| Project/Area Number |
22760021
|
|---|
| Research Category |
Grant-in-Aid for Young Scientists (B)
|
| Allocation Type | Single-year Grants |
|---|
| Research Field |
Thin film/Surface and interfacial physical properties
|
|---|
| Research Institution | Tohoku University |
|---|
Principal Investigator |
OHSAWA Takeo 東北大学, 原子分子材料科学高等研究機構, 助教 (00450289)
|
|---|
| Project Period (FY) |
2010 – 2011
|
| Project Status |
Completed (Fiscal Year 2011)
|
| Budget Amount *help |
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2011: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2010: ¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
|
|---|
| Keywords | 走査プローブ顕微鏡 / エピタキシャル成長 / 酸化物薄膜 / 表面・界面 / エピタキシャル薄膜 / ペロブスカイト結晶 / チタン酸ストロンチウム / パルスレーザー堆積法 / 酸化物半導体 / ペロブスカイト型結晶 |
|---|
| Research Abstract |
Atomic-scale studies on initial growth process of artificial perovskite titanate exhibiting a broad range of physical properties were carried out. Using a genuinely atomically-ordered single-crystal substrate, growth chemistry of thin-film oxides was elucidated by means of scanning tunneling microscopy. These results can provide significant insight into the improvement of device performances, leading to creation of higher-quality materials.
|
