマルチモード原子間力顕微鏡観察2010

    • Author(s)
      久保理、樋口誠司、倉持宏実、新ヶ谷義隆、桝田真太郎、中山知信
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎大学(長崎県)
    • Year and Date
      2010-09-16
    • Related Report
      2011 Final Research Report
  • [Presentation] チューニングフォーク探針を用いたマルチモード原子間力顕微鏡観察2010

    • Author(s)
      久保理
    • Organizer
      2010年秋季第71回応用物理学会学術講演会
    • Place of Presentation
      長崎大学(長崎県)
    • Year and Date
      2010-09-16
    • Related Report
      2010 Annual Research Report
  • [Presentation] Inspection of tuning fork probe with angled long tip2010

    • Author(s)
      Osamu Kubo
    • Organizer
      NC-AFM2010
    • Place of Presentation
      石川県立音楽堂(石川県)
    • Year and Date
      2010-08-02
    • Related Report
      2010 Annual Research Report

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Published: 2010-08-23   Modified: 2016-04-21  

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